Results 11 to 20 of about 2,771,177 (302)
Device reliability challenges for modern semiconductor circuit design – a review [PDF]
Advances in Radio Science, 2009 Product development based on highly integrated semiconductor circuits faces various challenges. To ensure the function of circuits the electrical parameters of every device must be in a specific window.
C. Schlünder
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Reliability of repetitively avalanched wire-bonded low-voltage discrete power trench n-MOSFETs [PDF]
, 2011 This paper, for the first time, investigates the reliability of wire-bonded low-voltage discrete power trench n-MOSFETs that have been subjected to repetitive unclamped inductive switching (RUIS).
Ian Kennedy +7 more
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Transient electrothermal simulation of power semiconductor devices [PDF]
, 2010 In this paper, a new thermal model based on the Fourier series solution of heat conduction equation has been introduced in detail. 1-D and 2-D Fourier series thermal models have been programmed in MATLAB/Simulink.
Bryant, Angus T. +12 more
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Multi-Threshold Corner Detection and Region Matching Algorithm Based on Texture Classification
IEEE Access, 2019 In order to address the unreasonable distributed corners in single threshold Harris detection and expensive computation cost incurred from image region matching performed by normalized cross correlation (NCC) algorithm, multi-threshold corner detection ...
Zetian Tang +6 more
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Radiation Pattern Measurement in the Planar Coordinate
IEEE Photonics Journal, 2019 A planar measurement approach is presented to obtain the radiation pattern, by which rotation operations can be removed or reduced for a source with narrow and divergent viewing angle, respectively.
Chen Yang +5 more
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Technological sustainable materials and enabling in semiconductor memory industry: A review
e-Prime: Advances in Electrical Engineering, Electronics and Energy, 2023 This paper provides an overview of current and future deployment of recyclable direct materials and sustainable materials through recycling of interconnect metals used in semiconductor assembly and packaging. Also, with the aim to study the key technical
Chong Leong Gan +4 more
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Design of Ellipsoid and Spherical Combined Light Source for Uniform Flux and Color Mixing
IEEE Photonics Journal, 2019 In this letter, an ellipsoid–spherical combined light source structure is presented for the purpose of uniform flux and color mixing, when considering heat dissipation.
Rui-Min Zeng +8 more
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Charge noise and spin noise in a semiconductor quantum device [PDF]
, 2014 Self-assembled quantum dots are very attractive as the building blocks for quantum light sources and spin qubits. For instance, a single quantum dot is a robust, fast, narrow-linewidth source of single photons, features not shared by any other ...
Kuhlmann, Andreas V.
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Electrical Noise and Semiconductor Reliability [PDF]
, 2023 Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize
BĂJENESCU, Titu-Marius I.
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Results in Physics, 2021 For semiconductor device applications such as FinFET, MEMS, 2D materials, and wide bandgap materials, reliability is one of the most powerful key factors for commercialization in the industry. ZnGa2O4 deep ultraviolet (DUV) photodetectors (PDs) have been
Apoorva Sood +6 more
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