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Impact of positive bias temperature instability (PBTI)

open access: yes
Memory circuits are playing a key role in complex multicore systems with both data and instructions storage and mailbox communication functions. There is a general concern that conventional SRAM cell based on the 6T structure could exhibit serious ...
González Colás, Antonio María   +4 more
core  

A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress. [PDF]

open access: yesMicromachines (Basel)
Živanović E   +7 more
europepmc   +1 more source

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