Secondary Ion Mass Spectrometry
, 2014 In Secondary Ion Mass Spectrometry (SIMS) a focused beam of energetic ions (so-called primary ions) is targeted onto the surface of a solid sample. Primary ions dissipate their energy, leading to the sputtering and ionisation of the outmost atoms of the sample surface. The resulting secondary ions are accelerated and transferred to a magnetic analyser.
Sangély, L. +11 more
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Secondary-Ion Mass Spectrometry [PDF]
, 2020 This chapter provides an introduction in secondary ion mass spectrometry as one of the leading surface chemical analysis and imaging techniques with molecular specificity in the field of material sciences.
Kaija Schaepe +5 more
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Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)
Scientific Reports, 2017 The following invention - Graphene Enhanced Secondary Ion Mass Spectrometry - (pending European patent application no. EP 16461554.4) is related to a method of analysing a solid substrate by means of Secondary Ion Mass Spectrometry (SIMS).
Paweł Piotr Michałowski +3 more
doaj +2 more sources
Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories [PDF]
CHIMIA, 2022 Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a localized area of a solid target by performing mass spectrometry on secondary ions sputtered from its surface by the impact of a beam of charged ...
Johanna Marin Carbonne +8 more
doaj +3 more sources
secondary-ion mass spectrometry [PDF]
Nature Reviews Methods PrimersCitation: 'secondary-ion mass spectrometry' in the IUPAC Compendium of Chemical Terminology, 5th ed.; International Union of Pure and Applied Chemistry; 2025. Online version 5.0.0, 2025. 10.1351/goldbook.09192 • License: The IUPAC Gold Book is licensed under Creative Commons Attribution-ShareAlike CC BY-SA 4.0 International for ...
Lockyer, Nicholas p.; id_orcid 0000-0002-9674-9395 +7 more
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Regional zircon U-Pb geochronology for the Maniitsoq region, southwest Greenland
Scientific Data, 2021 Measurement(s) sediment deposition • magma • crystallization • metamorphism Technology Type(s) laser ablation inductively coupled plasma mass spectrometry • secondary ion mass spectrometry Sample Characteristic - Environment rock • outcrop Sample ...
Hugo K. H. Olierook +11 more
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New Olivine Reference Materials for Secondary Ion Mass Spectrometry Oxygen Isotope Measurements
Crystals, 2023 To accurately analyze the oxygen isotope of olivine using secondary ion mass spectrometry (SIMS), appropriate standard materials are required to calibrate for matrix effects caused by chemical composition differences between the samples and the standard ...
Bijie Peng +3 more
doaj +1 more source
Expanding the Efficacy of Fingermark Enhancement Using ToF-SIMS
Molecules, 2023 Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been shown to enhance fingermark recovery compared to standard processes used by police forces, but there is no data to show how generally applicable the improvement is. Additionally, ToF-SIMS
Deborah Charlton +4 more
doaj +1 more source
Mass spectrometry of alkylbenzenes and related compounds. Part I. Gas-phase ion chemistry of alkylbenzene radical cations [PDF]
, 1990 Kuck D. Mass spectrometry of alkylbenzenes and related compounds. Part I. Gas-phase ion chemistry of alkylbenzene radical cations. Mass Spectrometry Reviews.
Dietmar Kuck, Kuck, Dietmar
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Mass spectrometry of alkylbenzenes and related compounds. Part II. Gas phase ion chemistry of protonated alkylbenzenes (alkylbenzenium ions) [PDF]
, 1990 Kuck D. Mass spectrometry of alkylbenzenes and related compounds. Part II. Gas phase ion chemistry of protonated alkylbenzenes (alkylbenzenium ions). Mass Spectrometry Reviews.
Kuck, Dietmar, Dietmar Kuck
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