Results 31 to 40 of about 807,634 (264)

Single event effects in the pixel readout chip for BTeV [PDF]

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2003
15 pages, 6 Postscript ...
Chiodini, G., Appel, J. A., Cardoso, G., Christian, D. C., Coluccia, M. R., Hoff, J., Kwan, S. W., Mekkaoui, A., Yarema, R., Zimmermann, S.   +9 more
openaire   +2 more sources

Carcinomas and Carcinoid Tumors of the Lungs and Bronchi in Children and Adolescents: The EXPeRT Recommendations

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Primary lung carcinomas and bronchial carcinoid tumors (BC) are very rare malignancies in childhood. While typical BC and mucoepidermoid carcinomas are mostly low‐grade, localized tumors with a more favorable prognosis than in adults, necessitating avoidance of overtreatment, adenocarcinomas of the lung are often diagnosed at advanced disease ...
Michael Abele, Calogero Virgone, Michaela Kuhlen, Sabine Irtan, Yves Reguerre, Malgorzata Krawczyk, Ewa Bien, Tal Ben‐Ami, Maja Cesen, Ricardo Lopez‐Almaraz, Andrea Ferrari, Gianni Bisogno, Dominik T. Schneider, Abbas Agaimy, Constantin Lapa, Hubert Ducou le Pointe, Rainer Claus, Catherine Daniel, Ines B. Brecht, Daniel Orbach   +19 more
wiley   +1 more source

Efficient error rate estimation for single event effects considering statistical uncertainty

Nihon Kikai Gakkai ronbunshu, 2019
This study proposes the efficient error rate estimation method for Single Event Effects (SEE) considering statistical uncertainty. SEE is known to make significant damage to a semiconductor device used for a spacecraft on orbit by exposed to cosmic rays ...
Kisumi IIDA, Nozomu KOGISO
doaj   +1 more source

Mutual interference induced by single event effects in CMOS circuits

AIP Advances, 2020
Single event effect (SEE) induced mutual interference in CMOS circuits, including single event (SE) induced coupling effects (crosstalk) and modulation in local supply voltage on power-supply rails, was studied based on the increase in metal interconnect
Lili Ding, Wei Chen, Tan Wang, Fengqi Zhang, Yinhong Luo, Guo-Qing Yang   +5 more
doaj   +1 more source

System effects of single event upsets [PDF]

7th Computers in Aerospace Conference, 1989
Single Event Upsets (SEUs) pose a serious threat to computer reliability and longevity. SEU effects are found at sea level, in airborne avionics, and in space. At the system level, SEUs in processors are controlled by replication and voting, watchdog processors, and tagged data schemes.
openaire   +1 more source

European Standard Clinical Practice Guideline and EXPeRT Recommendations for the Diagnosis and Management of Gastroenteropancreatic Neuroendocrine Neoplasms in Children and Adolescents

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Pediatric gastroenteropancreatic neuroendocrine neoplasms (GEP‐NENs) are extremely rare and clinically heterogeneous. Management has largely been extrapolated from adult practice. This European Standard Clinical Practice Guideline (ESCP), developed by the EXPeRT network in collaboration with adult NEN experts, provides (adult) evidence ...
Michaela Kuhlen, Calogero Virgone, Antje Redlich, Michael Abele, Ricardo Lopez‐Almaraz, Tal Ben‐Ami, Ewa Bien, Gianni Bisogno, Maja Mazic Cesen, Andrea Ferrari, Malgorzata A. Krawczyk, Yves Reguerre, Dominik T. Schneider, Ines B. Brecht, Charlotte Rigaud, Bilgehan Yalcin, Rainer Claus, Christian Vokuhl, Constantin Lapa, Jörg Fuchs, Segolene Hescot, Thomas Walter, Julien Hadoux, Daniel Orbach   +23 more
wiley   +1 more source

Failure Estimates for SiC Power MOSFETs in Space Electronics

Aerospace, 2018
Silicon carbide (SiC) power metal-oxide-semiconductor field effect transistors (MOSFETs) are space-ready in terms of typical reliability measures. However, single event burnout (SEB) due to heavy-ion irradiation often occurs at voltages 50% or lower than
Kenneth F. Galloway, Arthur F. Witulski, Ronald D. Schrimpf, Andrew L. Sternberg, Dennis R. Ball, Arto Javanainen, Robert A. Reed, Brian D. Sierawski, Jean-Marie Lauenstein   +8 more
doaj   +1 more source

Heavy Ion Induced Single Event Effects Characterization on an RF-Agile Transceiver for Flexible Multi-Band Radio Systems in NewSpace Avionics

Aerospace, 2020
Nowadays, technologies have a massive impact on the design of avionic systems, even for the conservative space industry. In this paper, the single event effect (SEE) characterization of a highly integrated and radio frequency (RF) agile transceiver is ...
Jan Budroweit, Mattis Jaksch, Rubén Garcia Alía, Andrea Coronetti, Alexander Kölpin   +4 more
doaj   +1 more source

Health‐Related Quality of Life and Symptom Severity Among Patients With PIK3CA‐Related Overgrowth Spectrum: A Mixed‐Methods Study to Understand Real‐World Experience With Alpelisib Treatment

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background PIK3CA‐related overgrowth spectrum (PROS) includes several rare overgrowth disorders resulting from somatic gain‐of‐function mutations in PIK3CA. Despite treatment advances, including the recent approval of alpelisib for PROS in the United States, literature detailing the patient experience with PROS is limited.
Vamsi Bollu, Kaitlin LaGasse, Cory D. Saucier, Kimberly Raymond, Miranda Lauher‐Charest, Lauren Crowder, Beilei Cai, Mary Lisha Paul, Denise Adams   +8 more
wiley   +1 more source

Atmospheric neutron single-event burnout in Vertical Double-diffused Metal-Oxide-Semiconductor (VDMOS) devices

Nuclear Engineering and Technology
This study investigates the single-event burnout (SEB) mechanisms of 800 V Vertical Double-Diffusion Metal-Oxide-Semiconductor (VDMOS) devices using the China Spallation Neutron Source (CSNS) Atmospheric Neutron Irradiation Spectrometer.
Xirui Zhou, Yuanyuan Zhang, Pei Li, Hao Yu, Chaohui He, Yuwei Guo, Haojie Bai   +6 more
doaj   +1 more source