Results 121 to 130 of about 8,396,680 (189)

Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors. [PDF]

Micromachines (Basel)
Djorić-Veljković S, Živanović E, Davidović V, Veljković S, Mitrović N, Ristić G, Paskaleva A, Spassov D, Danković D.   +8 more
europepmc   +1 more source

Interaction of Negative Bias Instability and Self-Heating Effect on Threshold Voltage and SRAM (Static Random-Access Memory) Stability of Nanosheet Field-Effect Transistors. [PDF]

Micromachines (Basel)
Li X, Shao Y, Wang Y, Liu F, Kuang F, Zhuang Y, Li C.   +6 more
europepmc   +1 more source

Beyond the Silicon Plateau: A Convergence of Novel Materials for Transistor Evolution. [PDF]

Nanomicro Lett
Lee JH, Kim JY, Lee HJ, Choi SJ, Lee YJ, Jang HW.   +5 more
europepmc   +1 more source

A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress. [PDF]

Micromachines (Basel)
Živanović E, Veljković S, Mitrović N, Jovanović I, Djorić-Veljković S, Paskaleva A, Spassov D, Danković D.   +7 more
europepmc   +1 more source

The Understanding and Compact Modeling of Reliability in Modern Metal-Oxide-Semiconductor Field-Effect Transistors: From Single-Mode to Mixed-Mode Mechanisms. [PDF]

Micromachines (Basel)
Sun Z, Chen S, Zhang L, Huang R, Wang R.
europepmc   +1 more source

Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors. [PDF]

Micromachines (Basel), 2020
Stampfer B, Schanovsky F, Grasser T, Waltl M.   +3 more
europepmc   +1 more source

Integration and electrical evaluation of WS₂ and MoS₂ fets in a 300 mm pilot line. [PDF]

Discov Electron
Schram T, Smets Q, Opdebeeck A, Ghosh S, Groven B, Kumar P, Medina HM, Cott D, deMarneffe JF, Dongre H, Kruv A, Panarella L, Pinotti LF, Morin P, Kar GS, Lockhart de la Rosa CJ.   +15 more
europepmc   +1 more source

Direct observation of 3D nitrogen distribution in silicon-based dielectrics using atom probe tomography. [PDF]

Nat Commun
Chae BG, Won JY, Shin YS, Yun DJ, Ahn JM, Park ST, Lee KB, An H, Seol M, Ro IJ, Kim SH, Chung C, Lee E.   +12 more
europepmc   +1 more source

A Review of Wide Bandgap Semiconductors: Insights into SiC, IGZO, and Their Defect Characteristics. [PDF]

Nanomaterials (Basel)
Shangguan Q, Lv Y, Jiang C.
europepmc   +1 more source

First Demonstration of Hysteresis-Free IGZO/SnO-Based Complementary Circuits and SRAM with Long-Term Reliability Using SU-8 Passivation. [PDF]

Nano Converg
Han C, Park H, Choi Y, Choi M, Lim J, Shin H, Moon S, Shin C.   +7 more
europepmc   +1 more source