Results 1 to 10 of about 2,850,351 (204)

Study on ESD Protection Circuit by TCAD Simulation and TLP Experiment [PDF]

Micromachines, 2023
The anti-ESD characteristic of the electronic system is paid more and more attention. Moreover, the on-chip electrostatic discharge (ESD) is necessary for integrated circuits to prevent ESD failures.
Fuxing Li, Changchun Chai, Yuqian Liu, Yanxing Song, Lei Wang, Yintang Yang   +5 more
doaj   +4 more sources

Efficient Automatic Design of a 2D TMD FET via Machine Learning-Assisted TCAD Simulation [PDF]

Micromachines
As the scaling of silicon-based devices approaches physical limits, two-dimensional transition-metal dichalcogenide field-effect transistors (2D TMD FETs) have emerged as promising candidates for logic devices in the post-Moore era. However, their design
Na Shi, Zi-Jun Wei, Tong Wu
doaj   +3 more sources

TCAD Simulation Studies on Ultra-Low-Power Non-Volatile Memory [PDF]

Micromachines, 2023
Ultra-Low-Power Non-Volatile Memory (UltraRAM), as a promising storage device, has attracted wide research attention from the scientific community. Non-volatile data retention in combination with switching at ≤2.6 V is achieved through the use of the ...
Ziming Xu, Jinshun Bi, Mengxin Liu, Yu Zhang, Baihong Chen, Zijian Zhang   +5 more
doaj   +2 more sources

TCAD Simulation of Two Photon Absorption—Transient Current Technique Measurements on Silicon Detectors and LGADs [PDF]

Sensors
Device simulation plays a crucial role in complementing experimental device characterisation by enabling deeper understanding of internal physical processes.
Sebastian Pape, Michael Moll, Marcos Fernández García, Moritz Wiehe   +3 more
doaj   +2 more sources

EPreNet: A Condition-Guided Network Accelerates Etching Profile Prediction [PDF]

Micromachines
Plasma etching is a critical step in semiconductor manufacturing, yet existing approaches are either computationally expensive or limited to predicting scalar etching metrics rather than full profile evolution.
Mengjiao Lu, Zerui Jin, Wanjun Wang, Jianghai He, Qingqing Liu   +4 more
doaj   +2 more sources

Total Ionizing Dose Effect Simulation Study on 130 nm CMOS Processor [PDF]

Micromachines
This paper reports the results of a system-level total ionizing dose (TID) effect simulation study on a SMIC 130 nm LEON2 processor. Firstly, the device-level simulations of the 130 nm NMOS transistors are performed using the Sentaurus TCAD software to ...
Yi Liu, Yuchen Liu, Xinfang Liao, Changqing Xu, Yangchen He, Yintang Yang   +5 more
doaj   +2 more sources

ESD Design Verification Aided by Mixed-Mode Multiple-Stimuli ESD Simulation

IEEE Journal of the Electron Devices Society, 2021
Electrostatic discharge (ESD) protection is a grand design challenge for complex ICs in advanced technologies. ESD simulation is indispensable to guide ESD protection designs.
Mengfu Di, Zijin Pan, Cheng Li, Albert Wang   +3 more
doaj   +1 more source

Prediction of Device Characteristics of Feedback Field-Effect Transistors Using TCAD-Augmented Machine Learning

Micromachines, 2023
In this study, the device characteristics of silicon nanowire feedback field-effect transistors were predicted using technology computer-aided design (TCAD)-augmented machine learning (TCAD-ML).
Sola Woo, Juhee Jeon, Sangsig Kim
doaj   +1 more source

3D TCAD Analysis Enabling ESD Layout Design Optimization

IEEE Journal of the Electron Devices Society, 2020
On-chip electrostatic discharge (ESD) protection design for integrated circuits (ICs) is a challenging design-for-reliability problem. Since ESD events involve very high current transients in very short time period, current crowding is unavoidable, which
Zijin Pan, Cheng Li, Mengfu Di, Feilong Zhang, Albert Wang   +4 more
doaj   +1 more source

Narrowband Near-Infrared Perovskite/Organic Photodetector: TCAD Numerical Simulation

Crystals, 2022
Narrowband photodetectors (PD) established in the near-infrared (NIR) wavelength range are highly required in a variety of applications including high-quality bioimaging.
Marwa S. Salem, Ahmed Shaker, Amal H. Al-Bagawia, Ghada Mohamed Aleid, Mohamed S. Othman, Mohammad T. Alshammari, Mostafa Fedawy   +6 more
doaj   +1 more source