Results 151 to 160 of about 2,116 (217)

Interface-Driven Electrothermal Degradation in GaN-on-Diamond High Electron Mobility Transistors. [PDF]

open access: yesNanomaterials (Basel)
Wang H   +9 more
europepmc   +1 more source

SiC MOSFET with Integrated SBD Device Performance Prediction Method Based on Neural Network. [PDF]

open access: yesMicromachines (Basel)
Niu X   +10 more
europepmc   +1 more source

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