Results 81 to 90 of about 204 (157)

Power-Law Time Exponent <i>n</i> and Time-to-Failure in 4H-SiC MOSFETs: Beyond Fixed Reaction-Diffusion Theory. [PDF]

Micromachines (Basel)
Dhyani M, Singh S, Tzhayek N, Bernstein JB.   +3 more
europepmc   +1 more source

Real-Time Monitoring Method and Circuit Based on Built-In Reliability Prediction. [PDF]

Micromachines (Basel)
Ren W, Chen Y, Li X, Zhou X, Song B, Chang T.   +5 more
europepmc   +1 more source

Investigation of the Combined Effect of Total Ionizing Dose and Time-Dependent Dielectric Breakdown on PDSOI Devices. [PDF]

Micromachines (Basel), 2022
Yang J, Liu H, Yang K.
europepmc   +1 more source

Charge Trapping and Emission during Bias Temperature Stressing of Schottky Gate GaN-on-Silicon HEMT Structures Targeting RF/mm Wave Power Amplifiers. [PDF]

Micromachines (Basel)
O'Sullivan B, Rathi A, Alian A, Yadav S, Yu H, Sibaja-Hernandez A, Peralagu U, Parvais B, Chasin A, Collaert N.   +9 more
europepmc   +1 more source

Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors. [PDF]

Micromachines (Basel)
Djorić-Veljković S, Živanović E, Davidović V, Veljković S, Mitrović N, Ristić G, Paskaleva A, Spassov D, Danković D.   +8 more
europepmc   +1 more source

Interaction of Negative Bias Instability and Self-Heating Effect on Threshold Voltage and SRAM (Static Random-Access Memory) Stability of Nanosheet Field-Effect Transistors. [PDF]

Micromachines (Basel)
Li X, Shao Y, Wang Y, Liu F, Kuang F, Zhuang Y, Li C.   +6 more
europepmc   +1 more source

Re-Thinking Electronic Circuit Design Through Emerging Reconfigurable Field Effect Transistors. [PDF]

Adv Sci (Weinh)
Trommer J, Martinez JP, He Y, Galderisi G, Pingen K, Oliveros-Mata ES, Tellis L, Cakirlar C, Beyer C, Sapui B, Knoch J, Hofmann K, Carrara S, Cantatore E, Lemme MC, O'Connor I, Kumar A, Heinzig A, Mikolajick T, Weber WM.   +19 more
europepmc   +1 more source

Beyond the Silicon Plateau: A Convergence of Novel Materials for Transistor Evolution. [PDF]

Nanomicro Lett
Lee JH, Kim JY, Lee HJ, Choi SJ, Lee YJ, Jang HW.   +5 more
europepmc   +1 more source

A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress. [PDF]

Micromachines (Basel)
Živanović E, Veljković S, Mitrović N, Jovanović I, Djorić-Veljković S, Paskaleva A, Spassov D, Danković D.   +7 more
europepmc   +1 more source

The Understanding and Compact Modeling of Reliability in Modern Metal-Oxide-Semiconductor Field-Effect Transistors: From Single-Mode to Mixed-Mode Mechanisms. [PDF]

Micromachines (Basel)
Sun Z, Chen S, Zhang L, Huang R, Wang R.
europepmc   +1 more source