Results 21 to 30 of about 18,085,785 (304)

Investigate the Equivalence of Neutrons and Protons in Single Event Effects Testing: A Geant4 Study

Applied Sciences, 2020
Neutron radiation on advanced integrated circuits (ICs) is becoming important for their reliable operation. However, a neutron test on ICs is expensive and time-consuming.
Yueh Chiang, Cher Ming Tan, Tsi-Chian Chao, Chung-Chi Lee, Chuan-Jong Tung   +4 more
doaj   +1 more source

Propagazione di single-event transients in logiche combinatorie [PDF]

, 2022
Lo scopo di questa trattazione è quello di studiare la propagazione dei SET (Single-Event Transients) in catene di inverter implementate a partire da porte logiche di tipo NOT NOR e NAND, tramite l’ausilio di un simulatore tridimensionale.
Bevilacqua, Andrea
core  

A Methodology for Reconstructing DSET Pulses from Heavy-Ion Broad-Beam Measurements

Quantum Beam Science, 2020
A table-based method for the estimation of heavy-ion-induced Digital Single Event Transient (DSET) voltage pulse-width in a single logic cell has been developed.
Takahiro Makino, Shinobu Onoda, Takeshi Ohshima, Daisuke Kobayashi, Hirokazu Ikeda, Kazuyuki Hirose   +5 more
doaj   +1 more source

Single-Event Radiation Effects in Silicon Carbide Power MOSFETs

, 2021
In this research, the radiation induced single event effects (SEE) observed in silicon carbide (SiC) power MOSFETs have been studied. Heavy ions, terrestrial neutrons and protons were selected as radiation environments to be investigated, as ...
Martinella, Corinna
core   +1 more source

Advanced machine learning for the detection of single event effects

, 2022
International audienceWith the increase of component complexity, protection against single event effects becomes a critical point for the disponibility and reliability of space systems.
Alonso, Corinne, Travé-Massuyès, Louise, Dorise, Adrien, Subias, Audine   +3 more
core   +4 more sources

Efficient error rate estimation for single event effects considering statistical uncertainty

Nihon Kikai Gakkai ronbunshu, 2019
This study proposes the efficient error rate estimation method for Single Event Effects (SEE) considering statistical uncertainty. SEE is known to make significant damage to a semiconductor device used for a spacecraft on orbit by exposed to cosmic rays ...
Kisumi IIDA, Nozomu KOGISO
doaj   +1 more source

Single event effects in carbon nanotube electronics

Nano Research
Recent studies on carbon nanotube (CNT) field-effect transistors (FETs) and integrated circuits (ICs) have shown their potential in radiation tolerance.
Ruhai Liu, Yifu Sun, Rui Chen, Lingyu Zhang, Qian Chen, Can Yang, Huiping Zhu, Peng Lu, Zhiyong Zhang, Maguang Zhu   +9 more
doaj   +1 more source

Failure Estimates for SiC Power MOSFETs in Space Electronics

Aerospace, 2018
Silicon carbide (SiC) power metal-oxide-semiconductor field effect transistors (MOSFETs) are space-ready in terms of typical reliability measures. However, single event burnout (SEB) due to heavy-ion irradiation often occurs at voltages 50% or lower than
Kenneth F. Galloway, Arthur F. Witulski, Ronald D. Schrimpf, Andrew L. Sternberg, Dennis R. Ball, Arto Javanainen, Robert A. Reed, Brian D. Sierawski, Jean-Marie Lauenstein   +8 more
doaj   +1 more source

Prediction of Single Event Effects in FinFET Devices Based on Deep Learning

IEEE Journal of the Electron Devices Society, 2023
The Single Event Effect (SEE) of FinFET devices has become one of the challenging issues affecting the reliability of modern electronic systems in space and terrestrial applications.
Haiyu Liu, Shulong Wang, Rong Zhao, Hao Ma, Lan Ma, Shijie Liu, Shupeng Chen, Hongxia Liu   +7 more
doaj   +1 more source

Mono-energy neutron testing of Single Event Effects

, 2007
The role of mono-energy neutron testing for Single Event Effects (SEE) is outlined. Recent improvements in nuclear reaction theory of relevance to computation of single-event effects from fundamental physics is reported.
M. Österlund, A. Prokofiev, A. Koning, J.-C. Bourselier, S. Pomp, J. Blomgren   +5 more
core   +1 more source