Results 11 to 20 of about 217,499 (262)

Novel Radiation Hardened SOT-MRAM Read Circuit for Multi-Node Upset Tolerance

open access: yesIEEE Open Journal of Nanotechnology, 2022
The rapid transistor scaling and threshold voltage reduction pose several challenges such as high leakage current and reliability issues. These challenges also make VLSI circuits more susceptible to soft-errors, particularly when subjected to harsh ...
Alok Kumar Shukla   +5 more
doaj   +1 more source

A Selective Mitigation Technique of Soft Errors for DNN Models Used in Healthcare Applications: DenseNet201 Case Study

open access: yesIEEE Access, 2021
Deep neural networks (DNNs) have been successfully deployed in widespread domains, including healthcare applications. DenseNet201 is a new DNN architecture used in healthcare systems (i.e., presence detection of the surgical tool).
Khalid Adam   +2 more
doaj   +1 more source

CASH: correlation-aware scheduling to mitigate soft error impact on heterogeneous multicores

open access: yesConnection Science, 2021
With the exponential increase in the number of transistors under fast-paced technology progress, the soft error induced reliability issue is becoming even more challenging in heterogeneous multicore processor design.
Jiajia Jiao   +6 more
doaj   +1 more source

Impact of Microarchitectural Differences of RISC-V Processor Cores on Soft Error Effects

open access: yesIEEE Access, 2018
In this paper, we compare how radiation-induced soft errors affect the execution results of user-level applications on different processor cores that implement the same instruction set architecture (ISA).
Hyungmin Cho
doaj   +1 more source

Error Correction For Soft Errors

open access: yesJournal of Electrical & Electronic Systems, 2018
Radiation induced soft errors are susceptible to most of the electronic products with the development of CMOS technology. A particle striking on any of the electronic products can produce soft errors that can be either single event upset or single event transient. There are various techniques such as FERST, BISER, TMR, DMR, DICE, SEC-DED, DEC-TED, EDAC,
Dhanushya T, Latha T
openaire   +1 more source

Understanding soft errors in uncore components [PDF]

open access: yesProceedings of the 52nd Annual Design Automation Conference, 2015
The effects of soft errors in processor cores have been widely studied. However, little has been published about soft errors in uncore components, such as memory subsystem and I/O controllers, of a System-on-a-Chip (SoC). In this work, we study how soft errors in uncore components affect system-level behaviors.
Cho, Hyungmin   +3 more
openaire   +2 more sources

Fast and Accurate Error Simulation for CNNs Against Soft Errors

open access: yesIEEE Transactions on Computers, 2023
The great quest for adopting AI-based computation for safety-/mission-critical applications motivates the interest towards methods for assessing the robustness of the application w.r.t. not only its training/tuning but also errors due to faults, in particular soft errors, affecting the underlying hardware. Two strategies exist: architecture-level fault
Bolchini C.   +3 more
openaire   +3 more sources

ERDNN: Error-Resilient Deep Neural Networks With a New Error Correction Layer and Piece-Wise Rectified Linear Unit

open access: yesIEEE Access, 2020
Deep Learning techniques have been successfully used to solve a wide range of computer vision problems. Due to their high computation complexity, specialized hardware accelerators are being proposed to achieve high performance and efficiency for deep ...
Muhammad Salman Ali   +6 more
doaj   +1 more source

Soft Error Reliability Improvement of Digital Circuits by Exploiting a Fast Gate Sizing Scheme

open access: yesIEEE Access, 2019
Due to the reduction in device feature size and supply voltage, achieving soft error reliability in sub-micrometer digital circuits is becoming extremely challenging.
Mohsen Raji   +2 more
doaj   +1 more source

EBSCN: An Error Backtracking Method for Soft Errors Based on Clustering and a Neural Network

open access: yesIEEE Access, 2019
With the development of integrated circuit design technology, soft errors have become an important threat to system reliability, and software-based fault-tolerant techniques are gradually attracting people's attention.
Nan Zhang   +3 more
doaj   +1 more source

Home - About - Disclaimer - Privacy