Results 241 to 250 of about 41,687 (303)
From Inflammation to Malignancy: The Link Between Endometriosis and Gynecological Cancers. [PDF]
Int J Mol SciKłodnicka K +9 more
europepmc +1 more source
Parental experience of having a child with hypoxic ischaemic encephalopathy: a qualitative study
Bache A +6 more
europepmc +1 more source
Some of the next articles are maybe not open access.
Related searches:
Related searches:
Single event upset in avionics
IEEE Transactions on Nuclear Science, 1993Data from military/experimental flights and laboratory testing indicate that typical non-radiation-hardened 64 K and 256 K static random access memories (SRAMs) can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere.
A. Taber, E. Normand
openaire +1 more source
Single event upset at gigahertz frequencies
IEEE Transactions on Nuclear Science, 1994Single Event Upset (SEU) characteristics of a digital emitter coupled logic (ECL) device clocking at 0.5, 1, and 3.2 GHz and at temperatures of 5, 75, and 105/spl deg/ C are presented. The test technique is explained. Observations of two types of upsets, phase upsets at low Linear Energy Transfer (LETs) and amplitude upsets at high LETs are also ...
M. Shoga +5 more
openaire +1 more source
A Single Event Upset Resilient Latch Design with Single Node Upset Immunity
Journal of Electronic Testing, 2019In this paper, a latch design with single node immunity to single event upsets during the hold state is proposed. This structure is based on the original Quatro latch and have two more redundant storage nodes. Compared with the reference, this structure is able to recover if any of these nodes is struck by ion particles during the hold state and it ...
Xixi Dai +5 more
openaire +1 more source
Mechanisms Leading to Single Event Upset
IEEE Transactions on Nuclear Science, 1986SRAM cell recovery time following a 140 MeV Krypton strike on a Sandia SRAM is modelled using a two-dimensional transient numerical simulator and circuit code. Strikes at both n- and p-channel "off" drains are investigated. Four principle results are obtained.
C. L. Axness +4 more
openaire +1 more source
Single event upset rates in space
IEEE Transactions on Nuclear Science, 1992SEUs (single event upsets) in the CRRES (Combined Release and Radiation Effects Satellite) MEP (Microelectronic Package Space Experiment) showed a dramatic increase during a solar flare, the influence of the flare varied widely among device types, and a GaAs RAM (random access memory) showed a different response to the proton belts than some 51 RAMs ...
A. Campbell, P. McDonald, K. Ray
openaire +1 more source
Single event upset mitigation for FDP2008
2011 9th IEEE International Conference on ASIC, 2011Highly integrated contemporary SRAM-based Field Programmable Gate Arrays (FPGAs) lead to high occurrence-rate of transient faults induced by Single Event Upsets (SEUs) in FPGAs' configuration memory. In this paper, Fudan Design Environment (FDE) Triple Module Redundancy (TMR) approach for design triplication has been devised to meet high-reliability ...
null Meng Yang, null Gengsheng Chen
openaire +1 more source
Single Event Upsets in NMOS Microprocessors
IEEE Transactions on Nuclear Science, 1981Three advanced 16-bit NMOS microprocessors have been observed to suffer single event upset at a rate varying between one upset for every 8 × 1010 to one for every 2 × 1012 n/cm2-upset for cyclotron-produced neutrons with an average energy of 14 MeV. These rates are expected to vary, probably upward, with different types of programs.
C. S. Guenzer +2 more
openaire +1 more source