Results 1 to 10 of about 1,891 (120)

Bootstrapped Driver and the Single-Event-Upset Effect [PDF]

IEEE Transactions on Circuits and Systems I: Regular Papers, 2020
As VLSI circuits are progressing in very Deep Submicron (DSM) regime without decreasing chip area, the importance of global interconnects increases but at the cost of performance and power consumption. This work proposes a low power circuit for driving a global interconnect at voltages close to the noise level. In order to address ultra-low power (ULP)
Mohammed Al-daloo, Mohamed A. Abufalgha, Alex Yakovlev, Basel Halak   +3 more
openaire   +3 more sources

Accelerator simulation test technology and its application for single event effect evaluation in space

He jishu, 2023
BackgroundThe space environment contains numerous high-energy particles, and a single high-energy particle passing through a spacecraft shell bombards the electronic devices within, triggering single-particle effects such as device logic state upset and ...
CHEN Qiming, GUO Gang, SUI Li, LIU Jiancheng, ZHANG Yanwen, ZHANG Fuqiang, YIN Qian, HAN Jinhua, ZHANG Zheng, SUN Haohan   +9 more
doaj   +1 more source

Efficacy of Transistor Interleaving in DICE Flip-Flops at a 22 nm FD SOI Technology Node

Applied Sciences, 2022
Fully Depleted Silicon on Insulator (FD SOI) technology nodes provide better resistance to single event upsets than comparable bulk technologies, but upsets are still likely to occur at nano-scale feature sizes, and additional hardening techniques should
Christopher J. Elash, Zongru Li, Chen Jin, Li Chen, Jiesi Xing, Zhiwu Yang, Shuting Shi   +6 more
doaj   +1 more source

Investigation and feasibility study of using components with different categories from the perspective of radiation damage in LEO and GEO orbits [PDF]

فصلنامه علوم و فناوری فضایی, 2021
Space radiation can affect the performance and reliability of components in space systems. This paper focuses on the investigation of three types of radiation damage including ionizing dose, displacement damage, and single event damage using OMERE ...
Hamideh Daneshvar, Azam Eidi, Leila Mohamadi, Reza Omidi, Pedram Hajipour   +4 more
doaj   +1 more source

Triple Modular Redundancy verification via heuristic netlist analysis [PDF]

PeerJ Computer Science, 2015
Triple Modular Redundancy (TMR) is a common technique to protect memory elements for digital processing systems subject to radiation effects (such as in space, high-altitude, or near nuclear sources). This paper presents an approach to verify the correct
Giovanni Beltrame
doaj   +2 more sources

Single event effects qualificatoin of integrated circuits

Безопасность информационных технологий, 2020
The goal of qualification or monitoring of electronic device radiation testings is to ensure that devices meet the set of requirements. In some cases, this can be achieved without full characterization of radiation behavior, which leads to significant ...
Armen V. Sogoyan, Anatoly A. Smolin, Alexander I. Chumakov   +2 more
doaj   +1 more source

Simulation of Single-Event Transient Effect for GaN High-Electron-Mobility Transistor

Micromachines, 2023
A GaN high-electron-mobility transistor (HEMT) was simulated using the semiconductor simulation software Silvaco TCAD in this paper. By constructing a two-dimensional structure of GaN HEMT, combined with key models such as carrier mobility, the effects ...
Zhiheng Wang, Yanrong Cao, Xinxiang Zhang, Chuan Chen, Linshan Wu, Maodan Ma, Hanghang Lv, Ling Lv, Xuefeng Zheng, Wenchao Tian, Xiaohua Ma, Yue Hao   +11 more
doaj   +1 more source

Effect of Temperature on Single Event Latchup Sensitivity [PDF]

2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2020
Single-Event Latchup (SEL) concerns CMOS technology as a major reliability issue and it is influenced by different parameters. In this work, the effect of the temperature variation on SEL has been investigated and its effect has been analyzed combining the variation of three parameters related to the geometry and to the design of the component: doping ...
S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul   +7 more
openaire   +2 more sources

NAIRAS Model Run‐On‐Request Service at CCMC

Space Weather, 2023
The Nowcast of Aerospace Ionizing RAdiation System (NAIRAS) version 3 model is available to the community through the Community Coordinated Modeling Center run‐on‐request (RoR) service.
C. J. Mertens, G. P. Gronoff, Y. Zheng, M. Petrenko, J. Buhler, D. Phoenix, E. Willis, I. Jun, J. Minow   +8 more
doaj   +1 more source

RAMSEES: A Model of the Atmospheric Radiative Environment Based on Geant4 Simulation of Extensive Air Shower

Aerospace, 2023
The device downscaling of electronic components has given rise to the need to consider specific failures in onboard airplane electronics. Single Event Effects (SEE) are a kind of failures that occur due to radiation in the atmosphere.
Hugo Cintas, Frédéric Wrobel, Marine Ruffenach, Damien Herrera, Frédéric Saigné, Athina Varotsou, Françoise Bezerra, Julien Mekki   +7 more
doaj   +1 more source