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Processes of the Reliability and Degradation Mechanism of High-Power Semiconductor Lasers [PDF]
Crystals, 2022 High-power semiconductor lasers have attracted widespread attention because of their small size, easy modulation, and high conversion efficiency. They play an important role in national economic construction and national defense construction, including ...
Yue Song +11 more
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Electrical Noise and Semiconductor Reliability
Electrotehnica, Electronica, Automatica, 2023 Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices.
Titu-Marius BĂJENESCU
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Reliability Of Semiconductor Injection Lasers
SPIE Proceedings, 1987 Semiconductor injection lasers are key components in fiber optic communication systems, therefore their reliability is a determining factor in the technical success of these systems. Lasers are subject to several specific degradation mechanisms some of which affect the bulk of the optically active volume of the device, some the mirror facets and some ...
Wolf, H. D., Mettler, K., Lengyel, G.
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Modeling TPU Thermal Maps Under Superlattice Thermoelectric Cooling
IEEE Access, 2022 The recent renaissance in machine learning is requesting computing power at an ever-increasing rate. In order to meet this demand, tensor processing units (TPU) are becoming popular because they hold the promise to be more efficient in terms of power ...
Tim Bucher, Hussam Amrouch
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Cryogenic In-Memory Computing for Quantum Processors Using Commercial 5-nm FinFETs
IEEE Open Journal of Circuits and Systems, 2023 Cryogenic CMOS circuits that efficiently connect the classical domain with the quantum world are the cornerstone in bringing large-scale quantum processors to reality. The major challenges are, however, the tight power budget (in the order of milliwatts)
Shivendra Singh Parihar +4 more
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Modeling and Investigating Total Ionizing Dose Impact on FeFET
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, 2023 This article presents a novel, simulation-based study of the long-term impact of X-ray irradiation on the ferroelectric field effect transistor (FeFET).
Munazza Sayed, Kai Ni, Hussam Amrouch
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Peanut Defect Identification Based on Multispectral Image and Deep Learning
Agronomy, 2023 To achieve the non-destructive detection of peanut defects, a multi-target identification method based on the multispectral system and improved Faster RCNN is proposed in this paper.
Yang Wang +8 more
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Cryogenic Embedded System to Support Quantum Computing: From 5-nm FinFET to Full Processor
IEEE Transactions on Quantum Engineering, 2023 Quantum computing can enable novel algorithms infeasible for classical computers. For example, new material synthesis and drug optimization could benefit if quantum computers offered more quantum bits (qubits).
Paul R. Genssler +7 more
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Nontraditional Design of Dynamic Logics Using FDSOI for Ultra-Efficient Computing
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, 2023 In this article, we propose a nontraditional design of dynamic logic circuits using fully-depleted silicon-on-insulator (FDSOI) FETs. FDSOI FET allows the threshold voltage ( $V_{\text {t}}$ ) to be adjustable (i.e., low- $V_{\text {t}}$ and high- $V_ ...
Shubham Kumar +4 more
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Printed temperature sensor array for high-resolution thermal mapping
Scientific Reports, 2022 Fully-printed temperature sensor arrays—based on a flexible substrate and featuring a high spatial-temperature resolution—are immensely advantageous across a host of disciplines.
Tim Bücher +5 more
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