Results 101 to 110 of about 8,396,680 (189)

Evaluation on Temperature-Dependent Transient V_T Instability in p-GaN Gate HEMTs under Negative Gate Stress by Fast Sweeping Characterization. [PDF]

Micromachines (Basel), 2022
Wang R, Guo H, Hou Q, Lei J, Wang J, Xue J, Liu B, Chen D, Lu H, Zhang R, Zheng Y.   +10 more
europepmc   +1 more source

Editorial for the Special Issue on MEMS/NEMS Devices and Applications, 3rd Edition. [PDF]

Micromachines (Basel)
Dai ZX, Ono T, Dai CL.
europepmc   +1 more source

Stability and Reliability of van der Waals High-κ SrTiO₃ Field-Effect Transistors with Small Hysteresis. [PDF]

ACS Nano
Sattari-Esfahlan SM, Yang AJ, Ghosh R, Zheng W, Rzepa G, Knobloch T, Lanza M, Renshaw Wang X, Grasser T.   +8 more
europepmc   +1 more source

SRAM-Based PUF Readouts. [PDF]

Sci Data, 2023
Vinagrero S, Martin H, de Bignicourt A, Vatajelu EI, Di Natale G.   +4 more
europepmc   +1 more source

Near-zero hysteresis van der Waals MnAl₂S₄ field-effect transistors with low minimal threshold voltage degradation and high thermal stability. [PDF]

Commun Mater
Sattari-Esfahlan SM, Illarionov Y, Xu F, Provias A, Mirzaei S, Michalička J, Knobloch T, Man O, Zhou Y, Grasser T.   +9 more
europepmc   +1 more source

Optimization of the Field Plate Design of a 1200 V p-GaN Power High-Electron-Mobility Transistor. [PDF]

Micromachines (Basel), 2022
Liu CH, Huang CR, Wang HC, Kang YJ, Chiu HC, Kao HL, Chu KH, Kuo HC, Chen CT, Chang KJ.   +9 more
europepmc   +1 more source

Hidden Order in the Apparent Chaos of Bias Temperature Instability. [PDF]

Micromachines (Basel)
Bernstein JB.
europepmc   +1 more source

Status of Aluminum Oxide Gate Dielectric Technology for Insulated-Gate GaN-Based Devices. [PDF]

Materials (Basel), 2022
Calzolaro A, Mikolajick T, Wachowiak A.
europepmc   +1 more source

4.11 A/1650 V Sapphire-Substrate GaN MIS-HEMTs with Thin Buffer for Medium-Voltage Power Applications. [PDF]

Micromachines (Basel)
Chen C, Liu Y, Zhou X, Li P, Zhang Y, Yang B, Yang Z, Bai J.   +7 more
europepmc   +1 more source

SRAM Cell Design Challenges in Modern Deep Sub-Micron Technologies: An Overview. [PDF]

Micromachines (Basel), 2022
Gul W, Shams M, Al-Khalili D.
europepmc   +1 more source