Beilstein Journal of Nanotechnology, 2022 Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices.
Hao Liu +5 more
doaj +1 more source
Fluorescence-based proteasome activity profiling [PDF]
, 2012 With the proteasome emerging as a therapeutic target for cancer treatment, accurate tools for monitoring proteasome (inhibitor) activity are in demand.
Berkers, C.R. +4 more
core +1 more source
Machine learning at the (sub)atomic scale: next generation scanning probe microscopy
Machine Learning: Science and Technology, 2020 We discuss the exciting prospects for a step change in our ability to map and modify matter at the atomic/molecular level by embedding machine learning algorithms in scanning probe microscopy (with a particular focus on scanning tunnelling microscopy ...
O. Gordon, P. Moriarty
semanticscholar +1 more source
Controlled manipulation of oxygen vacancies using nanoscale flexoelectricity [PDF]
, 2017 Oxygen vacancies, especially their distribution, are directly coupled to the electromagnetic properties of oxides and related emergent functionalities that have implication in device applications.
Cao, Ye +10 more
core +3 more sources
Touching is believing: interrogating halide perovskite solar cells at the nanoscale via scanning probe microscopy [PDF]
npj Quantum Materials, 2017 Halide perovskite solar cells based on CH3NH3PbI3 and related materials have emerged as the most exciting development in the next generation photovoltaic technologies, yet the microscopic phenomena involving photo-carriers, ionic defects, spontaneous ...
Jiangyu Li +6 more
semanticscholar +1 more source
Pure hydrogen low-temperature plasma exposure of HOPG and graphene: Graphane formation? [PDF]
, 2012 Single- and multilayer graphene and highly ordered pyrolytic graphite (HOPG) were exposed to a pure hydrogen low-temperature plasma (LTP). Characterizations include various experimental techniques such as photoelectron spectroscopy, Raman spectroscopy ...
Eren, B. +7 more
core +1 more source
Scanning frequency comb microscopy—A new method in scanning probe microscopy
AIP Advances, 2018 A method for superimposing a microwave frequency comb (MFC) on the DC tunneling current in a scanning tunneling microscope (STM) is described in which a mode-locked laser is focused on the tunneling junction. The MFC is caused by optical rectification of
M. J. Hagmann
doaj +1 more source
A method for measuring the contact area in instrumented indentation testing by tip scanning probe microscopy imaging [PDF]
, 2014 The determination of the contact area is a key step to derive mechanical properties such as hardness or an elastic modulus by instrumented indentation testing. Two families of procedures are dedicated to extracting this area: on the one hand, post mortem
Charleux, L. +5 more
core +5 more sources
Mapping intrinsic electromechanical responses at the nanoscale via sequential excitation scanning probe microscopy empowered by deep data [PDF]
National Science Review, 2018 Ever-increasing hardware capabilities and computation powers have enabled acquisition and analysis of big scientific data at the nanoscale routine, though much of the data acquired often turn out to be redundant, noisy and/or irrelevant to the problems ...
Boyuan Huang, E. N. Esfahani, Jiangyu Li
semanticscholar +1 more source