Results 21 to 30 of about 190,755 (383)
A Machine Learning-based Framework for Predictive Maintenance of Semiconductor Laser for Optical Communication [PDF]
, 2022 Semiconductor lasers, one of the key components for optical communication systems, have been rapidly evolving to meet the requirements of next generation optical networks with respect to high speed, low power consumption, small form factor etc. However, these demands have brought severe challenges to the semiconductor laser reliability.
arxiv +1 more source
IEEE Journal of the Electron Devices Society, 2021 Barrier height ( $\phi _{b}$ ), trap state, bandgap ( $E_{g}$ ), and band alignment information of the metal–ZrO2–metal capacitor have been extracted using internal photoemission (IPE) system.
Tae Jin Yoo +7 more
doaj +1 more source
Effect of Thickness of InP Nucleation Layer on the Two-Step Growth of InP on Si(001)
Crystals, 2022 InP nucleation layers with different thicknesses were grown on Si(001) substrates by gas-source molecular beam epitaxy (GSMBE), and the two-step growth technique was used to overcome the large lattice mismatch (8%) between the InP nucleation layer and Si
Silu Yan +3 more
doaj +1 more source
Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation
Micromachines, 2022 A novel VDMOS with Step Floating Islands VDMOS (S-FLI VDMOS) is proposed for the first time in this letter, in order to optimize the breakdown voltage (BV) and the specific on-resistance (Ron,sp).
Dongyan Zhao +11 more
doaj +1 more source
Degradation Characteristics and Reliability Assessment of 1310 nm VCSEL for Microwave Photonic Link
Applied Sciences, 2022 The long-term reliability of the commercially available vertical-cavity surface-emitting laser (VCSEL) at 1310 nm wavelength is investigated. To do so, a high current accelerated life test is used to evaluate the 1310 nm VCSEL reliability.
Wenyuan Liao +7 more
doaj +1 more source
Reliability analysis and reliable operation of three-level ANPC inverter
Frontiers in Energy Research, 2023 The three-level active neutral-point-clamped (3L-ANPC) inverters have been widely used in medium-voltage high-power electrical drives. The purpose of this paper is to achieve the reliable operation for 3L-ANPC inverters by reliability analysis and ...
Xiaolin Zheng +4 more
doaj +1 more source
Reliability Analysis of Component Level Redundant Topologies for solid state Fault Current Limiter [PDF]
, 2020 Experience shows that semiconductor switches in power electronics systems are the most vulnerable components. One of the most common ways to solve this reliability challenge is component-level redundant design. There are four possible configurations for the redundant design in component-level.
arxiv +1 more source
Micromachines, 2023 The channel temperature distribution and breakdown points are difficult to monitor for the traditional p-GaN gate HEMTs under high power stress, because the metal gate blocks the light.
Zhanfei Han +10 more
doaj +1 more source
WBG-Based PEBB Module for High Reliability Power Converters
IEEE Access, 2021 The increasing presence of power electronic converters in the modern world – from electric vehicles, up to industrial applications – brings up concerns about their reliability, especially in the case of the Wide Band-Gap (WBG) devices ...
Sebastian Baba +3 more
doaj +1 more source
Nanoscale Research Letters, 2019 In this work, parametric investigations on structural optimization are systematically made for 4H-SiC-based separated absorption charge and multiplication (SACM) avalanche ultraviolet photodiode (UV APD).
Jianquan Kou +6 more
doaj +1 more source