Results 11 to 20 of about 35,929 (259)
Simulation of silicon wafers heating during rapid thermal processing using “UBTO 1801” unit
The present work is devoted to determination of the dependence of the heating temperature of the silicon wafer on the lamps power and the heating time during rapid thermal processing using “UBTO 1801” unit by irradiating the wafer backside with an ...
J. A. Solovjov +2 more
doaj +1 more source
The improvement of the cone defect of domestic silicon wafer
The cone defects in the verification of domestic silicon wafer were focused and studied in the paper.By optimizing the control of the waiting time in pulling and producing during the silicon wafers process, the cone defects of silicon wafers were reduced
LU Zhenjie, LI Jie, LANG Yuhong
doaj +1 more source
The aim of this paper, the improvement of optical properties of as-cut boron doped p-type multi-crystalline silicon (mc-Silicon) wafer grains obtained by chemical texturization is presented.
Madhesh Raji +4 more
doaj +1 more source
Using Anisotropic Silicon Etch for Change the Crystal Orientation of Silicon Wafer [PDF]
In this work، anisotropic silicon etch using KOH ، optical microscopic and X-ray diffraction testing، were used to determine the crystal orientation of the silicon wafer(100) plane , where the mechanical polishing and wet etching described the geometric ...
Saria D.mohammed +2 more
doaj +1 more source
Progress and Prospect of Semiconductor Silicon Wafers in China
Silicon wafers are fundamental materials for semiconductors. China's semiconductor silicon wafers are highly dependent on foreign trade. Enhancing the independent guarantee capability of silicon wafers is significant for improving the overall level of ...
Zhang Guohu, Xiao Qinghua, Ma Fei
doaj +1 more source
Introduction of IC Manufacturing to Amateurs [PDF]
In the fabrication of silicon wafers to create integrated circuits, chemistry and physics play a significant role. It is important to change the silicon wafer surface conditions and properties using both innocuous and harmful compounds, particular and ...
Chen Linxuan, Wang Zilong, Wang Zishuo
doaj +1 more source
Detection of Monocrystalline Silicon Wafer Defects Using Deep Transfer Learning
Defect detection is an important step in industrial production of monocrystalline silicon. Through the study of deep learning, this work proposes a framework for classifying monocrystalline silicon wafer defects using deep transfer learning (DTL).
Adriana Ganum +3 more
doaj +1 more source
Electrophoretic Deposited Quartz Powder-Assisted Growth of Multicrystalline Silicon
Ingot multicrystalline silicon (Mc-Si) needs to be improved in quality and reduced in cost compared with Czochralski monocrystalline silicon. A uniform and dense quartz nucleation layer was obtained by the electrophoretic deposition of quartz powder on ...
Xiang Quan +3 more
doaj +1 more source
Porous silicon nanowire arrays fabrication through one-step metal-assisted chemical etching
One-step metal-assisted chemical etching (MACE) was used to fabricate porous silicon nanowire arrays. Also, the effects of doping level, AgNO3 concentration, and HF concentration on the morphology and structure of porous silicon nanowire were ...
HE Zu-dong +6 more
doaj +1 more source
A new cleaning agent for silicon contamination in the wafer dicing process was formulated in this research. Ammonium bifluoride was introduced as the main ingredient in the formula, and MSA and sulfuric acid were added as the solvent and buffer solution ...
Teh-Hua Tsai, Chen-Yu Wang
doaj +1 more source

