Results 21 to 30 of about 120,829 (333)

Package Hermeticity Testing with Thermal Transient Measurements [PDF]

open access: yes, 2008
The rapid incursion of new technologies such as MEMS and smart sensor device manufacturing requires new tailor-made packaging designs. In many applications these devices are exposed to humid environments.
Rencz, M., Vass-Varnai, Andras
core   +2 more sources

Reliability analysis and reliable operation of three-level ANPC inverter

open access: yesFrontiers in Energy Research, 2023
The three-level active neutral-point-clamped (3L-ANPC) inverters have been widely used in medium-voltage high-power electrical drives. The purpose of this paper is to achieve the reliable operation for 3L-ANPC inverters by reliability analysis and ...
Xiaolin Zheng   +4 more
doaj   +1 more source

Radiation Risks and Mitigation in Electronic Systems [PDF]

open access: yes, 2016
Electrical and electronic systems can be disturbed by radiation-induced effects. In some cases, radiation-induced effects are of a low probability and can be ignored; however, radiation effects must be considered when designing systems that have a high ...
Todd, B., Uznanski, S.
core   +3 more sources

Fabrication of photonic band-gap crystals [PDF]

open access: yes, 1995
We describe the fabrication of three-dimensional photonic crystals using a reproducible and reliable procedure consisting of electron beam lithography followed by a sequence of dry etching steps.
Cheng, C. C., Scherer, A.
core   +1 more source

Active power losses distribution methods for the modular multilevel converter [PDF]

open access: yes, 2016
Modular Converters such as the MMC have become the new standard in VSC-HVDC applications. Their modularity has brought many industrial advantages but also increased the complexity of their operation.
Merlin, MMC, Mitcheson, PD
core   +1 more source

Investigating the Failure Mechanism of p-GaN Gate HEMTs under High Power Stress with a Transparent ITO Gate

open access: yesMicromachines, 2023
The channel temperature distribution and breakdown points are difficult to monitor for the traditional p-GaN gate HEMTs under high power stress, because the metal gate blocks the light.
Zhanfei Han   +10 more
doaj   +1 more source

WBG-Based PEBB Module for High Reliability Power Converters

open access: yesIEEE Access, 2021
The increasing presence of power electronic converters in the modern world – from electric vehicles, up to industrial applications – brings up concerns about their reliability, especially in the case of the Wide Band-Gap (WBG) devices ...
Sebastian Baba   +3 more
doaj   +1 more source

Optimization Strategy of 4H-SiC Separated Absorption Charge and Multiplication Avalanche Photodiode Structure for High Ultraviolet Detection Efficiency

open access: yesNanoscale Research Letters, 2019
In this work, parametric investigations on structural optimization are systematically made for 4H-SiC-based separated absorption charge and multiplication (SACM) avalanche ultraviolet photodiode (UV APD).
Jianquan Kou   +6 more
doaj   +1 more source

Multi-Threshold Corner Detection and Region Matching Algorithm Based on Texture Classification

open access: yesIEEE Access, 2019
In order to address the unreasonable distributed corners in single threshold Harris detection and expensive computation cost incurred from image region matching performed by normalized cross correlation (NCC) algorithm, multi-threshold corner detection ...
Zetian Tang   +6 more
doaj   +1 more source

Optimal edge termination for high oxide reliability aiming 10kV SiC n-IGBTs [PDF]

open access: yes, 2019
The edge termination design strongly affects the ability of a power device to support the desired voltage and its reliable operation. In this paper we present three appropriate termination designs for 10kV n-IGBTs which achieve the desired blocking ...
,   +9 more
core   +1 more source

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