Results 31 to 40 of about 120,829 (333)

Radiation Pattern Measurement in the Planar Coordinate

open access: yesIEEE Photonics Journal, 2019
A planar measurement approach is presented to obtain the radiation pattern, by which rotation operations can be removed or reduced for a source with narrow and divergent viewing angle, respectively.
Chen Yang   +5 more
doaj   +1 more source

VLSI Reliability in Europe [PDF]

open access: yes, 1993
Several issue's regarding VLSI reliability research in Europe are discussed. Organizations involved in stimulating the activities on reliability by exchanging information or supporting research programs are described.
Verweij, J.F., Verweij, Jan F.
core   +2 more sources

Electrical Noise and Semiconductor Reliability

open access: yesElectrotehnica, Electronica, Automatica, 2023
Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices.
openaire   +3 more sources

Technological sustainable materials and enabling in semiconductor memory industry: A review

open access: yese-Prime: Advances in Electrical Engineering, Electronics and Energy, 2023
This paper provides an overview of current and future deployment of recyclable direct materials and sustainable materials through recycling of interconnect metals used in semiconductor assembly and packaging. Also, with the aim to study the key technical
Chong Leong Gan   +4 more
doaj   +1 more source

Design of Ellipsoid and Spherical Combined Light Source for Uniform Flux and Color Mixing

open access: yesIEEE Photonics Journal, 2019
In this letter, an ellipsoid–spherical combined light source structure is presented for the purpose of uniform flux and color mixing, when considering heat dissipation.
Rui-Min Zeng   +8 more
doaj   +1 more source

Developing the knowledge-based human resources that support the implementation of the National Dual Training System (NDTS): evaluation of TVET teacher's competency at MARA Training Institutions [PDF]

open access: yes, 2015
Development in the world of technical and vocational education and training (TVET) on an ongoing basis is a challenge to the profession of the TVET-teachers to maintain their performance.
Ali, Mahazani
core   +1 more source

Fully integrated multi-optoelectronic synthesizer for THz pumping source in wireless communications with rich backup redundancy and wide tuning range [PDF]

open access: yes, 2016
We report a monolithic photonic integrated circuit (PIC) for THz communication applications. The PIC generates up to 4 optical frequency lines which can be mixed in a separate device to generate THz radiation, and each of the optical lines can be ...
Hongliang Zhu   +6 more
core   +1 more source

High-Performance AlGaN Double Channel HEMTs with Improved Drain Current Density and High Breakdown Voltage

open access: yesNanoscale Research Letters, 2020
In this work, AlGaN double channel heterostructure is proposed and grown by metal organic chemical vapor deposition (MOCVD), and high-performance AlGaN double channel high electron mobility transistors (HEMTs) are fabricated and investigated.
Yachao Zhang   +9 more
doaj   +1 more source

Characterization of the in-situ degradation process of P3HT:PCBM based on hyperspectral and neural networks

open access: yesPolymer Testing
In situ online observation of surface morphology during degradation processes is of paramount importance for exploring the stability of organic photovoltaic materials.
Yang Wang   +6 more
doaj   +1 more source

Design and development of a fast scan infrared detection and measurement instrument [PDF]

open access: yes, 1971
Infrared microscope instrument measures and plots the infrared profile of semiconductor chips, transistors and integrated circuits. Infrared analyses yields information on electrical and physical properties, enabling manufacturing improvements in ...
Dostoomian, A. S.   +3 more
core   +1 more source

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