Results 241 to 250 of about 853,970 (265)

Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Test Guideline for Proton and Heavy Ion Single-Event Effects

IEEE Transactions on Nuclear Science, 2013
Paul E Dodd, James R Schwank, Marty R Shaneyfelt   +2 more
exaly  

Single Event crosstalk shielding for CMOS logic

Microelectronics Journal, 2009
Selahattin Sayil
exaly  

Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS

Microelectronics Journal, 2017
Zhengfeng Huang, Ouyang Yiming, Yan Aibin   +2 more
exaly  

Bootstrap analysis of the single subject with event related potentials

Cognitive Neuropsychology, 2011
, Kirsten Dalrymple, Lindsay Nagamatsu
exaly  

Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies[Note 1]

IET Computers and Digital Techniques, 2009
, Alireza Ejlali, Ahmad Patooghy
exaly  

Single Event Effects in Aerospace

2011
openaire   +1 more source

Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processor

IEEE Transactions on Nuclear Science, 2000
B L Bhuva, L W Massengill
exaly  

Single Event Effects in Avionics

2017
openaire   +1 more source

Single Event Upset Measurements of Gaas E-JFET RAMS

IEEE Transactions on Nuclear Science, 1983
R Zuleeg, A B Campbell, P Shapiro
exaly  

Basic mechanisms and modeling of single-event upset in digital microelectronics

IEEE Transactions on Nuclear Science, 2003
P E Dodd, L W Massengill
exaly