Results 1 to 10 of about 260 (218)
Comparative Analysis of the Aeronautical Certification Process Against Nonionizing Radiation and the Management Proposal for Ionizing Radiation [PDF]
Journal of Aerospace Technology and Management, 2022 Today, the certification process for onboard electro-electronic systems against nonionizing radiation can be considered mature and independent, having its own set of requirements.
Marcelo Tadeu Ferreira +1 more
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Bootstrapped Driver and the Single-Event-Upset Effect [PDF]
IEEE Transactions on Circuits and Systems I: Regular Papers, 2020 As VLSI circuits are progressing in very Deep Submicron (DSM) regime without decreasing chip area, the importance of global interconnects increases but at the cost of performance and power consumption. This work proposes a low power circuit for driving a global interconnect at voltages close to the noise level. In order to address ultra-low power (ULP)
Mohammed Al-daloo +3 more
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A computational analysis on the role of low energy proton-induced single event upset in a 65 nm CMOS SRAM [PDF]
مجله علوم و فنون هستهای, 2020 This investigation is a computational analysis of a kind of radiation effect on electronic devices, known as the single event upset (SEU) with the Geant4 toolkit.
M. Soleimaninia,, G. Raisali, A. Moslehi
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Applied Sciences, 2022 Space Electrostatic Discharge Effect (SESD) and Single Event Effect (SEE) are two major space environmental factors that cause spacecraft failure. Previous studies have established that both can lead to soft errors such as upset of memory cells.
Xuan Wang +5 more
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Single Event Upset: An Embedded Tutorial [PDF]
21st International Conference on VLSI Design (VLSID 2008), 2008 With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation systems. Technology trends such as transistor down-sizing, use of new materials, and system on chip architectures continue to increase the sensitivity of systems to soft errors.
Fan Wang, Vishwani D. Agrawal
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, 2021 In Universe, there are innumeral activities that keep on happening and a lot of effects that are produced as outcomes. One such example is Single Event Upset. SEU is the error generated in the operation performed by a due to the strike between a single ionizing particle like electron, proton or neutron and a sensitive node in micro-electronic device ...
Jilani, Aavesh +2 more
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IEEE Access, 2022 In New Space, the need for reduced cost, higher performance, and more prompt delivery plans in radiation-harsh environments have motivated spacecraft designers to use Commercial-Off-The-Shelf (COTS) memories and emerging technology devices.
Golnaz Korkian +9 more
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Open Astronomy, 2023 The single event effect caused by space heavy ion radiation is one of the important factors affecting the safety and operation of spacecraft on orbit.
Zhang Binquan +10 more
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Efficacy of Transistor Interleaving in DICE Flip-Flops at a 22 nm FD SOI Technology Node
Applied Sciences, 2022 Fully Depleted Silicon on Insulator (FD SOI) technology nodes provide better resistance to single event upsets than comparable bulk technologies, but upsets are still likely to occur at nano-scale feature sizes, and additional hardening techniques should
Christopher J. Elash +6 more
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Single-Event Upsets in Microelectronics [PDF]
MRS Bulletin, 2003 AbstractThis article introduces the February 2003 issue of MRS Bulletin on “Single-Event Upsets (SEUs) in Microelectronics.” These radiation effects in devices and circuits have been recognized in recent years as a key reliability concern for many current and future silicon-based technologies.
Henry H.K. Tang, Nils Olsson
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