Results 131 to 140 of about 868 (191)

Effect of biliary drainage and biliary tract infection in unresectable pancreatic cancer treated with nanoliposomal irinotecan with fluorouracil and folinic acid: a multicenter, prospective cohort study (NAPOLEON-2). [PDF]

BMC Cancer
Yoshioka W, Shirakawa T, Shimokawa M, Otsuka T, Koga F, Oza N, Takahashi H, Kitsuka M, Nakazawa J, Shimokawa H, Shinohara Y, Oda H, Takeshita S, Arima S, Arita S, Kawaguchi Y, Nishikawa K, Otsu S, Taguchi H, Jikuya K, Sakai T, Ueda Y, Sakae T, Araki N, Sawase H, Ide Y, Kawahira M, Nio K, Mizuta T, Mitsugi K.   +29 more
europepmc   +1 more source

First Demonstration of Hysteresis-Free IGZO/SnO-Based Complementary Circuits and SRAM with Long-Term Reliability Using SU-8 Passivation. [PDF]

Nano Converg
Han C, Park H, Choi Y, Choi M, Lim J, Shin H, Moon S, Shin C.   +7 more
europepmc   +1 more source

Analysis of Culturable Bacterial Diversity of Pangong Tso Lake via a 16S rRNA Tag Sequencing Approach. [PDF]

Microorganisms
Yadav P, Das J, Sundharam SS, Krishnamurthi S.   +3 more
europepmc   +1 more source

The Death of the Kennedy Terminal Ulcer. [PDF]

J Am Coll Clin Wound Spec, 2016
Miller MS.
europepmc   +1 more source

Oriented ion migration in dielectric Sb₄O₅Cl₂ single crystals for multifunctional two-dimensional electronics. [PDF]

Nat Commun
Li Z, Gou G, Xu X, Wang H, Liu T, Luo H, Wu J, Liu K, Gao L, Zhai T, Zhou X.   +10 more
europepmc   +1 more source

Polymer Functional Layers for Perovskite Solar Cells. [PDF]

Polymers (Basel)
Lee J, Kang J, Lee JH, Hong S.
europepmc   +1 more source

Integrated Materials Design and Process Engineering for n-Type Polymer Thermoelectrics. [PDF]

JACS Au
Deng XY, Zhang Z, Lei T.
europepmc   +1 more source

Impact of NBTI/PBTI on SRAM Stability Degradation

IEEE Electron Device Letters, 2011
We investigate the impact of negative-bias temperature instability (NBTI) on the degradation of the static noise margin (SNM) and write noise margin (WNM) of a SRAM cell. This is based on the quantitative simulation of the statistical impact of NBTI on p-MOSFETs corresponding to a 45-nm low-power technology generation.
Asen Asenov, Andrew R Brown, Binjie Cheng   +2 more
exaly   +3 more sources

PBTI/NBTI-Related Variability in TB-SOI and DG MOSFETs [PDF]

IEEE Electron Device Letters, 2010
We study positive bias temperature instability/negative bias temperature instability (PBTI/NBTI)-related aging-dependent statistical variability (SV) in 32-nm thin-body silicon-on-insulator (TB-SOI) and 22-nm double-gate (DG) MOSFETs using comprehensive 3-D numerical simulation. Results indicate that a high degree of PBTI/NBTI degradation can introduce
Asen Asenov, A R Brown, B Cheng
exaly   +4 more sources

Interaction Between Hot Carrier Aging and PBTI Degradation in nMOSFETs: Characterization, Modelling and Lifetime Prediction [PDF]

, 2017
Modelling of the interaction between Hot Carrier Aging (HCA) and Positive Bias Temperature Instability (PBTI) has been considered as one of the main challenges in nanoscale CMOS circuit design.
Brahim Benbakhti, Meng Duan, Asen Asenov
exaly   +2 more sources