A new low power high reliability flip-flop robust against process variations [PDF]
Journal of Electrical and Computer Engineering Innovations, 2016 Low scaling technology makes a significant reduction in dimension and supply voltage, and lead to new challenges about power consumption such as increasing nodes sensitivity over radiation-induced soft errors in VLSI circuits.
S. Yousefian Langroudi, R. Niaraki Asli
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A Radiation-Hardened SAR ADC with Delay-Based Dual Feedback Flip-Flops for Sensor Readout Systems
Sensors, 2019 For stable and effective control of the sensor system, analog sensor signals such as temperature, pressure, and electromagnetic fields should be accurately measured and converted to digital bits.
Duckhoon Ro +4 more
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Novel Radiation Hardened SOT-MRAM Read Circuit for Multi-Node Upset Tolerance
IEEE Open Journal of Nanotechnology, 2022 The rapid transistor scaling and threshold voltage reduction pose several challenges such as high leakage current and reliability issues. These challenges also make VLSI circuits more susceptible to soft-errors, particularly when subjected to harsh ...
Alok Kumar Shukla +5 more
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IEEE Access, 2021 Deep neural networks (DNNs) have been successfully deployed in widespread domains, including healthcare applications. DenseNet201 is a new DNN architecture used in healthcare systems (i.e., presence detection of the surgical tool).
Khalid Adam +2 more
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Approximate MIMO Iterative Processing with Adjustable Complexity Requirements [PDF]
, 2011 Targeting always the best achievable bit error rate (BER) performance in iterative receivers operating over multiple-input multiple-output (MIMO) channels may result in significant waste of resources, especially when the achievable BER is orders of ...
Gerd Ascheid +2 more
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Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC [PDF]
, 2007 This paper proposes an analytical method to assess the soft-error rate (SER) in the early stages of a System-on-Chip (SoC) platform-based design methodology.
Benso, Alfredo +6 more
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CASH: correlation-aware scheduling to mitigate soft error impact on heterogeneous multicores
Connection Science, 2021 With the exponential increase in the number of transistors under fast-paced technology progress, the soft error induced reliability issue is becoming even more challenging in heterogeneous multicore processor design.
Jiajia Jiao +6 more
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Impact of Microarchitectural Differences of RISC-V Processor Cores on Soft Error Effects
IEEE Access, 2018 In this paper, we compare how radiation-induced soft errors affect the execution results of user-level applications on different processor cores that implement the same instruction set architecture (ISA).
Hyungmin Cho
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Repeatability of facial soft tissue thickness measurements for forensic facial reconstruction using X-ray images [PDF]
, 2016 The repeatability of facial soft tissue thickness measurements at 10 standard anatomical landmarks was evaluated using lateral X-ray images obtained from 50 adult subjects.
Akay, Gülsün +8 more
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Error Correction For Soft Errors
Journal of Electrical & Electronic Systems, 2018 Radiation induced soft errors are susceptible to most of the electronic products with the development of CMOS technology. A particle striking on any of the electronic products can produce soft errors that can be either single event upset or single event transient. There are various techniques such as FERST, BISER, TMR, DMR, DICE, SEC-DED, DEC-TED, EDAC,
Dhanushya T, Latha T
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