Results 81 to 90 of about 2,968,943 (344)

GR@PPA 2.8: initial-state jet matching for weak boson production processes at hadron collisions

, 2012
The initial-state jet matching method introduced in our previous studies has been applied to the event generation of single $W$ and $Z$ production processes and diboson ($W^{+}W^{-}$, $WZ$ and $ZZ$) production processes at hadron collisions in the ...
Abazov, Abbott, Affolder, Alioli, Altarelli, Antcheva, Bengtsson, Boos, Catani, Corcella, Corcella, Dokshitzer, Frixione, Frixione, Gleisberg, Gribov, Kato, Kawabata, Kawabata, Kurihara, Lai, Mangano, Miu, Nason, Odaka, Odaka, Pumplin, Seymour, Sherstnev, Shigeru Odaka, Sjostrand, Sjostrand, Tsuno, Tsuno, Whalley, Yoshimasa Kurihara, Yuasa   +36 more
core   +1 more source

Introduction to Single-Event Effects

AbstractRadiation effects in state-of-the-art electronics has become a critical concern that goes beyond the traditional systems operating in harsh environments such as in aviation and space missions. Therefore, there is an increased interest in studying these effects as well as in investigating on how to design reliable and fault-tolerant systems that
Ygor Quadros de Aguiar, Frédéric Wrobel, Jean-Luc Autran, Rubén García Alía   +3 more
openaire   +1 more source

Germline TP53 Mutations Causing Diamond–Blackfan Anemia: A French Report

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Diamond–Blackfan anemia is a rare congenital erythroblastopenia typically caused by mutations in ribosomal protein genes. Recently, gain‐of‐function mutations in TP53 have been identified as a novel cause of Diamond–Blackfan anemia. We report two French patients who both harbored a heterozygous TP53 deletion (NM_000546.5: c.1077delA; p ...
Rafael Moisan, Lydie Da Costa, Ludivine David Nguyen, Heloise Chosseler, Audrey Riquet, Benedicte Bruno, Melissa Barbati   +6 more
wiley   +1 more source

Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-Trees (TDFTs)

IEEE Access, 2019
Fault tree (FT) is a standardized notation for representing relationships between a system's reliability and the faults and/or the events associated with it.
Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed, Yvon Savaria   +3 more
doaj   +1 more source

Effects of space radiation on electronic microcircuits [PDF]

The single event effects or phenomena (SEP), which so far have been observed as events falling on one or another of the SE classes: Single Event Upset (SEU), Single Event Latchup (SEL) and Single Event Burnout (SEB), are examined.
Kolasinski, W. A.
core   +1 more source

Long-Baseline Study of the Leading Neutrino Oscillation at a Neutrino Factory [PDF]

, 1999
Within the framework of three-flavor neutrino oscillations, we consider the physics potential of \nu_e --> \nu_\mu appearance and \nu_\mu --> \nu_\mu survival measurements at a neutrino factory for a leading oscillation scale \delta m^2 ~ 3.5 \times 10^{-
A. De Rujula, B.T. Cleveland, C. Ankenbrandt, C. Athanassopoulos, C. Athanassopoulos, E. Akhmedov, E. Akhmedov, E.K. Akhmedov, G.L. Fogli, H. Minakata, H. Minakata, H.W. Zaglauer, J. Arafune, J. Arafune, J. Pantaleone, J. Pantaleone, J.G. Learned, J.N. Abdurashitov, J.N. Bahcall, J.N. Bahcall, J.N. Bahcall, K. Hidaka, K. Whisnant, K.S. Hirata, L. Wolfenstein, M. Ambrosio, M. Apollonio, M. Koike, M. Tanimoto, M.C. Gonzalez-Garcia, N. Hata, O.L.G. Peres, P. Langacker, P. Lipari, P. Lipari and, P.I. Krastev, Q. Liu, R. Barbieri, R. Becker-Szendy, R. Bernstein, R. Forty, R. Gandhi, R. Raja, S. Geer, S. Geer, S. Geer, S. Geer, S.P. Mikheyev, S.T. Petcov, S.T. Petcov, V. Barger, V. Barger, V. Barger, V. Barger, V. Barger, V. Barger, W. Hampel, W.W.M. Allison, Y. Fukuda, Y. Fukuda, Y. Fukuda, Y. Fukuda, Y. Fukuda, Y. Fukuda, Y. Fukuda, Y. Fukuda, Z. Maki   +66 more
core   +4 more sources

Collection of charge in NMOS from single event effect

IEICE Electronics Express, 2016
In aerospace environment, single event effect (SEE) will occur and single event transient (SET) current pulse will be induced in drain/source region of Metal Oxide Semiconductor Field Effect Transistor (MOSFET) when high energy ion strikes semiconductor devices.
Jingqiu Wang, Fujiang Lin, Donglin Wang, Wenna Song, Li Liu, Qiwei Song, Liang Chen   +6 more
openaire   +2 more sources

Health‐Related Quality of Life and Symptom Severity Among Patients With PIK3CA‐Related Overgrowth Spectrum: A Mixed‐Methods Study to Understand Real‐World Experience With Alpelisib Treatment

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background PIK3CA‐related overgrowth spectrum (PROS) includes several rare overgrowth disorders resulting from somatic gain‐of‐function mutations in PIK3CA. Despite treatment advances, including the recent approval of alpelisib for PROS in the United States, literature detailing the patient experience with PROS is limited.
Vamsi Bollu, Kaitlin LaGasse, Cory D. Saucier, Kimberly Raymond, Miranda Lauher‐Charest, Lauren Crowder, Beilei Cai, Mary Lisha Paul, Denise Adams   +8 more
wiley   +1 more source

AniMAIRE‐A New Openly Available Tool for Calculating Atmospheric Ionising Radiation Dose Rates and Single Event Effects During Anisotropic Conditions

Space Weather
AniMAIRE (Anisotropic Model for Atmospheric Ionising Radiation Effects) is a new model and Python toolkit for calculating radiation dose rates experienced by aircraft during anisotropic solar energetic particle events. AniMAIRE expands the physics of the
C. S. W. Davis, F. Baird, F. Lei, K. Ryden, C. Dyer   +4 more
doaj   +1 more source

Parameter space metric for 3.5 post-Newtonian gravitational-waves from compact binary inspirals

, 2013
We derive the metric on the parameter space of 3.5 post-Newtonian (3.5PN) stationary phase compact binary inspiral waveforms for a single detector, neglecting spin, eccentricity, and finite-body effects.
Keppel, Drew, Lundgren, Andrew P., Owen, Benjamin J., Zhu, Hanyuan   +3 more
core   +1 more source