Results 251 to 260 of about 165,978 (305)
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Random Phase Data Masks: Fabrication Tolerances and Advantages of Four Phase Level Masks
Applied Optics, 1972An analysis is presented of the intensity variations in the Fourier transform plane resulting from the use of a bilevel random phase mask for holographic data recording as suggested by Burckhardt. To maintain a fixed ratio of peak intensities between in-phase amplitude components and out-of-phase components for an imperfect phase mask, the permissible ...
W C, Stewart, A H, Firester, E C, Fox
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Masking property of quantum random cipher with phase mask encryption
Quantum Information Processing, 2014zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Masaki Sohma, Osamu Hirota
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White-light photorefractive phase mask
Applied Optics, 2005A volume photorefractive phase mask has been fabricated with incoherent white light from an incandescent source in LiNbO3:Fe self-defocusing photorefractive crystal for the first time, to our knowledge. It can guide and modulate a probe white light or a laser beam and can be used to transmit an incoherent dark image as the guided modes of the ...
Yuanmei, Gao +4 more
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Influence of interaural phase on forward masking
The Journal of the Acoustical Society of America, 1973This study investigated the degree to which masking level differences (MLDs) obtained by six normal-hearing subjects during simultaneous masking continue to be manifest during the forward masking that follows termination of the masker. Thresholds for 500-Hz probe tones of 745 msec were obtained in quiet and in a 1000-msec narrow-band noise centered at ...
J, Punch, R, Carhart
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Pixelated phase-mask dynamic interferometer
SPIE Proceedings, 2004We have demonstrated a new type of dynamic measurement system that is comprised of a micropolarizer array and can work with any type polarization interferometer to measure a variety of physical properties. The unique configuration overcomes many of the limitations of previous single frame, phase-shift interferometer techniques.
James Millerd +5 more
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Phase calibration for attenuating phase-shift masks
SPIE Proceedings, 2006A phase metrology pattern for attenuating phase masks. The phase error of this pattern can be determined to high accuracy by aerial image measurements. This pattern can be used to create an optical phase standard for calibrating phase metrology equipment for attenuated phase masks, or as a witness pattern on a product mask to verify the phase accuracy ...
Michael S. Hibbs, Timothy A. Brunner
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Interferometer for phase measurements in phase-shift masks
SPIE Proceedings, 1993The etch depth of phase shift masks is typically measured by means of profilometry and the expected phase shift is calculated from a knowledge of the refractive index at the lithographic wavelength of interest. In the case of masks utilizing deposited films the index may differ from values for bulk materials and commonly varies to some degree with ...
Derek B. Dove +2 more
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Characterization of phase defects in phase shift masks
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 2000Rigorous simulation of electromagnetic scattering and imaging are used to assess the tendency of nonplanar phase defects to print in optical lithography with alternating phase-shifting masks. The ideal model for phase defects, which assumes that the fields are transmitted with unaltered amplitude and a phase shift of 180°, is proven inaccurate through ...
Konstantinos Adam +2 more
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Interaural Phase and the Release from Masking
International Journal of Audiology, 1972In previous presentations to this congress we have reported an increase in intelligibility of isolated words at poor signal-to-noise ratios when the phase angle differences between the ears were adjusted to certain values. Question has arisen as to whether this phenomenon is one of a peculiar property of speech or one of that kind usually called ...
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Stellar Coronograph with Phase Mask
Publications of the Astronomical Society of the Pacific, 1997The detection of faint light sources very close to a bright star is primarily limited by light scattered by the Earth's atmosphere. This source of scattered light can now be reduced by means of adaptive optics, or totally eliminated by using a telescope in space.
F. Roddier, C. Roddier
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