Results 231 to 240 of about 1,561,898 (299)

In Situ Integrated Titanium Oxide Synaptic Phototransistor Enabling Multimodal Plasticity and Noise‐Robust Selective Attention

Advanced Materials Technologies, EarlyView.
An in situ integrated TiO2/SiOx/Al2O3 synaptic phototransistor couples ultraviolet and electrical stimuli within a scalable, CMOS‐compatible oxide stack. Multimodal plasticity, spike‐timing‐dependent learning, and bee‐inspired associative conditioning are achieved through trap‐mediated temporal dynamics.
Youngbin Yoon, Jaehee Lee, Jeongwook Kwon, Yongki Kim, Myunghun Shin, Jung Wook Lim   +5 more
wiley   +1 more source

A quantum magneto-photo-thermoelastic model for wave propagation in laser-excited semiconductors. [PDF]

Sci Rep
Al-Sunousi HF, Rezk EG, El-Sharif AH, El-Bary AA, Kamel A, Lotfy K.   +5 more
europepmc   +1 more source

Influence of Reactor Configuration and Operating Conditions on Nanostructured Semiconductor Photocatalysts for Hydrogen Evolution: A Systematic Technical Review. [PDF]

Nanomaterials (Basel)
Galván JH, Carrera LAI, Constantino-Robles CD, Alvarez YC, Rodríguez-Reséndiz J, Nava R.   +5 more
europepmc   +1 more source

Integration of LASER Diodes Emitting at Eight Different Wavelengths from Blue to Infrared on a 4H-SiC-Based Optical Integration Platform. [PDF]

Materials (Basel)
Wang X, Li X, Kang R, Jia W, Duan X, Yang R, Fan Z, Li Z, Zhou J, Zuo Z.   +9 more
europepmc   +1 more source

Suppression of Interface Traps and Improved Breakdown in Recessed-Gate AlGaN/GaN MISHEMTs Using Low-Temperature Nitrogen Passivation. [PDF]

ACS Omega
Chen HC, Liu AC, Lin CH, Chou SY, Chang TC, Kao TS, Kuo HC.   +6 more
europepmc   +1 more source

A visualized AI-assisted framework for pre-surgical evaluation of implant pathways on periapical radiographs. [PDF]

J Dent Sci
Lin YJ, Chen CA, Mao YC, Kao ZC, Chang LH, Tian SY, Chen SL, Tu WC.   +7 more
europepmc   +1 more source

Endurance Paradox in Hafnium-Oxide-Based Silicon-Channel Ferroelectric Transistors. [PDF]

ACS Appl Mater Interfaces
Das A, Paul A, Tewari M, Lou ZF, Chang YT, Senapati A, Kumar G, Raffel Y, Useinov A, Tumilty N, Wu TL, Lashkare S, Agarwal T, Lee MH, De S.   +14 more
europepmc   +1 more source

Fabrication, testing, and reliability of semiconductor lasers

, 1996
SPIE, The International Society for Optical Engineering
core  

Reliability of compound semiconductor devices

Microelectronics Reliability, 1992
Abstract This paper reviews the reliability of III–V semiconductor devices with particular attention to the failure mechanisms typical of these structures. Instability effects at the surface of various FETs have been examined and the problems related to the metallurgies employed.
FANTINI, Fausto, F. MAGISTRALI
openaire   +3 more sources

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Semiconductor network reliability assessment

Proceedings of the IEEE, 1964
The paper discusses the reliability test plan and test results on semiconductor network microelectronic devices. Included in the test plan are reliability programs, life testing, step stress testing, and environmental tests. The failure analysis-corrective action cycle is discussed at length.
J. Adams, W. Workman
exaly   +2 more sources