Results 151 to 157 of about 204 (157)

Influence of Nitrogen on Negative Bias Temperature Instability in Ultrathin SiON

IEEE Transactions on Device and Materials Reliability, 2008
Hideki Satake, Yuichiro Mitani, Akira Toriumi   +2 more
exaly  

Evidence That Two Tightly Coupled Mechanisms Are Responsible for Negative Bias Temperature Instability in Oxynitride MOSFETs

IEEE Transactions on Electron Devices, 2009
Tibor Grasser, Ben Kaczer
exaly  

A Model for Negative Bias Temperature Instability (NBTI) in Oxide and High κ pFETs 13×-C6D8C7F5F2

2004
J Stathis, S Zafar, A Callegari
exaly  

Circuits and design structures for monitoring NBTI (negative bias temperature instability) effect and/or PBTI (positive bias temperature instability) effect

2010
CHUANG CHING-TE K, KIM JAE-JOON, KIM TAE-HYOUNG, LU PONG-FEI, MUKHOPADHYAY SAIBAL, RAO RAHUL M, WANG SHAO-YI   +6 more
openaire   +1 more source

Analysis of Enhanced Degradation Under Dynamic Negative Bias Temperature Instability (NBTI) Condition in Low-Temperature Polycrystalline Silicon Thin-Film Transistors (LTPS TFTs)

IEEE Transactions on Electron Devices
Tsung-Ming Tsai, Ya-Ting Chien, Yong-Ci Zhang   +2 more
exaly  

Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification

2024 IEEE International Reliability Physics Symposium (IRPS)
Da Wang, Yongkang Xue, Yong Liu 0035, Pengpeng Ren, Zixuan Sun, Zirui Wang, Yueyang Liu, Zhijun Cheng, Haiyang Yang, Xiangli Liu, Blacksmith Wu, Kanyu Cao, Runsheng Wang, Zhigang Ji, Ru Huang 0001   +14 more
openaire   +2 more sources

System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI)

2004
ABADEER WAGDI WILLIAM, ELLIS WAYNE FREDERICK, HANSEN PATRICK R, MCKENNA JONATHAN M   +3 more
openaire   +1 more source