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Mitigating bit flips or single event upsets in epilepsy neurostimulators [PDF]
Epilepsy and Behavior Case Reports, 2016 Objectives: The objective of this study was to review software errors known as single event upsets (SEUs) or bit flips due to cosmic rays in epilepsy neurostimulators. Materials and methods: A case report of a single event upset or bit flip is discussed;
Alice X. Dong +4 more
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Soft-Error-Resilient Static Random Access Memory with Enhanced Write Ability for Radiation Environments [PDF]
MicromachinesAs semiconductor technologies advance, SRAM cells deployed in space systems face heightened sensitivity to radiation-induced soft errors. In conventional 6T SRAM, when high-energy particles strike sensitive nodes, single-event upsets (SEUs) may occur ...
Se-Yeon Park, Eun Gyo Jeong, Sung-Hun Jo
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IEEE Access, 2019 This paper presents two novel quadruple cross-coupled memory cell designs, namely QCCM10T and QCCM12T, with protection against single event upsets (SEUs) and double-node upsets (DNUs).
Aibin Yan +6 more
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Low power and high-speed quadrate node upset tolerant latch design using CNTFET [PDF]
Scientific ReportsScalability, leakage, short-channel effects, and reliability problems are some of the difficulties facing the semiconductor industry as it continues to experience a reduction in size.
Shaik Asiya, Satheesh Kumar S
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Comparative Analysis of the Aeronautical Certification Process Against Nonionizing Radiation and the Management Proposal for Ionizing Radiation [PDF]
Journal of Aerospace Technology and Management, 2022 Today, the certification process for onboard electro-electronic systems against nonionizing radiation can be considered mature and independent, having its own set of requirements.
Marcelo Tadeu Ferreira +1 more
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Bootstrapped Driver and the Single-Event-Upset Effect [PDF]
IEEE Transactions on Circuits and Systems I: Regular Papers, 2020 As VLSI circuits are progressing in very Deep Submicron (DSM) regime without decreasing chip area, the importance of global interconnects increases but at the cost of performance and power consumption. This work proposes a low power circuit for driving a global interconnect at voltages close to the noise level. In order to address ultra-low power (ULP)
Mohammed Al-daloo +3 more
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A computational analysis on the role of low energy proton-induced single event upset in a 65 nm CMOS SRAM [PDF]
مجله علوم و فنون هستهای, 2020 This investigation is a computational analysis of a kind of radiation effect on electronic devices, known as the single event upset (SEU) with the Geant4 toolkit.
M. Soleimaninia,, G. Raisali, A. Moslehi
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Applied Sciences, 2022 Space Electrostatic Discharge Effect (SESD) and Single Event Effect (SEE) are two major space environmental factors that cause spacecraft failure. Previous studies have established that both can lead to soft errors such as upset of memory cells.
Xuan Wang +5 more
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Single Event Upset: An Embedded Tutorial [PDF]
21st International Conference on VLSI Design (VLSID 2008), 2008 With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation systems. Technology trends such as transistor down-sizing, use of new materials, and system on chip architectures continue to increase the sensitivity of systems to soft errors.
Fan Wang, Vishwani D. Agrawal
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, 2021 In Universe, there are innumeral activities that keep on happening and a lot of effects that are produced as outcomes. One such example is Single Event Upset. SEU is the error generated in the operation performed by a due to the strike between a single ionizing particle like electron, proton or neutron and a sensitive node in micro-electronic device ...
Jilani, Aavesh +2 more
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