Results 91 to 100 of about 8,396,680 (189)

Influence of bias and temperature conditions on NBTI physical mechanisms in p-channel power U-MOSFETs

, 2015
In this paper, we present an analysis of the degradation and recovery mechanisms in p-channel power U-MOSFETs due to Negative Bias Temperature Instability (NBTI). In particular, we study the influence of NBTI on threshold voltage and sub-threshold slope,
Giacomo Barletta, Enrico Sangiorgi, SANGIORGI, ENRICO, Paolo Magnone, Andrea Natale Tallarico, Angelo Magrì, Claudio Fiegna, MAGNONE, PAOLO, FIEGNA, CLAUDIO, TALLARICO, ANDREA NATALE   +9 more
core   +1 more source

Negative Bias Temperature Instability (NBTI) Monitoring and Mitigation Technique for MOSFET

Negative Bias Temperature Instability (NBTI) Monitoring and Mitigation Technique for MOSFET
Thesis or Dissertation ...
openaire   +1 more source

Logical Resolving-Based Methodology for Efficient Reliability Analysis. [PDF]

Micromachines (Basel), 2023
Tang Z, Li C, You H, Liu X, Wang Y, Dai Y, Bai G, Lin X.   +7 more
europepmc   +1 more source

Power-Gating: More Than Leakage Savings [PDF]

, 2010
Macii, Enrico, Poncino, Massimo, Calimera, Andrea   +2 more
core  

Negative-Bias Temperature Instability (NBTI) degradation phenomena in advanced CMOS technologies' submicron devices

, 2005
CMOS transistor scaling-down involves an increase in the manufacturing complexity and brings up reliability as a serious challenge to overcome in recent node technologies. In this context, it is mandatory to characterize and model the various failure mechanisms at the transistor level.
openaire   +1 more source

Partitioned cache architectures for reduced NBTI-induced aging [PDF]

, 2011
A Calimera, E Macii, MACII E, Poncino, Massimo, Calimera, Andrea, M Loghi, M. Loghi, Loghi, M., CALIMERA A, M Poncino, Macii, Enrico, PONCINO M., LOGHI, Mirko   +12 more
core   +1 more source

Device and Circuit Co-Optimization of Split-Controlled Flip-Flops Against Aging Towards Low-Voltage Applications. [PDF]

Micromachines (Basel)
Zhao Y, Tan J, Chen L, Zhu H, Sun Q.
europepmc   +1 more source

A Coupling Mechanism between Flicker Noise and Hot Carrier Degradations in FinFETs. [PDF]

Nanomaterials (Basel), 2023
Liu M, Sun Z, Lu H, Shen C, Zhang L, Wang R, Huang R.   +6 more
europepmc   +1 more source

Overcoming Ambient Drift and Negative-Bias Temperature Instability in Foundry Carbon Nanotube Transistors. [PDF]

ACS Appl Mater Interfaces
Yu AC, Srimani T, Shulaker MM.
europepmc   +1 more source

Improving stability in two-dimensional transistors with amorphous gate oxides by Fermi-level tuning. [PDF]

Nat Electron, 2022
Knobloch T, Uzlu B, Illarionov YY, Wang Z, Otto M, Filipovic L, Waltl M, Neumaier D, Lemme MC, Grasser T.   +9 more
europepmc   +1 more source