Results 21 to 30 of about 119,011 (331)

Radiation Risks and Mitigation in Electronic Systems [PDF]

open access: yes, 2016
Electrical and electronic systems can be disturbed by radiation-induced effects. In some cases, radiation-induced effects are of a low probability and can be ignored; however, radiation effects must be considered when designing systems that have a high ...
Todd, B., Uznanski, S.
core   +3 more sources

Investigating the Failure Mechanism of p-GaN Gate HEMTs under High Power Stress with a Transparent ITO Gate

open access: yesMicromachines, 2023
The channel temperature distribution and breakdown points are difficult to monitor for the traditional p-GaN gate HEMTs under high power stress, because the metal gate blocks the light.
Zhanfei Han   +10 more
doaj   +1 more source

WBG-Based PEBB Module for High Reliability Power Converters

open access: yesIEEE Access, 2021
The increasing presence of power electronic converters in the modern world – from electric vehicles, up to industrial applications – brings up concerns about their reliability, especially in the case of the Wide Band-Gap (WBG) devices ...
Sebastian Baba   +3 more
doaj   +1 more source

Fabrication of photonic band-gap crystals [PDF]

open access: yes, 1995
We describe the fabrication of three-dimensional photonic crystals using a reproducible and reliable procedure consisting of electron beam lithography followed by a sequence of dry etching steps.
Cheng, C. C., Scherer, A.
core   +1 more source

Optimization Strategy of 4H-SiC Separated Absorption Charge and Multiplication Avalanche Photodiode Structure for High Ultraviolet Detection Efficiency

open access: yesNanoscale Research Letters, 2019
In this work, parametric investigations on structural optimization are systematically made for 4H-SiC-based separated absorption charge and multiplication (SACM) avalanche ultraviolet photodiode (UV APD).
Jianquan Kou   +6 more
doaj   +1 more source

Multi-Threshold Corner Detection and Region Matching Algorithm Based on Texture Classification

open access: yesIEEE Access, 2019
In order to address the unreasonable distributed corners in single threshold Harris detection and expensive computation cost incurred from image region matching performed by normalized cross correlation (NCC) algorithm, multi-threshold corner detection ...
Zetian Tang   +6 more
doaj   +1 more source

Validating foundry technologies for extended mission profiles [PDF]

open access: yes, 2010
This paper presents a process qualification and characterization strategy that can extend the foundry process reliability potential to meet specific automotive mission profile requirements.
Detcheverry, C.   +6 more
core   +9 more sources

Radiation Pattern Measurement in the Planar Coordinate

open access: yesIEEE Photonics Journal, 2019
A planar measurement approach is presented to obtain the radiation pattern, by which rotation operations can be removed or reduced for a source with narrow and divergent viewing angle, respectively.
Chen Yang   +5 more
doaj   +1 more source

VLSI Reliability in Europe [PDF]

open access: yes, 1993
Several issue's regarding VLSI reliability research in Europe are discussed. Organizations involved in stimulating the activities on reliability by exchanging information or supporting research programs are described.
Verweij, J.F., Verweij, Jan F.
core   +2 more sources

Technological sustainable materials and enabling in semiconductor memory industry: A review

open access: yese-Prime: Advances in Electrical Engineering, Electronics and Energy, 2023
This paper provides an overview of current and future deployment of recyclable direct materials and sustainable materials through recycling of interconnect metals used in semiconductor assembly and packaging. Also, with the aim to study the key technical
Chong Leong Gan   +4 more
doaj   +1 more source

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