Results 1 to 10 of about 190,755 (383)

Surface free energy and microarray deposition technology [PDF]

, 2007
Microarray techniques use a combinatorial approach to assess complex biochemical interactions. The fundamental goal is simultaneous, large-scale experimentation analogous to the automation achieved in the semiconductor industry.
Aussillous, Blossey, Cheran, Deegan, Deegan, Glen McHale, McHale, Wixforth, Wixforth   +8 more
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Package Hermeticity Testing with Thermal Transient Measurements [PDF]

, 2008
The rapid incursion of new technologies such as MEMS and smart sensor device manufacturing requires new tailor-made packaging designs. In many applications these devices are exposed to humid environments.
Rencz, M., Vass-Varnai, Andras
core   +2 more sources

Robust snubberless soft-switching power converter using SiC power MOSFETs and bespoke thermal design [PDF]

, 2014
A number of harsh-environment high-reliability applications are undergoing substantial electrification. The converters operating in such systems need to be designed to meet both stringent performance and reliability requirements.
A. Castellazzi, Cova, Cova, Cova, D. Dipankar, F. Giuliani, Fayyaz, N. Delmonte, Naayagi, P. Cova   +9 more
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Optimal edge termination for high oxide reliability aiming 10kV SiC n-IGBTs [PDF]

, 2019
The edge termination design strongly affects the ability of a power device to support the desired voltage and its reliable operation. In this paper we present three appropriate termination designs for 10kV n-IGBTs which achieve the desired blocking ...
,, ,, Antoniou, M, Arvanitopoulos, A, Gyftakis, KN, Lophitis, N, Perkins, S, Tiwari, AK, Trajkovic, T, Udrea, F   +9 more
core   +1 more source

Radiation Risks and Mitigation in Electronic Systems [PDF]

, 2016
Electrical and electronic systems can be disturbed by radiation-induced effects. In some cases, radiation-induced effects are of a low probability and can be ignored; however, radiation effects must be considered when designing systems that have a high ...
Todd, B., Uznanski, S.
core   +3 more sources

Electrical Noise and Semiconductor Reliability

Electrotehnica, Electronica, Automatica, 2023
Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices.
openaire   +2 more sources

Dynamics of Threshold Voltage Shifts in Organic and Amorphous Silicon Field-Effect Transistors [PDF]

, 2006
No ...
Baude, Chen, Crandall, Deane, Gomes, Gomes, Kalb, Lang, Matters, Payne, Phillips, Salleo, Stannowski, Stingelin-Stutzmann, Street, Veres, Wehrspohn, Wehrspohn, Wehrspohn, Wehrspohn, Yuan   +20 more
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Fabrication of photonic band-gap crystals [PDF]

, 1995
We describe the fabrication of three-dimensional photonic crystals using a reproducible and reliable procedure consisting of electron beam lithography followed by a sequence of dry etching steps.
Cheng, C. C., Scherer, A.
core   +1 more source

Semiconductor Packaging [PDF]

, 2016
In semiconductor manufacturing, understanding how various materials behave and interact is critical to making a reliable and robust semiconductor package. Semiconductor Packaging: Materials Interaction and Reliability provides a fundamental understanding of the underlying physical properties of the materials used in a semiconductor package.
Chen, Andrea, Lo, Randy Hsiao-Yu
openaire   +3 more sources

Design and development of a fast scan infrared detection and measurement instrument [PDF]

, 1971
Infrared microscope instrument measures and plots the infrared profile of semiconductor chips, transistors and integrated circuits. Infrared analyses yields information on electrical and physical properties, enabling manufacturing improvements in ...
Dostoomian, A. S., Hamiter, L., Nowakowski, M., Vanzetti, R.   +3 more
core   +1 more source