Results 61 to 70 of about 811,175 (264)

Investigation on α-particle-induced single event effects in AlGaN/GaN HEMTs: Bias, strike location, and trap effects [PDF]

AIP Advances
This study first detailed simulation-based α-particle-induced effects in AlGaN/gallium nitride (GaN) high electron mobility transistors (HEMTs), with a specific focus on the correlation between gate/drain transient currents and trap behaviors.
Soomin Kim, Hanggyo Jung, Jong-Min Lee, Jong Yul Park, Junhyung Jeong, Dong-Min Kang, Jongwook Jeon   +6 more
doaj   +1 more source

Re‐Irradiation in Pediatric Diffuse Midline Glioma: A Multi‐Institutional Retrospective Study

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background Children with recurrent diffuse midline gliomas (DMGs) have limited therapeutic options at recurrence. Re‐irradiation (RT2) may be used at progression, but with uncertainty about the benefit. Methods We conducted a multi‐institutional retrospective study of children aged < 18 with DMG treated at three centers (Toronto, Canada ...
Ajay Thomas Alex, Sean P. Hassan, Helen Benghiat, Liam Herbert, Jennifer Adamski, Shivani Bailey, Claire Esler, Louise Brookes, Molly Bamber, Grace Koudou, Karen Waite, Julie Bennett, Anirban Das, Derek S. Tsang   +13 more
wiley   +1 more source

Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-Trees (TDFTs)

IEEE Access, 2019
Fault tree (FT) is a standardized notation for representing relationships between a system's reliability and the faults and/or the events associated with it.
Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed, Yvon Savaria   +3 more
doaj   +1 more source

Extreme Atmospheric Radiation Environments and Single Event Effects

IEEE Transactions on Nuclear Science, 2018
Data from ground-level radiation monitors and cosmogenic nuclides are combined to give a probability distribution for severe radiation events related to the well quantified event of February 23, 1956. Particle fluxes, single event effects rates, and dose rates are calculated for ground level and aerospace systems.
Clive Dyer, Alex Hands, Keith Ryden, Fan Lei   +3 more
openaire   +4 more sources

Association Between Dinutuximab Beta Exposure and Post‐End‐of‐Treatment Survival in Neuroblastoma: A Weighted Patient‐Level Analysis of Three Clinical Studies

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Objectives The association between exposure to dinutuximab beta (DB) and event‐free survival (EFS) or overall survival (OS) of neuroblastoma patients was assessed using data collected during three clinical trials (five cohorts). Methods A systematic review (March 2026) was conducted to identify relevant studies (prospective; registered DB ...
Przemysław Holko, Holger N. Lode, Alberto Garaventa, Carla Manzitti, Roberto Luksch, Dominique Valteau‐Couanet, Marion Gambart, John Anderson, Juliet Gray, Adela Canete, Lucas Moreno, Aleksandra Wieczorek, Cormac Owens, Shifra Ash, Isaac Yaniv, Genevieve Laureys, Hans Loibner, Katarzyna Śladowska, Ruth Ladenstein, Paweł Kawalec   +19 more
wiley   +1 more source

Long‐Term Outcomes of Patients With Relapsed/Refractory Neuroblastoma Treated on ANBL1221: A Report From the Children's Oncology Group

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Results of COG ANBL1221 changed treatment paradigms for patients with relapsed/refractory neuroblastoma. Chemoimmunotherapy with irinotecan/temozolomide/dinutuximab is now used as both bridge therapy following suboptimal response to induction and as treatment in first relapse.
Elizabeth Sokol, Arlene Naranjo, Lulu Chen, Rajen Mody, Steven G. DuBois, Rochelle Bagatell, Navin Pinto   +6 more
wiley   +1 more source

SINGLE EVENT EFFECTS RADIATION TESTING REQUIREMENTS: A BAYESIN AN APPROACH

Безопасность информационных технологий
A key aspect of the safe operation of computing systems in environments with exposure to ionizing particles (such as ions, protons, and neutrons) is single-event effects (SEE) hardness assurance. Statistically reliable determination of the probability of
Armen V. Sogoyan, Anatoly A. Smolin, Anastasia V. Ulanova, Alexander I. Chumakov, Andrey V. Yanenko, Dmitry V. Boychenko   +5 more
doaj   +1 more source

Pulsed-laser single-event effects study of AlN Schottky barrier diodes [PDF]

APL Electronic Devices
Aluminum nitride (AlN) is an ultrawide-bandgap semiconductor with potential for radiation-hardened devices in extreme environments. This study investigates single-event effects in AlN Schottky barrier diodes (SBDs) using a pulsed-laser single-event ...
Ani Khachatrian, Hsiao-Hsuan Wan, Fan Ren, Stephen Pearton, Aman Haque, Ching-Heng Shiau, Dongmei Cao, Madani Labed, You Seung Rim   +8 more
doaj   +1 more source

BMT4me En Español: Multisite Feasibility and Usability Testing of a Spanish‐Language mHealth Adherence Support App for Spanish‐Speaking Caregivers of Children After Hematopoietic Stem Cell Transplantation and Cancer Treatment

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background Medication nonadherence during the first 100 days after pediatric hematopoietic stem cell transplantation (HSCT) and during oncology treatment increases risk for complications. BMT4me is a caregiver‐facing mobile health (mHealth) application providing medication reminders, symptom tracking, and note‐taking features to support ...
Micah A. Skeens, Madeline R. Peek, Bianca Franklin, Emre Sezgin, Melissa Beauchemin   +4 more
wiley   +1 more source

Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts

Chips
Radiation effects on electronic devices represent a major concern in applications for harsh environments, such as aerospace and nuclear facilities. This article presents a review of fundamental aspects of radiation effects on semiconductors, with a ...
Vitor A. P. Aguiar, Saulo G. Alberton, Matheus S. Pereira   +2 more
doaj   +1 more source