Results 281 to 290 of about 7,396,207 (304)

Single Event Upset Measurements of Gaas E-JFET RAMS

IEEE Transactions on Nuclear Science, 1983
R Zuleeg, A B Campbell, P Shapiro
exaly  

Single Event Upset (SEU) Sensitivity Dependence of Linear Integrated Circuits (ICs) on Bias Conditions

IEEE Transactions on Nuclear Science, 1997
S D Pinkerton, K B Crawford, M C Maher
exaly  

Single Event Double-Upset Fully Immune and Transient Pulse Filterable Latch Design for Nanoscale CMOS

Microelectronics Journal, 2017
Zhengfeng Huang, Ouyang Yiming, Aibin Yan   +2 more
exaly  

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory

IEEE Transactions on Nuclear Science, 2017
Hak Kim, Raymond L Ladbury, Dakai Chen
exaly  

Prevention of Single Event Upsets in Microelectronics

1991
B. L. Bhuva, L. W. Massengill, S. E. Kerns, T. R. Weatherford, J. R. Hauser   +4 more
openaire   +1 more source

Study Of Single-event-upsets In PAL16R8

1993 IEEE Radiation Effects Data Workshop, 2005
J. Barak, J. Levinson, A. Zentner, D. David, O. Even, M. Hass, D. Ilberg, Y. Lifshitz   +7 more
openaire   +1 more source

MITIGATING SINGLE-EVENT UPSETS USING CONTAINERIZATION

2022
THOMMANA JOHN V, RIDGWAY CHRIS K, KAEMMER JOSEPH   +2 more
openaire   +2 more sources

Basic Mechanisms and Modeling of Single-Event Upset in Digital Microelectronics

IEEE Transactions on Nuclear Science, 2003
P E Dodd, L W Massengill
exaly  

The Total Dose Dependence of the Single Event Upset Sensitivity of IDT Static RAMs

IEEE Transactions on Nuclear Science, 1984
W J Stapor, A B Campbell
exaly  

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

IEEE Transactions on Nuclear Science, 2008
Kenneth A Label, Paul E Dodd, James R Schwank   +2 more
exaly