Results 251 to 253 of about 211,032 (253)

Analysis of the Single-Event Latch-Up Cross section of a 16 nm FinFET System-on-Chip Using Backside Single-Photon Absorption Laser Testing and Correlation With Heavy Ion Data

IEEE Transactions on Nuclear Science
M Fongral, V Pouget, M Ruffenach
exaly  

Measurement of the cross section if single leptonic t/tbar events.

2006
openaire   +1 more source

Modification of single event upset cross section of an SRAM at high frequencies

S Büchner, A B Campbell
exaly