Results 31 to 40 of about 2,092,774 (331)
Multi-Threshold Corner Detection and Region Matching Algorithm Based on Texture Classification
IEEE Access, 2019 In order to address the unreasonable distributed corners in single threshold Harris detection and expensive computation cost incurred from image region matching performed by normalized cross correlation (NCC) algorithm, multi-threshold corner detection ...
Zetian Tang +6 more
doaj +1 more source
Technological sustainable materials and enabling in semiconductor memory industry: A review
e-Prime: Advances in Electrical Engineering, Electronics and Energy, 2023 This paper provides an overview of current and future deployment of recyclable direct materials and sustainable materials through recycling of interconnect metals used in semiconductor assembly and packaging. Also, with the aim to study the key technical
Chong Leong Gan +4 more
doaj +1 more source
Radiation Pattern Measurement in the Planar Coordinate
IEEE Photonics Journal, 2019 A planar measurement approach is presented to obtain the radiation pattern, by which rotation operations can be removed or reduced for a source with narrow and divergent viewing angle, respectively.
Chen Yang +5 more
doaj +1 more source
Electrical Noise and Semiconductor Reliability
Electrotehnica, Electronica, Automatica, 2023 Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices.
openaire +2 more sources
Review of power semiconductor device reliability for power converters
, 2017 The investigation shows that power semiconductor devices are the most fragile components of power electronic systems.Improving the reliability of power devices is the basis of a reliable power electronic system, and in recent years, many studies have ...
Bo Wang, Jie Cai, Xiong Du, Luowei Zhou
semanticscholar +1 more source
Synergistically Enhanced Performance and Reliability of Abrupt Metal‐Oxide Heterojunction Transistor
Advanced Electronic Materials, 2022 The large‐area low‐temperature processing capability and versatile characteristics of amorphous oxide semiconductor (AOS) thin‐film transistors (TFTs) are highly expected to promote the developments of next‐generation displays, 3D integrated circuit ...
Pengfei Wang +8 more
semanticscholar +1 more source
Design of Ellipsoid and Spherical Combined Light Source for Uniform Flux and Color Mixing
IEEE Photonics Journal, 2019 In this letter, an ellipsoid–spherical combined light source structure is presented for the purpose of uniform flux and color mixing, when considering heat dissipation.
Rui-Min Zeng +8 more
doaj +1 more source
Nanoscale Research Letters, 2020 In this work, AlGaN double channel heterostructure is proposed and grown by metal organic chemical vapor deposition (MOCVD), and high-performance AlGaN double channel high electron mobility transistors (HEMTs) are fabricated and investigated.
Yachao Zhang +9 more
doaj +1 more source
, 2016 In semiconductor manufacturing, understanding how various materials behave and interact is critical to making a reliable and robust semiconductor package. Semiconductor Packaging: Materials Interaction and Reliability provides a fundamental understanding of the underlying physical properties of the materials used in a semiconductor package.
Chen, Andrea, Lo, Randy Hsiao-Yu
openaire +3 more sources
Radiation, 2021 This article provides a review of semiconductor based ionising radiation sensors to measure accumulated dose and detect individual strikes of ionising particles. The measurement of ionising radiation (γ-ray, X-ray, high energy UV-ray and heavy ions, etc.)
Arijit Karmakar +4 more
semanticscholar +1 more source