Results 231 to 240 of about 17,695,032 (262)

Single-Event Effects Test Methods

2019
This chapter presents an overview of main types of single-event effects (SEE), basic characteristics of sensitivity of devices and integrated circuits to SEE and existing standards and guidelines for testing with the use of heavy ion and proton accelerators. Basic requirements for both heavy ion and proton testing will be considered in detail including
openaire   +1 more source

SINGLE EVENT EFFECTS IN AVIONICS AND ON THE GROUND

International Journal of High Speed Electronics and Systems, 2004
Single event effects in electronics caused by the atmospheric neutrons have been an issue for systems using large blocks of random access memory (RAM) in avionics applications as well as those on the ground. At ground level there are two main sources of single event effects, alpha particles from the packaging materials as well as the neutrons, but at ...
openaire   +1 more source

Single Event Effects: Mechanisms and Classification

2010
Single Event Effects (SEEs) induced by heavy ions, protons, and neutrons become an increasing limitation of the reliability of electronic components, circuits, and systems, and have stimulated abundant past and undergoing work for improving our understanding and developing mitigation techniques.
openaire   +1 more source

Lung Cancer Radiation May Increase the Risk of Major Adverse Cardiac Events

Ca-A Cancer Journal for Clinicians, 2019
Mike Fillon
exaly  

Historical Events Leading to the Clinical Application of Radium

Ca-A Cancer Journal for Clinicians, 1966
Edith Quimby
exaly  

The Efficacy of a Single Cytology Smear in the Detection of Cancer of the Cervix

Ca-A Cancer Journal for Clinicians, 1963
W A D Anderson
exaly  

Destructive Single-Event Effects in Semiconductor Devices and ICs

IEEE Transactions on Nuclear Science, 2003
F W Sexton
exaly  

Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Test Guideline for Proton and Heavy Ion Single-Event Effects

IEEE Transactions on Nuclear Science, 2013
Paul E Dodd, James R Schwank, Marty R Shaneyfelt   +2 more
exaly  

Basic Mechanisms and Modeling of Single-Event Upset in Digital Microelectronics

IEEE Transactions on Nuclear Science, 2003
P E Dodd, L W Massengill
exaly  

Adaptive Neural Network-Based Event-Triggered Control of Single-Input Single-Output Nonlinear Discrete-Time Systems

IEEE Transactions on Neural Networks and Learning Systems, 2016
Avimanyu Sahoo, Jagannathan Sarangapani
exaly