Results 51 to 60 of about 7,396,207 (304)
FPGAs are currently being used in many applications due to their flexibility and re-programmability. Some of these applications operate in harsh environments. One such environment is space.
Manar N. Shaker +3 more
doaj +1 more source
Single event upsets calculated from new ENDF/B-VI proton and neutron data up to 150 MeV [PDF]
Single-event upsets (SEU) in microelectronics are calculated from newly-developed silicon nuclear reaction recoil data that extend up to 150 MeV, for incident protons and neutrons.
Chadwick, M. B., Normand, E.
core
ABSTRACT Pediatric refractory immune thrombocytopenia (rITP) is generally characterized by persistent thrombocytopenia and failure to achieve a sustained response to multiple standard therapies. We report a 4‐year‐old female with congenital tufting enteropathy, post‐intestinal transplant patient on immunosuppressants, who developed severe rITP ...
Sarah Hsieh +4 more
wiley +1 more source
ABSTRACT Background Graft‐versus‐host disease (GvHD) remains one of the most significant complications of hematopoietic stem cell transplantation (HSCT). Abatacept, a selective T‐cell costimulation modulator, is a relatively novel prophylactic agent, though pediatric data remain limited.
Matthijs D. Kruizinga +3 more
wiley +1 more source
ABSTRACT The medical burdens of sickle cell disease (SCD) and transfusion‐dependent β‐thalassemia (TDT) are chronic and cumulative, even in children. Yet the effects expand beyond medications and healthcare visits due to their impacts on school attendance, academic performance, and peer engagement.
Mary Ann Etling +2 more
wiley +1 more source
FEATURES OF FAULT TOLERANCE TESTING FOR SPACE-GRADE TRANSCEIVERS ON A PULSED ION ACCELERATOR
The paper evaluates the feasibility of using pulsed ion sources to assess the fault tolerance of transceivers exposed to heavy charged particles. It reviews the types of interface integrated circuits (ICs) used in spacecraft for communication within a ...
Dmitry V. Bobrovsky +6 more
doaj +1 more source
Single Event Upsets in NMOS Microprocessors
Three advanced 16-bit NMOS microprocessors have been observed to suffer single event upset at a rate varying between one upset for every 8 × 1010 to one for every 2 × 1012 n/cm2-upset for cyclotron-produced neutrons with an average energy of 14 MeV. These rates are expected to vary, probably upward, with different types of programs.
Guenzer, C. S. +2 more
openaire +1 more source
Single Event Upsets in SRAM FPGA based readout electronics for the Time Projection Chamber in the ALICE experiment [PDF]
Single Event Upsets in SRAM FPGA based readout electronics for the Time Projection Chamber in the ALICE experiment irradiation test results have been used to predict the single event upset rate expected during operation in the ALICE experiment.
Røed, K, Røed, Ketil
core
ABSTRACT Background Heavy menstrual bleeding (HMB) is a common condition among adolescents and young adults (AYAs) and is the leading cause of iron deficiency anemia (IDA) in this population. Growing evidence suggests that social determinants of health (SDOH) influence menstrual bleeding patterns, access to care, and treatment. However, no studies have
Maria Carter‐Febres +6 more
wiley +1 more source
Multiple-Cell Upset Mechanisms in a Submicron SRAM
On-orbit systems operate in harsh radiation environments; as a consequence, radiation induced single-event upsets (SEUs) may interrupt the scheduled operations of microelectronics.
Stefania Esquer +4 more
doaj +1 more source

