Results 1 to 10 of about 1,488,769 (288)

Improved Hydrogen-Sensing of TiO2 Schottky Device Through Schottky Barrier Height Modulation [PDF]

open access: yesSensors
Adjusting the Schottky barrier height is an important approach to enhancing the gas-sensing performance of TiO2 Schottky sensors. In this study, micro TiO2 nanotube Schottky sensors were fabricated via magnetron sputtering and anodic oxidation, with ...
Xiaochuan Long   +4 more
doaj   +3 more sources

Schottky Barrier Height and Image Force Lowering in Monolayer MoS2 Field Effect Transistors [PDF]

open access: yesNanomaterials, 2020
Understanding the nature of the barrier height in a two-dimensional semiconductor/metal interface is an important step for embedding layered materials in future electronic devices.
Yonatan Vaknin   +2 more
doaj   +2 more sources

Drift of Schottky Barrier Height in Phase Change Materials. [PDF]

open access: yesACS Nano
Phase-change memory (PCM) devices have great potential as multilevel memory cells and artificial synapses for neuromorphic computing hardware. However, their practical use is hampered by resistance drift, a phenomenon commonly attributed to structural relaxation or electronic mechanisms primarily in the context of bulk effects.
Nir-Harwood RG   +10 more
europepmc   +3 more sources

A Study of Schottky Barrier Height Inhomogeneity on In/P-Silicon [PDF]

open access: yesЖурнал нано- та електронної фізики, 2011
The current-voltage characteristics of In/p-Si Schottky diode measured over a temperature range of 120-360 K have been interpreted on the basis of thermionic emission across an inhomogenous Schottky contact. The experiment shows that the apparent barrier
B.P. Modi
doaj   +2 more sources

Effect of Schottky barrier height lowering on resistance degradation of Fe-doped SrTiO3 thin-film capacitor

open access: yesAIP Advances, 2021
It is generally believed that the resistance degradation behavior of bulk and thin-film oxide capacitors arises from the oxygen vacancy migration within the oxide and/or the charge injection at the oxide/electrode interface.
Feng Xue
doaj   +1 more source

Comparison between modulations of contact and channel potential in nitrogen dioxide gas response of ambipolar carbon nanotube field-effect transistors

open access: yesAIP Advances, 2022
Carbon nanotubes (CNTs) are promising materials for gas sensing because of their large specific area and high sensitivity to charge differentiation.
Shota Nakahara   +5 more
doaj   +1 more source

Effects of alloy disorder on Schottky-barrier heights [PDF]

open access: yesPhysical Review B, 1987
The effects of alloy disorder on the Schottky barriers at semiconductor-alloy\char21{}metal interfaces are investigated within the defect model of Schottky-barrier formation. The deep levels and the associated wave functions for surface antisite defects, which are believed to be responsible for the barriers considered here, were previously calculated ...
MYLES, CW   +3 more
openaire   +3 more sources

Impact of Silicon Wafer Orientation on the Performance of Metal Source/Drain MOSFET in Nanoscale Regime: a Numerical Study [PDF]

open access: yesJournal of Nanostructures, 2012
A comprehensive study of Schottky barrier MOSFET (SBMOSFET) scaling issue is performed to determine the role of wafer orientation and structural parameters on the performance of this device within Non-equilibrium Green's Function formalism.
Z. Ahangari, M. Fathipour
doaj   +1 more source

Modulation of barrier height in n-type GaN Schottky structure with ultrathin oxide interlayer mediated by dipole formation [PDF]

open access: yesAPL Electronic Devices
The effect on the barrier height of inserting ultrathin oxide (GaOx) interlayers at n-type GaN Schottky contacts was systematically investigated. Inserting interlayers (>0.5nm) between GaN and electrode metals having relatively low electronegativities ...
Masahiro Hara   +4 more
doaj   +1 more source

Analysis of the Inhomogeneous Barrier in In/p-Si Schottky Contact and Modified Richardson Plot [PDF]

open access: yesЖурнал нано- та електронної фізики, 2016
The current-voltage (I-V) characteristics of In/p-Si Schottky barrier contact were measured over the temperature range 230-360 K with interval of 10 K.
J.M. Dhimmar, H.N. Desai, B.P. Modi
doaj   +1 more source

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