Results 31 to 40 of about 2,332,362 (329)

Multi-Threshold Corner Detection and Region Matching Algorithm Based on Texture Classification

open access: yesIEEE Access, 2019
In order to address the unreasonable distributed corners in single threshold Harris detection and expensive computation cost incurred from image region matching performed by normalized cross correlation (NCC) algorithm, multi-threshold corner detection ...
Zetian Tang   +6 more
doaj   +1 more source

Review of power semiconductor device reliability for power converters

open access: yes, 2017
The investigation shows that power semiconductor devices are the most fragile components of power electronic systems.Improving the reliability of power devices is the basis of a reliable power electronic system, and in recent years, many studies have ...
Bo Wang, Jie Cai, Xiong Du, Luowei Zhou
semanticscholar   +1 more source

Prediction and Validation of Wear-Out Reliability Metrics for Power Semiconductor Devices With Mission Profiles in Motor Drive Application

open access: yesIEEE transactions on power electronics, 2018
Due to the continuous demands for highly reliable and cost-effective power conversion, quantified reliability performances of the power electronics converter are becoming emerging needs.
Ke Ma, U. Choi, F. Blaabjerg
semanticscholar   +1 more source

Radiation Pattern Measurement in the Planar Coordinate

open access: yesIEEE Photonics Journal, 2019
A planar measurement approach is presented to obtain the radiation pattern, by which rotation operations can be removed or reduced for a source with narrow and divergent viewing angle, respectively.
Chen Yang   +5 more
doaj   +1 more source

Fault Management Techniques to Enhance the Reliability of Power Electronic Converters: An Overview

open access: yesIEEE Access, 2023
The reliability of power electronic converters is a major concern in industrial applications because of using prone-to-failure elements such as high-power semiconductor devices and electronic capacitors. Hence, designing fault-tolerant inverters has been
S. Rahimpour   +4 more
semanticscholar   +1 more source

Electrical Noise and Semiconductor Reliability

open access: yesElectrotehnica, Electronica, Automatica, 2023
Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices.
openaire   +3 more sources

Technological sustainable materials and enabling in semiconductor memory industry: A review

open access: yese-Prime: Advances in Electrical Engineering, Electronics and Energy, 2023
This paper provides an overview of current and future deployment of recyclable direct materials and sustainable materials through recycling of interconnect metals used in semiconductor assembly and packaging. Also, with the aim to study the key technical
Chong Leong Gan   +4 more
doaj   +1 more source

Design of Ellipsoid and Spherical Combined Light Source for Uniform Flux and Color Mixing

open access: yesIEEE Photonics Journal, 2019
In this letter, an ellipsoid–spherical combined light source structure is presented for the purpose of uniform flux and color mixing, when considering heat dissipation.
Rui-Min Zeng   +8 more
doaj   +1 more source

High-Performance AlGaN Double Channel HEMTs with Improved Drain Current Density and High Breakdown Voltage

open access: yesNanoscale Research Letters, 2020
In this work, AlGaN double channel heterostructure is proposed and grown by metal organic chemical vapor deposition (MOCVD), and high-performance AlGaN double channel high electron mobility transistors (HEMTs) are fabricated and investigated.
Yachao Zhang   +9 more
doaj   +1 more source

Synergistically Enhanced Performance and Reliability of Abrupt Metal‐Oxide Heterojunction Transistor

open access: yesAdvanced Electronic Materials, 2022
The large‐area low‐temperature processing capability and versatile characteristics of amorphous oxide semiconductor (AOS) thin‐film transistors (TFTs) are highly expected to promote the developments of next‐generation displays, 3D integrated circuit ...
Pengfei Wang   +8 more
semanticscholar   +1 more source

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