Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories [PDF]
CHIMIA, 2022 Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a localized area of a solid target by performing mass spectrometry on secondary ions sputtered from its surface by the impact of a beam of charged ...
Johanna Marin Carbonne +8 more
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Regional zircon U-Pb geochronology for the Maniitsoq region, southwest Greenland
Scientific Data, 2021 Measurement(s) sediment deposition • magma • crystallization • metamorphism Technology Type(s) laser ablation inductively coupled plasma mass spectrometry • secondary ion mass spectrometry Sample Characteristic - Environment rock • outcrop Sample ...
Hugo K. H. Olierook +11 more
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New Olivine Reference Materials for Secondary Ion Mass Spectrometry Oxygen Isotope Measurements
Crystals, 2023 To accurately analyze the oxygen isotope of olivine using secondary ion mass spectrometry (SIMS), appropriate standard materials are required to calibrate for matrix effects caused by chemical composition differences between the samples and the standard ...
Bijie Peng +3 more
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Expanding the Efficacy of Fingermark Enhancement Using ToF-SIMS
Molecules, 2023 Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been shown to enhance fingermark recovery compared to standard processes used by police forces, but there is no data to show how generally applicable the improvement is. Additionally, ToF-SIMS
Deborah Charlton +4 more
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Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging [PDF]
, 2013 RATIONALE: Microscope mode imaging for secondary ion mass spectrometry is a technique with the promise of simultaneous high spatial resolution and high-speed imaging of biomolecules from complex surfaces.
Jungmann, JH +6 more
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Determining the chronology of deposition of natural fingermarks and inks on paper using secondary ion mass spectrometry [PDF]
, 2014 This study thoroughly explores the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) for determining the deposition sequence of fingermarks and ink on a porous paper surface.
de Puit, Marcel +18 more
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Secondary Ion Mass Spectrometry of Single Giant Unilamellar Vesicles Reveals Compositional Variability [PDF]
, 2023 Giant unilamellar vesicles (GUVs) are a widely used model system to interrogate lipid phase behavior, study biomembrane mechanics, reconstitute membrane proteins, and provide a chassis for synthetic cells.
Dashiel, Grusky +2 more
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Microscope mode secondary ion mass spectrometry imaging with a Timepix detector. [PDF]
, 2013 In-vacuum active pixel detectors enable high sensitivity, highly parallel time- and space-resolved detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined with a secondary ion mass spectrometer for microscope
Andras Kiss +10 more
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Fast Mass Microscopy: Mass Spectrometry Imaging of a Gigapixel Image in 34 Minutes [PDF]
, 2022 [Image: see text] Mass spectrometry imaging (MSI) maps the spatial distributions of chemicals on surfaces. MSI requires improvements in throughput and spatial resolution, and often one is compromised for the other. In microprobe-mode MSI, improvements in
Claes, Britt S. R. +13 more
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Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)
Scientific Reports, 2017 The following invention - Graphene Enhanced Secondary Ion Mass Spectrometry - (pending European patent application no. EP 16461554.4) is related to a method of analysing a solid substrate by means of Secondary Ion Mass Spectrometry (SIMS).
Paweł Piotr Michałowski +3 more
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