In<sub>2</sub>O<sub>3</sub>: An Oxide Semiconductor for Thin-Film Transistors, a Short Review. [PDF]
Avis C, Jang J.
europepmc +1 more source
Massive hiatal hernia involving prolapse of the entire stomach and pancreas resulting in pancreatitis and bile duct dilatation: a case report. [PDF]
Tomida H, Hayashi M, Hashimoto S.
europepmc +1 more source
Impact of positive bias temperature instability (PBTI)
Memory circuits are playing a key role in complex multicore systems with both data and instructions storage and mailbox communication functions. There is a general concern that conventional SRAM cell based on the 6T structure could exhibit serious ...
González Colás, Antonio María +4 more
core
Cross Comparison Between Thermal Cycling and High Temperature Stress on I/O Connection Elements. [PDF]
Dhyani M +3 more
europepmc +1 more source
Preparation and Characterization of Hot Melt Copolyester (PBTI) Ultrafine Particles and Their Effect on the Anti-Pilling Performance of Polyester/Cotton Fabrics. [PDF]
Huang Z, Chen W.
europepmc +1 more source
Hot-Carrier Damage in N-Channel EDMOS Used in Single Photon Avalanche Diode Cell through Quasi-Static Modeling. [PDF]
Bravaix A +3 more
europepmc +1 more source
Multi- and All-Acceptor Polymers for High-Performance n-Type Polymer Field Effect Transistors. [PDF]
Bharathi G, Hong S.
europepmc +1 more source
Progress in the synthesis of imide-based N-type polymer semiconductor materials. [PDF]
Liao M, Duan J, Peng P, Zhang J, Zhou M.
europepmc +1 more source
A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress. [PDF]
Živanović E +7 more
europepmc +1 more source
A Review of Wide Bandgap Semiconductors: Insights into SiC, IGZO, and Their Defect Characteristics. [PDF]
Shangguan Q, Lv Y, Jiang C.
europepmc +1 more source

