Results 91 to 100 of about 204 (157)

Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors. [PDF]

Micromachines (Basel), 2020
Stampfer B, Schanovsky F, Grasser T, Waltl M.   +3 more
europepmc   +1 more source

Integration and electrical evaluation of WS₂ and MoS₂ fets in a 300 mm pilot line. [PDF]

Discov Electron
Schram T, Smets Q, Opdebeeck A, Ghosh S, Groven B, Kumar P, Medina HM, Cott D, deMarneffe JF, Dongre H, Kruv A, Panarella L, Pinotti LF, Morin P, Kar GS, Lockhart de la Rosa CJ.   +15 more
europepmc   +1 more source

Direct observation of 3D nitrogen distribution in silicon-based dielectrics using atom probe tomography. [PDF]

Nat Commun
Chae BG, Won JY, Shin YS, Yun DJ, Ahn JM, Park ST, Lee KB, An H, Seol M, Ro IJ, Kim SH, Chung C, Lee E.   +12 more
europepmc   +1 more source

A Review of Wide Bandgap Semiconductors: Insights into SiC, IGZO, and Their Defect Characteristics. [PDF]

Nanomaterials (Basel)
Shangguan Q, Lv Y, Jiang C.
europepmc   +1 more source

First Demonstration of Hysteresis-Free IGZO/SnO-Based Complementary Circuits and SRAM with Long-Term Reliability Using SU-8 Passivation. [PDF]

Nano Converg
Han C, Park H, Choi Y, Choi M, Lim J, Shin H, Moon S, Shin C.   +7 more
europepmc   +1 more source

A Review of Reliability in Gate-All-Around Nanosheet Devices. [PDF]

Micromachines (Basel)
Wang M.
europepmc   +1 more source

Reactions of Hydrogen-Passivated Silicon Vacancies in α-Quartz with Electron Holes and Hydrogen. [PDF]

Nanomaterials (Basel)
Cobos Freire T, Strand J, Shluger AL.
europepmc   +1 more source

Local field effect on charge-capture/emission dynamics. [PDF]

IEEE Trans Electron Devices, 2017
Cheung KP, Veksler D, Campbell JP.
europepmc   +1 more source

An Overview of Hot Carrier Degradation on Gate-All-Around Nanosheet Transistors. [PDF]

Micromachines (Basel)
Zhou H.
europepmc   +1 more source

Positive Bias Temperature Instability in SiC-Based Power MOSFETs. [PDF]

Micromachines (Basel)
Volosov V, Bevilacqua S, Anoldo L, Tosto G, Fontana E, Russo AL, Fiegna C, Sangiorgi E, Tallarico AN.   +8 more
europepmc   +1 more source