Results 111 to 120 of about 161,989 (332)
Historical Overview of Semiconductor Device Reliability for Telecommunication Networks––Field Data, Prediction Model of Device Failure Rate, and Wear-out Failure Analyses at NTT [PDF]
Noboru Shiono, Eisuke Arai, S. Mutoh
openalex +1 more source
Phase Engineering of a 1D van der Waals Thin Film
Explores the transformative potential of 1D van der Waals materials, focusing on the monoclinic‐to‐tetragonal phase transition in NbTe4, its atomic‐scale mechanisms, and significant metal‐insulator transition (MIT) behavior. Highlights advanced imaging insights and the applications of reversible phase transitions in memory devices, sensors, and ...
Yi Shuang, Daisuke Ando, Yuji Sutou
wiley +1 more source
The family of two-dimensional MA2Z4 heterostructures has received increasing attention in recent years. To investigate the structural stability, electrical structure, optical characteristics, and thermal properties (M = Ti, Zr, and Hf) of MSi2N4/WSi2N4 ...
Guang Wang+6 more
doaj
An RC snubber design method to achieve optimized switching noise‐loss trade‐off of cascode GaN HEMTs
The cascode gallium nitride high electron mobility transistors (GaN HEMTs) are very vulnerable to self‐sustained turn‐off oscillation due to their cascode configuration.
Peng Xue, Eckart Hoene, Pooya Davari
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Deterministic Writing of Field‐Free and Unipolar Spin‐Transfer Torque Magnetic Random‐Access Memory
Deterministic unipolar‐switching STT‐MRAM with field‐free operation is experimentally demonstrated. The device features a compact 4F2 cell architecture using a diode as the access device and a single magnetic tunneling junction. Unlike conventional bipolar switching STT‐MRAM requiring a three‐terminal access transistor in the array, this design offers ...
Ming‐Chun Hong+22 more
wiley +1 more source
In this paper, a built‐in electric field (BEF) strategy is proposed to fabricate NiFe‐LDH/antimonene heterostructure as bifunctional electrocatalysts for oxygen evolution reaction (OER) and hydrogen evolution reaction (HER). The formed BEF generates a local potential that reduces the potential for the formation of β‐NiOOH, thereby enabling ultra‐low ...
Jingkun Wang+11 more
wiley +1 more source
High reliability screening of semiconductor and integrated circuit devices [PDF]
Jack P. Lombardi+2 more
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Flexible Optical Fiber Stress/Temperature Dual‐Mode Sensing Based on CaZnOS:Nd,Er
Temperature and stress sensing based on flexible optical fibers may be the key to future artificial intelligence's perception of the world, here an optical fiber sensor capable of realizing such dual mode sensing is preliminary confirmed based on CaZnOS:Nd3+,Er3+.
Pan Zheng+12 more
wiley +1 more source
By integrating machine learning into flux‐regulated crystallization (FRC), accurate prediction of solvent evaporation rates in real time, improving crystallization control and reducing crystal growth variability by over threefold, is achieved. This enhances the reproducibility and quality of perovskite single crystals, leading to reproducible ...
Tatiane Pretto+8 more
wiley +1 more source
With the technological scaling of metal–oxide–semiconductor field-effect transistors (MOSFETs) and the scarcity of circuit design margins, the characteristics of device reliability have garnered widespread attention.
Zixuan Sun+4 more
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