Results 21 to 30 of about 807,634 (264)
Proton and γ-ray Induced Radiation Effects on 1 Gbit LPDDR SDRAM Fabricated on Epitaxial Wafer for Space Applications [PDF]
Journal of Astronomy and Space Sciences, 2016 We present proton-induced single event effects (SEEs) and γ-ray-induced total ionizing dose (TID) data for 1 Gbit lowpower double data rate synchronous dynamic random access memory (LPDDR SDRAM) fabricated on a 5 μm epitaxial layer (54 nm complementary
Mi Young Park +5 more
doaj +1 more source
Custom Scrubbing for Robust Configuration Hardening in Xilinx FPGAs
Instruments, 2019 The usage of SRAM-based Field Programmable Gate Arrays on High Energy Physics detectors is mostly limited by the sensitivity of these devices to radiation-induced upsets in their configuration.
Raffaele Giordano +3 more
doaj +1 more source
Hardness assurance levels and requirements for single event effects testing of integrated circuits
Безопасность информационных технологий, 2020 The paper presents an analysis of existing approaches to estimation of single event rate (SER) in integrated circuits under effects of charged particles of space radiation environment.
Alexander I. Chumakov +13 more
doaj +1 more source
Aerospace, 2023 The device downscaling of electronic components has given rise to the need to consider specific failures in onboard airplane electronics. Single Event Effects (SEE) are a kind of failures that occur due to radiation in the atmosphere.
Hugo Cintas +7 more
doaj +1 more source
Single Event Effects Rate Calculation with Different Models
Безопасность информационных технологий, 2017 The paper presents SEE rate calculation using different models. It is shown the most conservative estimate for rate prediction is thin layer model. A new approach to set IC’s SEE requirements is suggested.
A I Chumakov +5 more
doaj +1 more source
Applied Sciences, 2022 The pulsed laser has gradually become the standard method of studying the single-event effects of micro-nano devices, and it is a powerful supplement to heavy ion experiments on single-event effects.
Heng An +6 more
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Investigate the Equivalence of Neutrons and Protons in Single Event Effects Testing: A Geant4 Study
Applied Sciences, 2020 Neutron radiation on advanced integrated circuits (ICs) is becoming important for their reliable operation. However, a neutron test on ICs is expensive and time-consuming.
Yueh Chiang +4 more
doaj +1 more source
A Methodology for Reconstructing DSET Pulses from Heavy-Ion Broad-Beam Measurements
Quantum Beam Science, 2020 A table-based method for the estimation of heavy-ion-induced Digital Single Event Transient (DSET) voltage pulse-width in a single logic cell has been developed.
Takahiro Makino +5 more
doaj +1 more source
Prediction of Single Event Effects in FinFET Devices Based on Deep Learning
IEEE Journal of the Electron Devices Society, 2023 The Single Event Effect (SEE) of FinFET devices has become one of the challenging issues affecting the reliability of modern electronic systems in space and terrestrial applications.
Haiyu Liu +7 more
doaj +1 more source
Aerospace, 2019 This paper presents an in-situ test concept for a multi-band software-defined radio (SDR) platform in a mixed-field radiation environment. Special focus is given to the complex automated test setup with respect to the requirements of the irradiation ...
Jan Budroweit +5 more
doaj +1 more source