Results 21 to 30 of about 180,788 (231)
WBG-Based PEBB Module for High Reliability Power Converters
IEEE Access, 2021 The increasing presence of power electronic converters in the modern world – from electric vehicles, up to industrial applications – brings up concerns about their reliability, especially in the case of the Wide Band-Gap (WBG) devices ...
Sebastian Baba +3 more
doaj +1 more source
Surface free energy and microarray deposition technology [PDF]
, 2007 Microarray techniques use a combinatorial approach to assess complex biochemical interactions. The fundamental goal is simultaneous, large-scale experimentation analogous to the automation achieved in the semiconductor industry.
Aussillous +8 more
core +1 more source
Electrical Noise and Semiconductor Reliability
Electrotehnica, Electronica, Automatica, 2023 Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices.
openaire +2 more sources
Package Hermeticity Testing with Thermal Transient Measurements [PDF]
, 2008 The rapid incursion of new technologies such as MEMS and smart sensor device manufacturing requires new tailor-made packaging designs. In many applications these devices are exposed to humid environments.
Rencz, M., Vass-Varnai, Andras
core +2 more sources
Nanoscale Research Letters, 2019 In this work, parametric investigations on structural optimization are systematically made for 4H-SiC-based separated absorption charge and multiplication (SACM) avalanche ultraviolet photodiode (UV APD).
Jianquan Kou +6 more
doaj +1 more source
Multi-Threshold Corner Detection and Region Matching Algorithm Based on Texture Classification
IEEE Access, 2019 In order to address the unreasonable distributed corners in single threshold Harris detection and expensive computation cost incurred from image region matching performed by normalized cross correlation (NCC) algorithm, multi-threshold corner detection ...
Zetian Tang +6 more
doaj +1 more source
Spin polarized electron beams production beyond III-V semiconductors [PDF]
arXiv, 2022 This paper summarizes the state of the art of photocathode based on III-V semiconductors for spin polarized electron beam production. The limitations preventing this class of material to provide the long term reliability at the highest average beam currents necessary for some of the new accelerator facilities or proposed upgrades of existing ones are ...
arxiv
Co-planar spin-polarized light emitting diode [PDF]
Appl. Phys. Lett. 88, 091106 (2006), 2005 Studies of spin manipulation in semiconductors has benefited from the possibility to grow these materials in high quality on top of optically active III-V systems. The induced electroluminescence in these layered semiconductor heterostructures has been used for a reliable spin detection.
arxiv +1 more source
Robust snubberless soft-switching power converter using SiC power MOSFETs and bespoke thermal design [PDF]
, 2014 A number of harsh-environment high-reliability applications are undergoing substantial electrification. The converters operating in such systems need to be designed to meet both stringent performance and reliability requirements.
A. Castellazzi +9 more
core +2 more sources
Radiation Pattern Measurement in the Planar Coordinate
IEEE Photonics Journal, 2019 A planar measurement approach is presented to obtain the radiation pattern, by which rotation operations can be removed or reduced for a source with narrow and divergent viewing angle, respectively.
Chen Yang +5 more
doaj +1 more source