Results 31 to 40 of about 7,396,207 (304)
ABSTRACT Rates of cancer among adolescents and young adults (AYA), age 15–39 years, are increasing. Consequently, radiation oncologists are treating more AYAs who have diagnoses spanning both pediatric and adult practices. Compared to pediatric and older adult patients, AYAs face a unique set of challenges.
Hesham Elhalawani +7 more
wiley +1 more source
Dynamic Robust Single-Event Upset Simulator
This paper presents the dynamic robust single-event upset simulator, which is a novel framework for fault injection on hardware (via onchip debugging) and simulation testbeds (via the Simics® full-...
Edward Carlisle, Alan D. George
openaire +2 more sources
Neutron-induced single event upsets in static RAMS observed at 10 KM flight altitude
Observations of 14 neutron-induced single event upsets (SEUs) in static memory devices (SRAMs) at commercial aircraft flight altitudes are described. The observed SEU rate at a 10 km flight altitude based on an exposure of 160 standard 256 kb CMOS SRAMs ...
Olsen, J. +4 more
core +1 more source
Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells [PDF]
Floating gate cells in advanced NAND Flash memories, with single-level and multi-level cell architecture, were exposed to low-energy proton beams. The first experimental evidence of single event upsets by proton direct ionization in floating gate ...
Bagatin, Marta +9 more
core +1 more source
ABSTRACT Background Survivors of pediatric brain tumors (PBTs) can experience long‐term social difficulties, impacting quality of life. Beyond medical and environmental factors, family psychosocial risk may play a role in social outcomes by shaping the caregiving environment and may provide intervention options.
Renske H. Houben +4 more
wiley +1 more source
Design and Analysis of SEU Hardened Latch for Low Power and High Speed Applications
Due to the reduction in technology scaling, gate capacitance and charge storage in sensitive nodes are rapidly decreasing, making Complementary Metal Oxide Semiconductor (CMOS) circuits more sensitive to soft errors caused by radiation.
Satheesh Kumar S, Kumaravel S
doaj +1 more source
A Machine Learning Approach to Predicting Single Event Upsets
A single event upset (SEU) is a critical soft error that occurs in semiconductor devices on exposure to ionising particles from space environments. SEUs cause bit flips in the memory component of semiconductors. This creates a multitude of safety hazards as stored information becomes less reliable.
Archit Gupta +4 more
openaire +2 more sources
ABSTRACT Background Allogeneic hematopoietic stem cell transplantation (alloHSCT) is an essential therapy for several malignant and nonmalignant diseases, but relapse and graft loss remain the principal threats to its success. Routine monitoring of chimerism and minimal residual disease (MRD) enables early detection of imminent recurrence and guides ...
Carmen Junk +10 more
wiley +1 more source
Bit Upset of 25 nm NAND Flash Memory Induced by Heavy Ion Irradiation
In order to investigate the influence of heavy ion fluence on single event upsets (SEU) and the SEU cross-section in NAND Flash memory, as well as the multiple-cell upsets (MCU) due to heavy ion irradiation, experimental studies were performed on two ...
SHENG Jiangkun1,2;XU Peng1,*;QIU Mengtong2;DING Lili2;LUO Yinhong2;YAO Zhibin2;ZHANG Fengqi2;GOU Shilong2;WANG Zujun2
doaj +1 more source
Evaluation of Single Event Upset on a Relay Protection Device
Traditionally, studies have primarily focused on single event effects in aerospace electronics. However, current research has confirmed that atmospheric neutrons can also induce single event effects in China’s advanced technology relay protection ...
Hao Yu +6 more
core +1 more source

