Results 11 to 20 of about 114,741 (276)

A Universal, Low-Delay, SEC-DEC-TAEC Code for State Register Protection

open access: yesIEEE Access, 2022
Finite State Machine (FSM) is widely used in electronic systems and its reliability is critical to the system. Ionizing radiation induced soft error is one of the major concerns in the design of electronic systems, especially in avionics or space ...
Meng Dong   +5 more
doaj   +1 more source

Fault Injection Emulation for Systems in FPGAs: Tools, Techniques and Methodology, a Tutorial

open access: yesSensors, 2021
Communication systems that work in jeopardized environments such as space are affected by soft errors that can cause malfunctions in the behavior of the circuits such as, for example, single event upsets (SEUs) or multiple bit upsets (MBUs).
Óscar Ruano   +5 more
doaj   +1 more source

Soft Error Mitigation for SRAM-Based FPGAs [PDF]

open access: yes23rd IEEE VLSI Test Symposium (VTS'05), 2005
FPGA-based designs are more susceptible to single-event up-sets (SEUs) compared to ASIC designs, since SEUs in configuration bits of FPGAs result in permanent errors in the mapped design. Moreover, the number of sensitive configuration bits is two orders of magnitude more than user bits in typical FPGA-based circuits.
G.-H. Asadi, M.B. Tahoori
openaire   +1 more source

Fault-tolerant technology based on FPGA: A Research of LogiCORE™ IP Soft Error Mitigation Controller

open access: yesJournal of Physics: Conference Series, 2020
In a radiation environment, compared with ASIC and FPGA based on anti-fuse structure, SRAM FPGA is more susceptible to single particle effect, in particular, the effect of single-event upset (SEU).
Jiang Wu, Xiankai Meng, Nan Zhang
semanticscholar   +1 more source

Dynamic Partial Reconfiguration Project for the Anti-single Event Effect Based on the Soft Error Mitigation

open access: yesNantong Daxue xuebao. Ziran kexue ban, 2020
With the wide application of FPGA(field programmable gate array) based on the SRAM(static randomaccess memory) in the aerospace field, the probability of SEU(single event upset) increases gradually while the FPGAs are exposed in irradiation environment ...
XIE Da;DONG Yiping;WANG Lan;CAO Jinde;GUO Junjie
doaj   +1 more source

Enhanced deep soft interference cancellation for multiuser symbol detection

open access: yesETRI Journal, 2023
The detection of all the symbols transmitted simultaneously in multiuser systems using limited wireless resources is challenging. Traditional model-based methods show high performance with perfect channel state information (CSI); however, severe ...
Jihyung Kim, Junghyun Kim, Moon-Sik Lee
doaj   +1 more source

Distribution Matching for Dimming Control in Visible-Light Region-of-Interest Signaling

open access: yesIEEE Photonics Journal, 2023
We propose a two-level dimmer based on binary distribution matching where a low-rate signal controls the output probability distribution of a high-rate bit sequence, which can be used in region-of-interest (RoI) signaling applications. To reduce the rate
Phuc Duc Nguyen   +5 more
doaj   +1 more source

Design and Implementation of Reliable Encryption Algorithms through Soft Error Mitigation

open access: yesInternational Journal of Computer Network and Information Security, 2020
: Designing a reliable system on reconfigurable devices has become a significant factor for implementing mission critical applications like communication protocols, automotive, nuclear reactor control, and remote applications.
J. S, D. P, K. Shashikala, K. K.
semanticscholar   +1 more source

Investigation of Radiation Hardened TFET SRAM Cell for Mitigation of Single Event Upset

open access: yesIEEE Journal of the Electron Devices Society, 2020
This study analyzes the soft error sensitivity of SRAM cell which employs double-gate tunnel field effect transistor (DG TFET). The mitigation technique for the data recovery after the heavy ion strike is discussed.
M. Pown, B. Lakshmi
doaj   +1 more source

Criticality Aware Soft Error Mitigation in the Configuration Memory of SRAM Based FPGA [PDF]

open access: yesInternational Conference on VLSI Design, 2018
Efficient low complexity error correcting code (ECC) is considered as an effective technique for mitigation of multi-bit upset (MBU) in the configuration memory (CM) of static random access memory (SRAM) based Field Programmable Gate Array (FPGA) devices.
S. Mandal   +4 more
semanticscholar   +1 more source

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