Results 211 to 220 of about 11,074 (265)
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Ion Implantation of Nitrogen into Cadmium Sulfide
Journal of Applied Physics, 1972Ion implantation of nitrogen into n-type cadmium sulfide has been investigated with energy up to 200 keV at dose levels 1015–1017 cm−2. The measurements of I-V, C-V characteristics, and photoelectric properties of diodes made on implanted CdS have given evidence for p-type layer formation.
Y. Shiraki +2 more
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Nitrogen ion implantation into ZrN thin films
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989Abstract Stoichiometric thin films of ZrN were implanted homogeneously in depth with N ions with multiple-energies at room temperature (RT) and at 380° C (HT) up to the concentration corresponding to x = 0.33 in ZrNi 1 + x . Structural properties, electrical resistivities and superconductivity were investigated with progressive implantations.
N. Kobayashi, H. Tanoue
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Ion implantation induced nitrogen defects in GaN
Journal of Physics D: Applied Physics, 2015Ion implantation induced defects in GaN are investigated by using ion beam analysis and scanning spreading resistance microscopy (SSRM) techniques. Different GaN samples were implanted with 300 keV argon (Ar) and 200 keV hydrogen (H) ions, respectively.
Muhammad Usman +2 more
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Tribological properties of nitrogen ion implanted steel
Wear, 2012Abstract Nitrogen ions (N + ) with three different doses were implanted on the AISI 304 LN steel samples under high vacuum at room temperature. Dose dependent morphological and structural changes were observed in the specimen. Structural changes were triggered by formation of nitrides; irradiation induced surface segregation of carbon and deposition ...
N. Kumar +8 more
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Combined Oxygen - Nitrogen Ion Implants Into Ti6A14V
MRS Proceedings, 1988ABSTRACTThe alloy preferred for medical protheses, Ti6A14V, was ion implanted with oxygen and nitrogen alone and in combination at varying energies, 25 to 120 keV, and varying dose levels, 1017 to 1018 ions/cm2. Measurements were made of microhardness, corrosion resistance, chemical bonding of implanted species, and (with UHMWpo lyethylene) pin-on-disk
Anton Greenwald +5 more
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Effect of Nitrogen Ion Implantation in Copper
Journal of Fusion Energy, 2011In this study, copper samples with 99% purity implanted by N+ and N2 + ions. Implantation of ions performed at 50 keV and various doses ranging from 1 × 1017 to 1 × 1018 ions/cm2. Morphology of samples’ surface studied by atomic force microscopy.
A. H. Sari, M. K. Salem, A. Shoorche
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Formation of AlN by nitrogen ion implantation
Thin Solid Films, 1983Abstract The phase composition of aluminium after bombardment with doses from 1 × 1016 to 1 × 1018 N+ ions cm-2 is investigated by high voltage electron microscopy and selected area diffraction. This implantation always produced polycrystalline aluminium nitride (AlN). A thermal treatment to 600 °C did not yield new crystalline phases.
B. Rauschenbach, A. Kolitsch, E. Richter
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Silicon Planar Devices Using Nitrogen Ion Implantation
Japanese Journal of Applied Physics, 1976Nitrogen implanted polycrystalline silicon layers are used as an oxidation mask in place of conventional silicon nitride layers for the fabrication of planar structured MOS FET's. The stress effect and anomalous oxidation behavior arising from the conventional LOCOS process are thoroughly eliminated.
Yasuo Wada, Mikio Ashikawa
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Nitrogen doping of diamond by ion implantation
Diamond and Related Materials, 1997Abstract Nitrogen doping is used to achieve field emission from diamond, and hence it is important to be able to dope diamond with nitrogen in a controlled way, such as that offered by ion implantation. The procedure developed for optimising p-type doping of diamond by B ion-implantation (cold implantation and in situ rapid annealing (CIRA) followed ...
R. Kalish +7 more
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Low-energy nitrogen ion implantation of InSb
Journal of Applied Physics, 2004The modification of the electronic properties of InSb by implantation of low-energy N2+ ions and annealing have been investigated. A non-uniform electron density depth profile is observed in the near-surface region. Detailed measurements of the conduction-band electron-plasma frequency as a function of temperature combined with carrier statistics ...
I. Mahboob, T. D. Veal, C. F. McConville
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