Results 71 to 80 of about 7,396,207 (304)

Single-Event-Transient Resilient Memory for DSP in Space Applications

, 2018
We present a radiation-hardened-by-design (RHBD) memory design that mitigates Single-Event-Transients (SETs), Single-Event-Upsets (SEUs) and Dual-Event-Upsets (DEUs), hence significantly enhancing the reliability of digital signal processors (DSPs) for ...
Lin, Tong, Chong, Kwen-Siong, Tong Lin, Chang, Joseph S., Ne Kyaw Zwa Lwin, Wei Shu, Sivaramakrishnan, H., H. Sivaramakrishnan, Joseph S. Chang, Lwin, Ne Kyaw Zwa, Shu, Wei, Kwen-Siong Chong   +11 more
core   +1 more source

Investigating transcription factor dynamics in health and disease using FRAP

FEBS Letters, EarlyView.
FRAP analysis of GFP‐tagged transcription factors reveals how molecular mobility and target engagement change in response to drug treatment. By combining live‐cell imaging, quantitative model fitting, and statistical analysis, this approach uncovers transcription factor dynamics linked to disease mechanisms, providing a powerful framework for ...
Kannan Govindaraj, Carolina Vazquez Garzon, Jose Joaquin Velasco, Janine N. Post   +3 more
wiley   +1 more source

Structure‐forward targeting of claudins with synthetic binders

FEBS Letters, EarlyView.
Claudins form the paracellular barriers between epithelial and endothelial tissues at tight junctions and are targets for molecular binders with the goal of modulating barrier permeability. Claudin‐binding molecules are relevant in drug delivery or in altering claudin interactions with disease‐causing proteins.
Alex J. Vecchio
wiley   +1 more source

Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature

Sensors, 2018
This paper review presents Single Event Effects (SEE) irradiation tests under heavy ions of the test-chip of D-Flip-Flop (DFF) cells and complete readout integrated circuits (ROIC) as a function of temperature, down to 50 K.
Laurent Artola, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, Christian Poivrey   +9 more
doaj   +1 more source

System effects of single event upsets [PDF]

7th Computers in Aerospace Conference, 1989
Single Event Upsets (SEUs) pose a serious threat to computer reliability and longevity. SEU effects are found at sea level, in airborne avionics, and in space. At the system level, SEUs in processors are controlled by replication and voting, watchdog processors, and tagged data schemes.
openaire   +1 more source

Heavy Ion Single Event Effects in CMOS Image Sensors: SET and SEU

, 2023
High-energy particles in space often induce single event effects in CMOS image sensors, resulting in performance degradation and functional failure. This paper focuses on the formation and morphology of transient bright spots in CMOS image sensors and ...
Zhikang Yang, Jie Feng, Lin Wen, Bingkai Liu, Zitao Zhao, Qi Guo, Yudong Li, Dong Zhou   +7 more
core   +1 more source

Engineering peptides into antibodies—opportunities and strategies for therapeutic innovation

FEBS Letters, EarlyView.
Peptides and antibodies occupy complementary therapeutic niches. Peptides recognize difficult targets in a compact format, while antibodies add specificity, long half‐life, and effector functions. This review examines strategies that merge both modalities—peptide grafting into loops, terminal and Fc fusions, and bioconjugation—highlighting how ...
Jinling Wang, Ruslana Romaniuk, Hristo L. Svilenov   +2 more
wiley   +1 more source

Reliability of LEON3 Processor’s Program Counter Against SEU, MBU, and SET Fault Injection

Cryptography
This paper presents a comprehensive register transfer-level (RTL) fault injection study targeting the program counter (PC) of the LEON3 processor, a SPARC V8-compliant core widely used in safety-critical and radiation-prone embedded applications.
Afef Kchaou, Sehmi Saad, Hatem Garrab, Mohsen Machhout   +3 more
doaj   +1 more source

Single Event Effect Testing of the Micron MT46V128M8 [PDF]

, 2017
The Micron MT46V128M8 was tested for single event effects (SEE) at the Texas AM University Cyclotron Facility (TAMU) in June of 2017. Testing revealed a sensitivity to device hang-ups classified as single event functional interrupts (SEFI) and possible ...
Seidleck, Christina, Campola, Michael, Stansberry, Scott, Phan, Anthony, Wilcox, Ted   +4 more
core  

The microbiome in human skin aging

FEBS Letters, EarlyView.
Age‐related skin changes encompass the well‐known visible phenotypic alterations, together with microbiome dysbiosis and a series of molecular aging hallmarks. These hallmarks characterize not only a fully stablished aged phenotype but also the skin aging process itself.
Manuel Huerta Arana, Cornelia Wiegand, Omid Omrani, Mario Fabri   +3 more
wiley   +1 more source