Results 81 to 90 of about 18,085,785 (304)

Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA [PDF]

, 2015
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics.
O'Bryan, Martha V., Campola, Michael J., Casey, Megan C., Ladbury, Raymond L., Lauenstein, Jean-Marie, Berg, Melanie D., Pellish, Jonathan A., LaBel, Kenneth A., Chen, Dakai   +8 more
core   +2 more sources

Representation of Sickle Cell Disease Patients in Pediatric and Adult Care: What We Discovered Using Informatics for Integrating Biology and the Bedside (i2b2) Data

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Transitioning from pediatric to adult care is a high‐risk period for individuals with sickle cell disease (SCD). An initial observation at one academic medical center suggested a sex‐based disparity in clinic populations, prompting a national investigation.
Laurie J. Duckworth, Kholod Alhassan, Ada De La Osa, John Stephen, Yue Yao, Diana J. Wilkie   +5 more
wiley   +1 more source

SINGLE EVENT EFFECTS RADIATION TESTING REQUIREMENTS: A BAYESIN AN APPROACH

Безопасность информационных технологий
A key aspect of the safe operation of computing systems in environments with exposure to ionizing particles (such as ions, protons, and neutrons) is single-event effects (SEE) hardness assurance. Statistically reliable determination of the probability of
Armen V. Sogoyan, Anatoly A. Smolin, Anastasia V. Ulanova, Alexander I. Chumakov, Andrey V. Yanenko, Dmitry V. Boychenko   +5 more
doaj   +1 more source

Pulsed-laser single-event effects study of AlN Schottky barrier diodes [PDF]

APL Electronic Devices
Aluminum nitride (AlN) is an ultrawide-bandgap semiconductor with potential for radiation-hardened devices in extreme environments. This study investigates single-event effects in AlN Schottky barrier diodes (SBDs) using a pulsed-laser single-event ...
Ani Khachatrian, Hsiao-Hsuan Wan, Fan Ren, Stephen Pearton, Aman Haque, Ching-Heng Shiau, Dongmei Cao, Madani Labed, You Seung Rim   +8 more
doaj   +1 more source

Lorlatinib‐Containing Therapy for MYCN‐Amplified, ALK‐Mutated Neuroblastoma With Bulky Leptomeningeal Relapse: A Case Report

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Central nervous system (CNS) relapse of neuroblastoma carries a poor prognosis, and craniospinal irradiation (CSI) poses substantial long‐term toxicity in young children. We report a toddler with MYCN‐amplified neuroblastoma harboring somatic ALK R1275Q who developed extensive leptomeningeal relapse with paraplegia.
Jinwoo Kim, Minji Kim, Nani Jung, Sung Eun Kim, Ji Yoon Kim, Mi Ae Chu, Jung Eun Kwon, Yeo Hyang Kim, So Mi Lee, Ki‐Su Park, Jeong Eun Lee, Ye Jee Shim   +11 more
wiley   +1 more source

Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts

Chips
Radiation effects on electronic devices represent a major concern in applications for harsh environments, such as aerospace and nuclear facilities. This article presents a review of fundamental aspects of radiation effects on semiconductors, with a ...
Vitor A. P. Aguiar, Saulo G. Alberton, Matheus S. Pereira   +2 more
doaj   +1 more source

Uncovering Inequities: The Role of Social Determinants of Health in Hospitalized Adolescents and Young Adults With Heavy Menstrual Bleeding

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background Heavy menstrual bleeding (HMB) is a common condition among adolescents and young adults (AYAs) and is the leading cause of iron deficiency anemia (IDA) in this population. Growing evidence suggests that social determinants of health (SDOH) influence menstrual bleeding patterns, access to care, and treatment. However, no studies have
Maria Carter‐Febres, Cristina Tarango, Ashley Childress, Chunyan Liu, Evan Thomas, Jennifer Pomales, Eric S. Mullins   +6 more
wiley   +1 more source

Machine learning based adaptive soft error mitigation efficiency

Machine Learning with Applications
This work presents a novel adaptive framework for soft error mitigation in space-based systems, designed to resolve the fundamental conflict between system performance and radiation protection.
Nicholas Maurer, Mohammed Abdallah
doaj   +1 more source

Study on single event effects of diamond Schottky diodes based on TCAD simulation [PDF]

APL Electronic Devices
In order to obtain the Single-Event Burnout (SEB) characteristics of the diamond Schottky barrier diode (SBD), the two-dimensional model of the device was established by using the TCAD simulation tool, and the positive characteristics of the experimental
YanHui Cao, Jifang Li, Ruxue Bai, Wenlu Zhu, YangFan Li, Xiang Li Zhong, Wuying Ma, Hongxia Guo   +7 more
doaj   +1 more source

Collection of charge in NMOS from single event effect

IEICE Electronics Express, 2016
In aerospace environment, single event effect (SEE) will occur and single event transient (SET) current pulse will be induced in drain/source region of Metal Oxide Semiconductor Field Effect Transistor (MOSFET) when high energy ion strikes semiconductor devices.
Wang, Jingqiu, Lin, Fujiang, Wang, Donglin, Song, Wenna, Liu, Li, Song, Qiwei, Chen, Liang   +6 more
openaire   +3 more sources