Results 271 to 280 of about 4,820 (302)

The model of secondary atom excited states formation

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1993
Abstract The model Hamiltonian is chosen and the mathematical formulation of the problem is discussed. The basic model equations of the excited states formation of the atoms which leave the metal surface are obtained. The calculation of the secondary atoms excitation probabilities proves the model to hold prospects.
V.G. Drobnich, S.Yu. Medvedev
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Secondary laser cooling of strontium-88 atoms

Journal of Experimental and Theoretical Physics, 2015
The secondary laser cooling of a cloud of strontium-88 atoms on the 1 S 0–3 P 1 (689 nm) intercombination transition captured into a magneto-optical trap has been demonstrated. We describe in detail the recapture of atoms from
S. A. Strelkin, K. Yu. Khabarova, A. A. Galyshev, O. I. Berdasov, A. Yu. Gribov, N. N. Kolachevsky, S. N. Slyusarev   +6 more
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Heavy Atom Secondary Kinetic Isotope Effect on H-Tunneling

The Journal of Physical Chemistry A, 2018
Although frequently employed, heavy atom kinetic isotope effects (KIE) have not been reported for quantum mechanical tunneling reactions. Here we examine the secondary KIE through 13C-substitution of the carbene atom in methylhydroxycarbene (H3C-C̈-OH) in its [1,2]H-tunneling shift reaction to acetaldehyde (H3C-CHO).
André K. Eckhardt, Dennis Gerbig, Peter R. Schreiner   +2 more
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Atomic-number dependence of the secondary-electron cascade from solids

Physical Review B, 1994
The parameters A and m in the power-law expression for the kinetic-energy dependence of the secondary-electron cascade of solid elements has been measured as a function of the atomic number of the sample. A pattern has been observed in the values of both A and m which is related to the variations in the Periodic Table.
, Greenwood, , Prutton, , Roberts
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Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements

Microscopy and Microanalysis, 2019
AbstractFor a long time, secondary ion mass spectrometry (SIMS) was the only technique allowing impurity concentrations below 1 at% to be precisely measured in a sample with a depth resolution of few nanometers. For example, SIMS is the classical technique used in microelectronics to study dopant distribution in semiconductors and became, after ...
Alain, Portavoce, Khalid, Hoummada, Lee, Chow   +2 more
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MODELING OF PRIMARY AND SECONDARY ATOMIZATION WITH SIMPLEX ATOMIZERS

Multiphase Science and Technology, 2020
Kushal Ghate, Govindaraj Muthuselvan, Thirumalachari Sundararajan   +2 more
openaire   +1 more source

Electric Strength of Secondary-Emission Atomic Batteries

Atomic Energy, 2001
Electric strength of multilayer atomic batteries operating on secondary electrons is examined. Analytical expressions are obtained for the breakdown voltage. It is shown that even when the diodes are connected in parallel the total voltage of all diodes determines breakdown.
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Atoms in the secondary school

Physics Education, 1977
J W Warren, G Marx
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Experimental characterization of secondary atomization at high Ohnesorge numbers

International Journal of Multiphase Flow, 2021
Vishnu Radhakrishna, Longchao Yao, Paul E Sojka   +2 more
exaly  

Secondary atomization of water-in-oil emulsion drops impinging on a heated surface in the film boiling regime

International Journal of Heat and Mass Transfer, 2021
Maxim Piskunov, Jan Breitenbach, J Benedikt Schmidt   +2 more
exaly