Results 41 to 50 of about 260 (218)
FEATURES OF FAULT TOLERANCE TESTING FOR SPACE-GRADE TRANSCEIVERS ON A PULSED ION ACCELERATOR
The paper evaluates the feasibility of using pulsed ion sources to assess the fault tolerance of transceivers exposed to heavy charged particles. It reviews the types of interface integrated circuits (ICs) used in spacecraft for communication within a ...
Dmitry V. Bobrovsky +6 more
doaj +1 more source
Single Event Upsets in NMOS Microprocessors
Three advanced 16-bit NMOS microprocessors have been observed to suffer single event upset at a rate varying between one upset for every 8 × 1010 to one for every 2 × 1012 n/cm2-upset for cyclotron-produced neutrons with an average energy of 14 MeV. These rates are expected to vary, probably upward, with different types of programs.
Guenzer, C. S. +2 more
openaire +1 more source
An [Imperfect] Case for Dyadic Research in Pediatric Psychosocial Oncology
Pediatric Blood &Cancer, EarlyView.
Stephanie M. Nanos +2 more
wiley +1 more source
ABSTRACT Background Adolescents with haematological malignancies face significant emotional and relational challenges, often accompanied by difficulties in communicating their needs within the healthcare context. To address these issues, a narrative‐based psycho‐educational intervention based on the creation and prescription of Ironic Medications was ...
Marta Stoppa +7 more
wiley +1 more source
Multiple-Cell Upset Mechanisms in a Submicron SRAM
On-orbit systems operate in harsh radiation environments; as a consequence, radiation induced single-event upsets (SEUs) may interrupt the scheduled operations of microelectronics.
Stefania Esquer +4 more
doaj +1 more source
ABSTRACT Results of COG ANBL1221 changed treatment paradigms for patients with relapsed/refractory neuroblastoma. Chemoimmunotherapy with irinotecan/temozolomide/dinutuximab is now used as both bridge therapy following suboptimal response to induction and as treatment in first relapse.
Elizabeth Sokol +6 more
wiley +1 more source
Overview of software tools for modeling single event upsets in microelectronic devices
The paper presents the results of the analysis of existing simulation tools for evaluation of single event upset susceptibility of microelectronic devices with deep sub-micron feature sizes. This simulation tools are meant to replace obsolete approach to
Anatoly Alexandrovich Smolin
doaj
The development of the technological process in electronics has led to the problem of single event upsets (SEU) in microchips when exposed to neutrons causing loss of information and errors.
Dmitry O. Titovets +4 more
doaj +1 more source
ABSTRACT Background Medication nonadherence during the first 100 days after pediatric hematopoietic stem cell transplantation (HSCT) and during oncology treatment increases risk for complications. BMT4me is a caregiver‐facing mobile health (mHealth) application providing medication reminders, symptom tracking, and note‐taking features to support ...
Micah A. Skeens +4 more
wiley +1 more source
A Radiation-Hardened Low-Power SRAM with Enhanced Write Capability for Space Applications
With continued scaling of CMOS technology, the critical charge required for state retention in SRAM cells has decreased, leading to increased vulnerability to radiation-induced soft errors such as single-event upsets (SEUs) and single-event multi-node ...
Sang-Jin Kim, Sung-Hun Jo
doaj +1 more source

