Results 41 to 50 of about 18,085,785 (304)

Lateral 1200V SiC schottky barrier diode with single event burnout tolerance

open access: yesPower Electronic Devices and Components
For a power device to be used in space, it must be able to recover from a single event effect caused by heavy ion radiation. Conventional vertical silicon carbide (SiC) power devices such as automotive diodes and MOSFETs, can only meet this requirement ...
Yunyi Qi   +5 more
doaj   +1 more source

Layout-oriented simulation of on-destructive single event effects in CMOS IC blocks

open access: yes, 2009
This paper presents a tool based on a two dimensional charge-collection simulation to study non-destructive single event effects in CMOS IC blocks. The interaction between the radiation particle and the p-n junctions is modeled at circuit level with a ...
Cristiano Calligaro   +7 more
core   +1 more source

Retrospective Analysis of Donor Lymphocyte Infusions in Pediatric Patients With Mixed Chimerism After Hematopoietic Stem Cell Transplantation

open access: yesPediatric Blood &Cancer, EarlyView.
ABSTRACT Background Allogeneic hematopoietic stem cell transplantation (alloHSCT) is an essential therapy for several malignant and nonmalignant diseases, but relapse and graft loss remain the principal threats to its success. Routine monitoring of chimerism and minimal residual disease (MRD) enables early detection of imminent recurrence and guides ...
Carmen Junk   +10 more
wiley   +1 more source

Single event effects radiation testing requirements: a minimax approach

open access: yesБезопасность информационных технологий
One of the key challenges of single-event effects (SEE) testing of integrated circuits (ICs) and semiconductor devices is determining the "test requirements". This refers to the level of exposure at the test facility that allows for conclusions about the
Armen V. Sogoyan   +5 more
doaj   +1 more source

Single Event Effects in 90-nm Phase Change Memories

open access: yes, 2011
Single event effects are investigated in 90-nm phase change memories. The cells are shown to be insensitive to heavy-ion strikes and will likely remain so for a few more generations.
V. Ferlet Cavrois   +11 more
core   +1 more source

Pediatric Idiopathic Multicentric Castleman Disease Is Often Severe But Responsive to Siltuximab

open access: yesPediatric Blood &Cancer, EarlyView.
ABSTRACT Background Idiopathic multicentric Castleman disease (iMCD) is a potentially fatal immunologic disorder marked by widespread lymphadenopathy and inflammation. Siltuximab, an interleukin‐6 (IL‐6) inhibitor, is the only FDA‐approved treatment for adult patients with iMCD.
Bridget Austin   +17 more
wiley   +1 more source

The Impact of the COVID‐19 Pandemic on Childhood Cancer Survival: A Population‐Based Assessment of Survival Patterns Between 2015 and 2023 in Germany

open access: yesPediatric Blood &Cancer, EarlyView.
ABSTRACT Background Numerous international studies have reported declines in new cancer diagnoses, delayed diagnoses and disruptions in cancer treatment following the implementation of COVID‐19 pandemic public health measures, raising concerns that these effects may ultimately contribute to increased cancer mortality.
Friederike Erdmann   +8 more
wiley   +1 more source

Referral Patterns and Diagnostic Timeliness in Pediatric Cancer: A Hospital‐Based Study in Indonesia

open access: yesPediatric Blood &Cancer, EarlyView.
ABSTRACT Background Timely diagnosis and treatment are critical for improving survival among children with cancer. In low‐ and middle‐income countries (LMICs), delays are common and may be influenced by fragmented referral pathways and diagnostic limitations.
Nur Melani Sari   +5 more
wiley   +1 more source

Single event effects in the pixel readout chip for BTeV [PDF]

open access: yesNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2003
15 pages, 6 Postscript ...
Chiodini, G.   +9 more
openaire   +2 more sources

Test report for single event effects of the 80386DX microprocessor [PDF]

open access: yes, 1993
The Jet Propulsion Laboratory Section 514 Single Event Effects (SEE) Testing and Analysis Group has performed a series of SEE tests of certain strategic registers of Intel's 80386DX CHMOS 4 microprocessor.
Nichols, Donald K.   +2 more
core  

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