Results 21 to 30 of about 35,929 (259)

High-Throughput Multiple Dies-to-Wafer Bonding Technology and III/V-on-Si Hybrid Lasers for Heterogeneous Integration of Optoelectronic Integrated Circuits

open access: yesFrontiers in Materials, 2015
Integrated optical light source on silicon is one of the key building blocks for optical interconnect technology. Great research efforts have been devoting worldwide to explore various approaches to integrate optical light source onto the silicon ...
Xianshu eLuo   +11 more
doaj   +1 more source

Optimization of Electroplating on Silicon Wafer

open access: yesThe Proceedings of The Computational Mechanics Conference, 2000
A new method, combination of a boundary element method and a finite element method, has been developed to simulate the electroplating of a silicon wafer with copper. In this method, the Laplace equation is solved by representing the complicated phenomena near the anode and cathode surface as polarization characteristics (PCs) and using the PCs as ...
AOKI, Shigeru   +3 more
openaire   +3 more sources

Surface evolution and stability transition of silicon wafer subjected to nano-diamond grinding

open access: yesAIP Advances, 2017
In order to obtain excellent physical properties and ultrathin devices, thinning technique plays an important role in semiconductor industry with the rapid development of wearable electronic devices.
Shisheng Cai   +6 more
doaj   +1 more source

Review on chemical mechanical polishing of silicon wafers

open access: yesJin'gangshi yu moliao moju gongcheng, 2020
With the increase of wafer thickness and the decrease of chip thickness, the amount of material removal increases in the process of wafer processing, and the problem of improving the processing efficiency has become one of the research hotspots.
XU Jiahui   +3 more
doaj  

Infrared Light Absorption Enhancement in Crystalline Silicon Wafer Textured with H2SO4 Solution

open access: yesUMYU Scientifica Journal, 2023
In recent years, the formation of microstructures on silicon wafer has gained popularity as a concept for increasing photon trapping and light absorption for optoelectronics applications.
Abdurrahman Muhammed   +3 more
doaj   +1 more source

Getters in silicon [PDF]

open access: yesModern Electronic Materials, 2019
Gettering of rapidly diffusing metallic impurities and structural defects in silicon which is the main material for IC fabrication, high-power high-voltage devices and neutron doped silicon has been studied.
Vyacheslav A. Kharchenko
doaj   +3 more sources

Tailoring Functional Properties of Ti–Ni–Cu Shape Memory Alloy Thin Films for MEMS Actuators

open access: yesAdvanced Engineering Materials, EarlyView.
A comprehensive study of critical parameters required to develop well‐performing Ti–Ni–Cu thin film shape memory alloy microactuators is provided. Materials science and device integration aspects are integrated by addressing structural and physical relationships using complementary characterization techniques as well as a practical fabrication solution
Elaheh Akbarnejad   +6 more
wiley   +1 more source

Double‐sided transistor device processability of carrierless ultrathin silicon wafers

open access: yesInfoMat, 2020
Double‐sided metal‐oxide‐semiconductor field‐effect‐transistor processing is demonstrated for the first time on an ultrathin crystalline silicon substrate of 6‐20 μm in a 100 mm diameter wafer format without a carrier wafer, the thinnest free‐standing ...
Ruby A. Lai   +3 more
doaj   +1 more source

Multilayer Self‐Limiting Electrospray Deposition via Stepped Voltage Bias

open access: yesAdvanced Engineering Materials, EarlyView.
Self‐limiting electrospray deposition (SLED) uses a high voltage to generate and deposit a charged payload on a target surface. The coating retains its charge, repelling newly arriving material. SLED thickness can be decreased by applying a secondary bias to the target.
Madhuri Deb   +3 more
wiley   +1 more source

Uniform Amorphization of Crystalline Silicon Surfaces Enabled by Deep Ultraviolet Femtosecond Laser Pulses

open access: yesAdvanced Engineering Materials, EarlyView.
Deep‐UV (258 nm) femtosecond pulses enable uniform amorphous silicon writing on Si(100)/(111) with a six‐fold larger fluence amorphization window than NIR methods. Optimized fluence and overlap yield 20–45 nm uniform and continuous amorphous layers. Microscopy shows sharp interfaces, and real‐time reflectivity reveals nanosecond melt–resolidification ...
Wissal Benali   +5 more
wiley   +1 more source

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