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RRAM with a barrier layer

2021
CHANG FU-CHEN   +3 more
openaire   +1 more source

Highly Scalable Vertical Bypass RRAM (VB-RRAM) for 3D V -NAND Memory

2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
Geonhui Han   +11 more
openaire   +1 more source

Conductance variability in RRAM and its implications at the neural network level

Microelectronics Reliability
Hassan Aziza   +2 more
exaly  

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