Results 191 to 200 of about 13,102,541 (237)

Energy Deposition and Characterization of Single-Event Upset and Latch-Up Cross Sections With 14 MeV and Thermal Neutrons

IEEE Transactions on Nuclear Science
Matteo Cecchetto, Rubén García Alía, Giuseppe Lerner, Kacper Bilko, Francesc Salvat Pujol, Vasilis Vlachoudis, Francesco Cerutti   +6 more
openaire   +1 more source

Characterization of Defect Distribution in an Additively Manufactured AlSi10Mg as a Function of Processing Parameters and Correlations with Extreme Value Statistics

Advanced Engineering Materials, EarlyView.
Predicting extreme defects in additive manufacturing remains a key challenge limiting its structural reliability. This study proposes a statistical framework that integrates Extreme Value Theory with advanced process indicators to explore defect–process relationships and improve the estimation of critical defect sizes. The approach provides a basis for
Muhammad Muteeb Butt, Varma Kvvssn, Hossein Laieghi, Zia Uddin, Peyman Ansari, E. Kıvanç Sadak, Can Barış Toprak, Hüseyin Kızıl, Enrico Salvati   +8 more
wiley   +1 more source

A Workflow to Accelerate Microstructure‐Sensitive Fatigue Life Predictions

Advanced Engineering Materials, EarlyView.
This study introduces a workflow to accelerate predictions of microstructure‐sensitive fatigue life. Results from frameworks with varying levels of simplification are benchmarked against published reference results. The analysis reveals a trade‐off between accuracy and model complexity, offering researchers a practical guide for selecting the optimal ...
Luca Loiodice, Krzysztof S. Stopka, Michael D. Sangid   +2 more
wiley   +1 more source

Microstructural Evolution and Vacancy Defect Formation in Mn–Mo–Ni RPV Steel Under Low Cycle Fatigue: Insights From EBSD and PALS

Advanced Engineering Materials, EarlyView.
Low‐cycle fatigue damage in Mn–Mo–Ni reactor pressure vessel steel is examined using a combined electron backscatter diffraction and positron annihilation lifetime spectroscopy approach. The study correlates texture evolution, dislocation substructure development, and vacancy‐type defect formation across uniform, necked, and fracture regions, providing
Apu Sarkar, Dhanadeep Dutta, G. Bharat Reddy   +2 more
wiley   +1 more source

A Numerical–Experimental Approach for Multi‐Matrix Fiber‐Reinforced Plastics Characterization Using Finite Element Model Updating

Advanced Engineering Materials, EarlyView.
A numerical–experimental framework is developed for characterizing multi‐matrix fiber‐reinforced polymers (MM‐FRPs) combining epoxy and polyurethane matrices. Harmonic bending tests are integrated with finite element model updating (FEMU) to simultaneously identify elastic and viscoelastic material parameters.
Rodrigo M. Dartora, Tales V. Lisbôa, Axel Spickenheuer, Rogério J. Marczak, Jakson M. Vassoler   +4 more
wiley   +1 more source

Thermomechanical Fatigue and Creep–Fatigue Interaction of Inconel 718 Additively Manufactured by Laser Beam Powder Bed Fusion

Advanced Engineering Materials, EarlyView.
Thermomechanical fatigue tests of laser beam powder bed fusion (PBF‐LB) Inconel 718 show that the additively manufactured material reaches almost the lifetimes of conventionally‐rolled material under no‐dwell conditions. Introducing dwell times at the maximum temperature markedly reduces the lifetimes due to pronounced grain boundary sliding associated
Stefan Guth, Tomáš Babinský, Jan Lars Riedel, Wen Hao Kan, Aijun Huang, Martin Heilmaier, Ivo Šulák   +6 more
wiley   +1 more source

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Estimating Single-Event Logic Cross Sections in Advanced Technologies

IEEE Transactions on Nuclear Science, 2017
Reliable estimation of logic single-event upset (SEU) cross section is becoming increasingly important for predicting the overall soft error rate. As technology scales and single-event transient (SET) pulse widths shrink to widths on the order of the setup-and-hold time of flip-flops, the probability of latching an SET as an SEU must be reevaluated. In
Kevin M. Warren, Yanran P Chen, Lloyd Massengill   +2 more
exaly   +2 more sources

Single Event Upset Cross Sections at Various Data Rates

IEEE Transactions on Nuclear Science, 1996
We present data which show that Single Event Upset (SEU) cross section varies linearly with frequency for most devices tested. We show that the SEU cross section can increase dramatically away from a linear relationship when the test setup is not optimized, or when testing near the maximum operating frequency.
Stephen P Büchner, R A Reed, M A Carts
exaly   +2 more sources

A Calculation Method to Estimate Single Event Upset Cross Section

Microelectronics Reliability, 2017
We calculate single event effect cross-section with a new general method based on the evaluation of the current collected by an electrode and the ability of the cell to dissipate the charge involved in the event. Basically, a part of the charge deposited by an ionizing particle is collected, and a part of this latest is dissipated during the transient.
Frédéric Wrobel, Jérôme Boch, F Saigné   +2 more
exaly   +2 more sources

Analysis of Bulk FinFET Structural Effects on Single-Event Cross Sections

IEEE Transactions on Nuclear Science, 2017
A set of upset criteria based on circuit characteristic switching time frame is developed and used to bridge transistor-level TCAD simulations to circuit-level single-event (SE) upset cross sections for advanced (fast and small) digital circuits. Interpretation of the measured and 3D TCAD simulated single-event upset (SEU) responses of bulk planar ...
Lloyd Massengill, Robert Reed, Bharat Bhuva   +2 more
exaly   +2 more sources