Results 41 to 50 of about 6,338 (277)

Low Overhead Soft Error Mitigation Methodologies [PDF]

open access: yes, 2012
CMOS technology scaling is bringing new challenges to the designers in the form of new failure modes. The challenges include long term reliability failures and particle strike induced random failures.
Prasanth, V
core  

Comparison of Triply Periodic Minimal Surface Energy Absorbers Under Uniaxial Compressive Loading

open access: yesAdvanced Engineering Materials, EarlyView.
This study investigates LCD 3D printed Triply Periodic Minimal Surface (TPMS) structures as mechanical energy absorbers. By comparing various base designs and layered combinations under uniaxial compression, it identifies that a Diamond‐Gyroid sandwich structure offers superior performance.
Sergej Grednev   +2 more
wiley   +1 more source

Microstructure, Thermal Transport, and Dry‐Sliding Tribology of Powder‐Metallurgy Al7075 Composites Reinforced With Sol–Gel‐Derived ZnO–rGO Hybrid Nanoparticles

open access: yesAdvanced Engineering Materials, EarlyView.
Sol–gel‐derived ZnO–rGO hybrid nanoparticles enable Al7075 powder‐metallurgy composites to achieve concurrent gains in hardness and thermal conductivity while markedly lowering friction and wear. The hybrid architecture couples ZnO‐based load support with rGO‐assisted lamellar sliding and heat spreading, revealing a promising route toward lightweight ...
Bunyamin Aksakal   +3 more
wiley   +1 more source

FAULT INJECTION IN DYNAMIC PARTIAL RECONFIGURATION DESIGN BASED ON ESSENTIAL BITS

open access: yesHavacılık ve Uzay Teknolojileri Dergisi, 2018
SEU or soft error is an unintended change to the state of a configuration memory bit caused by ionizing radiation which causes unacceptable changes in the design behavior.
Mohamed Elhady Magdy Keshk   +1 more
doaj  

Full-duplex amplify-and-forward relays with optimized transmission power under imperfect transceiver electronics

open access: yesEURASIP Journal on Wireless Communications and Networking, 2017
In-band full-duplex (FD) relays are useful for extending coverage areas and increasing overall throughput in wireless networks. The main technical difficulty hindering their implementation and use is their inherent self-interference (SI), generated due ...
Gustavo J. González   +4 more
doaj   +1 more source

Stretching the Printability Metric in Direct‐Ink Writing with Highly Extensible Yield‐Stress Fluids

open access: yesAdvanced Functional Materials, EarlyView.
This study introduces “drawability” as a new metric for assessing printability in direct‐ink writing, focusing on gap‐spanning performance and speed robustness. By designing yield‐stress fluids with high extensibility, we demonstrate that extensional strain‐to‐break significantly enhances printability.
Chaimongkol Saengow   +9 more
wiley   +1 more source

Software modification aided transient error tolerance for embedded systems

open access: yes, 2013
Commercial off-the-shelf (COTS) components are increasingly being employed in embedded systems due to their high performance at low cost. With emerging reliability requirements, design of these components using traditional hardware redundancy incur large
Kim Sunesen   +19 more
core   +1 more source

RAT: A Lightweight Architecture Independent System-Level Soft Error Mitigation Technique

open access: yes, 2020
International audienceTo achieve a substantial reliability and safety level, it is imperative to provide electronic computing systems with appropriate mechanisms to tackle soft errors.
Gava, Jonas   +5 more
core   +1 more source

A Decade of Ground Deformation in Kunming (China) Revealed by Multi-Temporal Synthetic Aperture Radar Interferometry (InSAR) Technique

open access: yesSensors, 2019
Large-scale urbanization has brought about severe ground subsidence in Kunming (China), threatening the stability of urban infrastructure. Mapping of the spatiotemporal variations of ground deformation is urgently needed, along with summarization of the ...
Wu Zhu   +6 more
doaj   +1 more source

Optoelectronic Synaptic Devices Using Molecular Telluride Phase‐Change Inks for Three‐Factor Learning

open access: yesAdvanced Functional Materials, EarlyView.
Optoelectronic synaptic devices based on solution‐processed molecular telluride GST‐225 phase‐change inks are demonstrated for three‐factor learning. A global optical signal broadcast through a silicon waveguide induces non‐volatile conductance updates exclusively in locally electrically flagged memristors.
Kevin Portner   +14 more
wiley   +1 more source

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