Results 241 to 250 of about 1,246 (262)

The Influence of Ion Track Characteristics on Single-Event Upsets and Multiple-Cell Upsets in Nanometer SRAM

IEEE Transactions on Nuclear Science, 2021
Yinhong Luo, Lili Ding
exaly  

Design of High-Reliability Memory Cell to Mitigate Single Event Multiple Node Upsets

IEEE Transactions on Circuits and Systems I: Regular Papers, 2021
Hongchen Li, Liyi Xiao, Chunhua Qi
exaly  

Using Machine Learning to Mitigate Single-Event Upsets in RF Circuits and Systems

IEEE Transactions on Nuclear Science, 2022
Adrian Ildefonso, Jacob Kimball, Ani Khachatrian   +2 more
exaly  

Single event upsets in space

21st Aerospace Sciences Meeting, 1983
openaire   +1 more source

Characterization of Single Event Cell Upsets in a Radiation Hardened SRAM in a 40 nm Bulk CMOS Technology

Electronics (Switzerland), 2020
Jincheng Zhang, Yang Guoqing
exaly  

Electron-Induced Single-Event Upsets in Static Random Access Memory

IEEE Transactions on Nuclear Science, 2013
Robert A Weller, Marcus H Mendenhall, Ronald D Schrimpf   +2 more
exaly  

SINGLE EVENT UPSETS IN MICROELECTRONICS

1991
openaire   +1 more source

A Highly Reliable Memory Cell Design Combined With Layout-Level Approach to Tolerant Single-Event Upsets

IEEE Transactions on Device and Materials Reliability, 2016
Chunhua Qi, Liyi Xiao, Tianqi Wang
exaly  

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory

IEEE Transactions on Nuclear Science, 2017
Dakai Chen, R Ladbury, Hak Kim
exaly  

Experimental verification of the effectiveness of a new circuit to mitigate single event upsets in a Xilinx Artix-7 field programmable gate array

Microprocessors and Microsystems, 2020
Farouk Smith
exaly