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On-line characterization and reconfiguration for single event upset variations
2009 15th IEEE International On-Line Testing Symposium, 2009The amount of physical variation among electronic components on a die is increasing rapidly. There is a need for a better understanding of variations in transient fault susceptibility, and for methods of on-line adaptation to such variations. We address three key research questions in this area.
Kenneth M. Zick, John P. Hayes
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Single Event Upset Hardening of Interconnects
2016With advances in technology scaling, circuits are increasingly more sensitive to transients caused by Single Event particles. Hardening techniques for CMOS combinational logic have been developed to address the problems associated with Single Event Transients , but in these designs, SET coupling effects have been ignored.
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Single Event Upset Error Rates
1997This chapter together with Chapter 8 provides the major share of the discussion on the practical aspects of single event upset (SEU). This includes formulas for computing SEU in various particle environments. Section 5.2 discusses SEU calculations for heavy-ion cosmic rays at geosynchronous altitudes and Section 5.3 for Van Allen belt protons.
George C. Messenger, Milton S. Ash
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Single Event Upset Detection and Correction
10th International Conference on Information Technology (ICIT 2007), 2007Jawar Singh +3 more
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Observation of Single Event Upsets in Analog Microcircuits
IEEE Transactions on Nuclear Science, 1993S D Pinkerton, K B Crawford, D C Mayer
exaly
Suggested Single Event Upset Figure of Merit
IEEE Transactions on Nuclear Science, 1983E L Petersen
exaly
Single Event Upset Measurements of Gaas E-JFET RAMS
IEEE Transactions on Nuclear Science, 1983R Zuleeg, A B Campbell, P Shapiro
exaly