Results 141 to 150 of about 204 (157)

A Consistent Modeling Framework to Explain Negative Bias Temperature Instability (NBTI) DC Stress, Recovery and AC Experiments

Extended Abstracts of the 2011 International Conference on Solid State Devices and Materials, 2011
S. Mahapatra, A. E. Islam, S. Deora, V. D. Maheta, M. A. Alam   +4 more
openaire   +1 more source

The impact of Negative Bias Temperature Instability (NBTI) effect on D flip-flop

2015
openaire   +1 more source

V Th Extraction Based Run Time Transistor Width (TWOS) Module for On-Chip Negative Bias Temperature Instability (NBTI) Mitigation

Sensor Letters, 2019
Ambika Prasad Shāh
exaly  

A 2D Compact Model for Lightly Doped DG MOSFETs (P-DGFETs) Including Negative Bias Temperature Instability (NBTI) and Short Channel Effects (SCEs)

Microelectronics Reliability, 2016
Abdelhalim Zekry, Omnia Samy, Hamdy Abdelhamid   +2 more
exaly  

New Insight Into Negative Bias Temperature Instability Degradation During Self-Heating in Nanoscale Bulk FinFETs

IEEE Electron Device Letters, 2019
Dokyun Son, Kyushik Hong, Hyungcheol Shin   +2 more
exaly  

Vertical Permanent Component of Negative Bias Temperature Instability (NBTI) in p-MOSFET Devices

2014
openaire   +1 more source

Mechanism of Threshold Voltage Shift (ΔVth) Caused by Negative Bias Temperature Instability (NBTI) in Deep Sub-Micron pMOSFETs

Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials, 2001
Chuan H. Liu, Ming T. Lee, Chih-Yung Lin, Jenkon Chen, Klaus Schruefer, Thomas Schiml, Anastasios A. Katsetos, Zhijian Yang, Nivo Rovedo, Terence B. Hook, Clement Wann   +10 more
openaire   +1 more source

Resolution of Disputes Concerning the Physical Mechanism and DC/AC Stress/Recovery Modeling of Negative Bias Temperature Instability (NBTI) in p-MOSFETs

2017
Nilesh Goel, Souvik Mahapatra, Subhadeep Mukhopadhyay   +2 more
exaly  

Contribution of Interface States and Oxide Traps to the Negative Bias Temperature Instability of High-k pMOSFETs

IEEE Electron Device Letters, 2009
Rino Choi, Hyunsang Hwang, Seong Hyun Kim   +2 more
exaly  

Mechanism and Process Dependence of Negative Bias Temperature Instability (NBTI) for pMOSFETs With Ultrathin Gate Dielectrics

2001
C H Liu, T B Hook
exaly