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The Normally-On 100-Nm pHEMT and mHEMT Transistors Electrophysical Properties Simulation Study
2020Than Phyo Kyaw
exaly
Temperature, Humidity, and Bias Acceleration Model for a GaAs pHEMT Process
Microelectronics Reliability, 2015exaly
Burnout Properties of Microwave Pulse Injected on GaAs PHEMT
Microelectronics Reliability, 2015exaly

