Results 21 to 30 of about 2,168,094 (369)

Technology and Applications of Wide Bandgap Semiconductor Materials: Current State and Future Trends

open access: yesEnergies, 2023
Silicon (Si)-based semiconductor devices have long dominated the power electronics industry and are used in almost every application involving power conversion.
Omar Sarwar Chaudhary   +3 more
semanticscholar   +1 more source

Surface free energy and microarray deposition technology [PDF]

open access: yes, 2007
Microarray techniques use a combinatorial approach to assess complex biochemical interactions. The fundamental goal is simultaneous, large-scale experimentation analogous to the automation achieved in the semiconductor industry.
Aussillous   +8 more
core   +1 more source

Package Hermeticity Testing with Thermal Transient Measurements [PDF]

open access: yes, 2008
The rapid incursion of new technologies such as MEMS and smart sensor device manufacturing requires new tailor-made packaging designs. In many applications these devices are exposed to humid environments.
Rencz, M., Vass-Varnai, Andras
core   +2 more sources

Reliability analysis and reliable operation of three-level ANPC inverter

open access: yesFrontiers in Energy Research, 2023
The three-level active neutral-point-clamped (3L-ANPC) inverters have been widely used in medium-voltage high-power electrical drives. The purpose of this paper is to achieve the reliable operation for 3L-ANPC inverters by reliability analysis and ...
Xiaolin Zheng   +4 more
doaj   +1 more source

Review of Topside Interconnections for Wide Bandgap Power Semiconductor Packaging

open access: yesIEEE transactions on power electronics, 2023
Due to their superior material properties, wide bandgap (WBG) semiconductors enable the application of power electronics at higher temperature operation, higher frequencies, and higher efficiencies compared to silicon (Si).
Li‐shuenn Wang   +4 more
semanticscholar   +1 more source

Optimal edge termination for high oxide reliability aiming 10kV SiC n-IGBTs [PDF]

open access: yes, 2019
The edge termination design strongly affects the ability of a power device to support the desired voltage and its reliable operation. In this paper we present three appropriate termination designs for 10kV n-IGBTs which achieve the desired blocking ...
,   +9 more
core   +1 more source

Prediction and Validation of Wear-Out Reliability Metrics for Power Semiconductor Devices With Mission Profiles in Motor Drive Application

open access: yesIEEE transactions on power electronics, 2018
Due to the continuous demands for highly reliable and cost-effective power conversion, quantified reliability performances of the power electronics converter are becoming emerging needs.
Ke Ma, U. Choi, F. Blaabjerg
semanticscholar   +1 more source

Overview of Wide/Ultrawide Bandgap Power Semiconductor Devices for Distributed Energy Resources

open access: yesIEEE Journal of Emerging and Selected Topics in Power Electronics, 2023
This article provides an overview of power semiconductor devices (PSDs) for the distributed energy resource (DER) system. To begin with, an overview of electrically triggered silicon carbide (SiC) and gallium nitride (GaN) devices followed by a brief ...
S. Mazumder   +16 more
semanticscholar   +1 more source

Radiation Risks and Mitigation in Electronic Systems [PDF]

open access: yes, 2016
Electrical and electronic systems can be disturbed by radiation-induced effects. In some cases, radiation-induced effects are of a low probability and can be ignored; however, radiation effects must be considered when designing systems that have a high ...
Todd, B., Uznanski, S.
core   +3 more sources

Investigating the Failure Mechanism of p-GaN Gate HEMTs under High Power Stress with a Transparent ITO Gate

open access: yesMicromachines, 2023
The channel temperature distribution and breakdown points are difficult to monitor for the traditional p-GaN gate HEMTs under high power stress, because the metal gate blocks the light.
Zhanfei Han   +10 more
doaj   +1 more source

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