Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data [PDF]
We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment ...
Campola, Michael +3 more
core
System effects of single event upsets [PDF]
Single Event Upsets (SEUs) pose a serious threat to computer reliability and longevity. SEU effects are found at sea level, in airborne avionics, and in space. At the system level, SEUs in processors are controlled by replication and voting, watchdog processors, and tagged data schemes.
openaire +1 more source
Study on Single Event Upset and Mitigation Technique in JLTFET-Based 6T SRAM Cell
The effect of single event transient (SET) on 6T SRAM cell employing a 20 nm silicon-based junctionless tunneling field effect transistor (JLTFET) is explored for the first time. JLTFET-based SRAM circuit is designed using the look up table-based Verilog
Aishwarya K, Lakshmi B
doaj +1 more source
A Soft Error Self-Resilience Radiation-Hardened 14T SRAM for Aerospace Applications
Various charged particles in space threaten memory circuit integrity and dependability, including photons, alpha particles, and high-energy ions outside the Low Earth Orbit region.
Guguloth Anjaneyulu +7 more
doaj +1 more source
Engineering peptides into antibodies—opportunities and strategies for therapeutic innovation
Peptides and antibodies occupy complementary therapeutic niches. Peptides recognize difficult targets in a compact format, while antibodies add specificity, long half‐life, and effector functions. This review examines strategies that merge both modalities—peptide grafting into loops, terminal and Fc fusions, and bioconjugation—highlighting how ...
Jinling Wang +2 more
wiley +1 more source
Towards a single event upset detector based on COTS FPGA
The Single Event Upset Detector (SEUD) is 3U CubeSat payload experiment that aims to achieve radiation tolerant computing through detection and correction of SEU bit flips on COTS SRAM FPGAs.
Ngo, Kalle, +5 more
core +1 more source
Single Event Upset tests and failure rate estimation for a front-end ASIC adopted in high-flux-particle therapy applications [PDF]
A 64 channels Application Specific Integrated Circuit, named TERA09, designed in a 0.35 m technology for particle therapy applications, has been characterized for Single Event Upset probability.
Sacchi, R. +7 more
core +1 more source
The microbiome in human skin aging
Age‐related skin changes encompass the well‐known visible phenotypic alterations, together with microbiome dysbiosis and a series of molecular aging hallmarks. These hallmarks characterize not only a fully stablished aged phenotype but also the skin aging process itself.
Manuel Huerta Arana +3 more
wiley +1 more source
Simulating Single Event Upset Rate with BERT
The circuit level modeling of single event effects is an area of on-giong research.
P. K. Ko +4 more
core
LEO Single Event Upset Emulator for Validation of FPGA Based Avionics Systems [PDF]
This paper presents a complete design and implementation of a Single Event Upset (SEU) emulation system that can be used to inject faults Static Random Access Memory (SRAM) based Field Programmable Gate Array (FPGA).
Asami, Kenichi +6 more
core +2 more sources

