Results 241 to 250 of about 211,032 (253)

Modeling the heavy ion cross-section for single event upset with track structure effects: the HIC-UP-TS model

IEEE Transactions on Nuclear Science, 1996
Whereas HIC-UP modeled the heavy ion strike as a line source of charge, HIC-UP-TS accounts for the spatial distribution of electron-hole-pairs by using a 1/r/sup 2/ profile. The model compares well with experimental data.
L.W. Connell, F.W. Sexton, P.J. McDaniel, A.K. Prinja   +3 more
openaire   +1 more source

High LET Single Event Upset Cross Sections For Bulk and SOI CMOS SRAMs

AIP Conference Proceedings, 2003
Electronics in spacecraft and satellites are exposed to high‐energy cosmic radiation. In addition, terrestrial radiation can also affect earth‐based electronics. To study the effects of radiation upon integrated circuits and to insure the reliability of electronic devices, cosmic and terrestrial radiations are simulated with ion beams from particle ...
openaire   +1 more source

Single Event Upset Prediction from Heavy Ions Cross Sections with No Parameters

2014
We show how experimental SEU cross section can be used to characterize a device. We extract parameters that can be used for SEU cross section calculation for any other kind of particle.
Wrobel, Frédéric, Touboul, Antoine, Pouget, Vincent, Dilillo, Luigi, Saigné, Frédéric   +4 more
openaire   +1 more source

Single event transient study on PMOS-NMOS cross-coupled LC-VCO using PLL

International Journal of Electronics, 2021
Arumugam Karthigeyan
exaly  

Acquisition and classification of static single-event upset cross section for SRAM-based FPGAs

High Power Laser and Particle Beams, 2011
姚志斌 Yao Zhibin, 范如玉 Fan Ruyu, 郭红霞 Guo Hongxia, 王忠明 Wang Zhongming, 何宝平 He Baoping, 张凤祁 Zhang Fengqi, 张科营 Zhang Keying   +6 more
openaire   +1 more source

A Phenomenological Cross Section Approach to Single Event Rate Characterization: Experimental Averaging over Full Solid Angle

2022
Mrozovskaya, Elizaveta V, Galimov, Artur M, Chubunov, Pavel A, Zebrev, Gennady I   +3 more
openaire   +1 more source

Semi-Empirical Method for Estimation of Single-Event Upset Cross Section for SRAM DICE Cells

IEEE Transactions on Nuclear Science, 2016
Maxim S Gorbunov
exaly  

Issues for single-event proton testing of SRAMs

IEEE Transactions on Nuclear Science, 2004
J R Schwank, P E Dodd, M R Shaneyfelt
exaly  

Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node

IEEE Transactions on Nuclear Science, 2011
B L Bhuva, L W Massengill, S -J Wen
exaly  

Cross-examination may be more detrimental to repeated-event children than single-event children

Memory
Patricia I Coburn, Deborah A Connolly, Daniel M Bernstein   +2 more
exaly